Abstract: A temperature control system and method for devices under test and an image sensor-testing apparatus having the system are provided. The temperature control method for devices under test mainly comprises the steps of regulating the temperatures of a plurality of devices under test (DUTs) to a specific temperature in a temperature control zone; transferring the plurality of devices under test to a test plate and placing them into a plurality of test slots respectively; and measuring the temperatures of the device under test by the temperature-sensing elements in the test slots, wherein when at least one temperature-sensing element of the temperature-sensing elements detects that the device under test in the test slot corresponding to said at least one temperature-sensing element fails to meet the specific temperature, a temperature control element corresponding to the test slot regulates the temperature of the device under test.

Abstract: A tunable-liquid-crystal-grating-based holographic true 3D display system comprises a laser, a filter, a beam expander, a semi-transparent semi-reflective mirror, a spatial light modulator, a lens I, a diaphragm, a tunable liquid crystal grating, a polaroid, a signal controller, a lens II and a receiving screen. The laser, the filter and the beam expander are used for generating collimated incident light. The spatial light modulator is loaded with a hologram of a 3D object. The diaphragm is positioned behind the lens I for eliminating a high-order diffracted light in the holographic true 3D display. The tunable liquid crystal grating is located on the back focal plane of the lens I and on the front focal plane of the lens II, and the signal controller is used for synchronously controlling the voltage of the tunable liquid crystal grating and the generation and loading of the hologram.

Abstract: A method of operating a memory device that includes the steps of receiving a read command and a target address in a non-volatile memory (NVM) array, in which the NVM array is divided into a plurality of blocks based on row and column addresses, performing a read operation on NVM cells in the target address and coupling an output of each NVM cell read to a sensing circuit, generating a local reference voltage based on a base reference voltage and an adjustment reference voltage corresponding to the target address of the NVM cells being read and a block that the NVM cells belong thereto, and offsetting the base reference voltage with the adjustment reference voltage, and coupling the local reference voltage to the sensing circuit. Other embodiments are also described.

Abstract: The present invention relates to a temperature control system, a temperature control method and an image sensor-testing apparatus having the system. The temperature control method mainly comprises the steps of regulating the temperatures of a plurality of devices under test (DUTs) to a specific temperature in a temperature control zone; transferring the plurality of devices under test to a test plate and placing them into a plurality of test slots respectively; and measuring the temperatures of the device under test by the temperature-sensing elements in the test slots, wherein when at least one temperature-sensing element of the temperature-sensing elements detects that the device under test in the test slot corresponding to said at least one temperature-sensing element fails to meet the specific temperature, a temperature control element corresponding to the test slot regulates the temperature of the device under test.

Abstract: A memory device including a reference voltage (VREF) generator and method for operating the same to improve memory sensing margin, and extend operational temperature range and life of the device are disclosed. Generally, the device further includes an array of non-volatile memory cells divided into a plurality of blocks, a sensing circuit coupled to the array to receive and compare memory signals therefrom to the VREF to read data from the cells. The Local reference voltage generator is configured to provide one of a number of reference voltages to the sensing circuit based on which of the blocks is being read. The array can be divided based on row and column addresses of cells in the blocks. Where the cells include 1T1C ferroelectric random access memory (F-RAM) cells, and the reference voltages are selected based on a lowest P-term or highest U-term of the cells in the block being read.

Abstract: A tunable-liquid-crystal-grating-based holographic true 3D display system comprises a laser, a filter, a beam expander, a semi-transparent semi-reflective mirror, a spatial light modulator, a lens I, a diaphragm, a tunable liquid crystal grating, a polaroid, a signal controller, a lens II and a receiving screen. The laser, the filter and the beam expander are used for generating collimated incident light. The spatial light modulator is loaded with a hologram of a 3D object. The diaphragm is positioned behind the lens I for eliminating a high-order diffracted light in the holographic true 3D display. The tunable liquid crystal grating is located on the back focal plane of the lens I and on the front focal plane of the lens II, and the signal controller is used for synchronously controlling the voltage of the tunable liquid crystal grating and the generation and loading of the hologram.

Abstract: A memory device including a reference voltage (VREF) generator and method for operating the same to improve memory sensing margin, and extend operational temperature range and life of the device are disclosed. Generally, the device further includes an array of non-volatile memory cells divided into a plurality of blocks, a sensing circuit coupled to the array to receive and compare memory signals therefrom to the VREF to read data from the cells. The Local reference voltage generator is configured to provide one of a number of reference voltages to the sensing circuit based on which of the blocks is being read. The array can be divided based on row and column addresses of cells in the blocks. Where the cells include 1T1C ferroelectric random access memory (F-RAM) cells, and the reference voltages are selected based on a lowest P-term or highest U-term of the cells in the block being read.

Abstract: A memory device and method of operating the same are disclosed. Generally, the device includes an array of Ferro-electric Random Access Memory cells. Each cell includes a first transistor coupled between a bit-line and a storage node (SN) and controlled by a first wordline (WL1), a second transistor coupled between a reference line and the SN and controlled by a second wordline (WL2), and a ferro-capacitor coupled between the SN and a plateline. The device further includes a sense-amplifier coupled to the bit-line and reference line, and a processing-element configured to issue control signals to WL1, WL2, the plateline and the sense-amplifier. The cell is configured and operated to generate a bit-level reference in which a first voltage pulse is applied to the plateline during a read cycle for the data pulse and a second voltage pulse serves as a reference pulse and as a clear pulse.

Abstract: Disclosed herein is an apparatus that includes a ferroelectric capacitor disposed on a damascene barrier film, and fabrication methods thereof. The damascene barrier film includes a hydrogen barrier region and an oxygen barrier region, with the oxygen barrier being in contact with a bottom surface of the ferroelectric capacitor. Other embodiments are also disclosed herein.

Abstract: A method of data update, for determining a material qualification status of at least one supplier according to a plurality of smelters of a material used by the at least one supplier, the method comprising obtaining a qualified smelter list of the material from a predetermined website; and comparing the qualified smelter list of the material with a material list of the at least one supplier corresponding to the material to determine the material qualification status of the at least one supplier, so as to perform a violation warning operation; wherein the material list of each supplier of the material list of the at least one supplier denotes the plurality of smelters of the material used by the at least one supplier in system codes; wherein the qualified smelter list denotes a plurality of qualified smelters of the material in international codes.

Abstract: A memory device and method of operating the same are disclosed. Generally, the device includes an array of Ferro-electric Random Access Memory cells. Each cell includes a first transistor coupled between a bit-line and a storage node (SN) and controlled by a first wordline (WL1), a second transistor coupled between a reference line and the SN and controlled by a second wordline (WL2), and a ferro-capacitor coupled between the SN and a plateline. The device further includes a sense-amplifier coupled to the bit-line and reference line, and a processing-element configured to issue control signals to WL1, WL2, the plateline and the sense-amplifier. The cell is configured and operated to generate a bit-level reference in which a first voltage pulse is applied to the plateline during a read cycle for the data pulse and a second voltage pulse serves as a reference pulse and as a clear pulse.

Abstract: A memory device and method of operating the same are disclosed. Generally, the device includes an array of Ferro-electric Random Access Memory cells. Each cell includes a first transistor coupled between a bit-line and a storage node (SN) and controlled by a first wordline (WL1), a second transistor coupled between a reference line and the SN and controlled by a second wordline (WL2), and a ferro-capacitor coupled between the SN and a plateline. The device further includes a sense-amplifier coupled to the bit-line and reference line, and a processing-element configured to issue control signals to WL1, WL2, the plateline and the sense-amplifier. The cell is configured and operated to generate a bit-level reference in which a first voltage pulse is applied to the plateline during a read cycle for the data pulse and a second voltage pulse serves as a reference pulse and as a clear pulse.

Abstract: Disclosed herein is an apparatus that includes a ferrocapacitor disposed on a damascene barrier film. The damascene barrier film includes a hydrogen barrier region and an oxygen barrier region, with each being in contact with a bottom surface of the ferrocapacitor.

Abstract: A memory device and array which includes a static random access memory (SRAM) circuit coupled to a non-volatile circuit, such as a ferroelectric-RAM (F-RAM) circuit, in which the F-RAM circuit stores a bit of data from the SRAM circuit during power-out periods, the F-RAM circuit is further coupled to bit-line(s) to output the bit of data stored in the F-RAM circuit when operation power is restored.

Abstract: A memory device and array which includes a static random access memory (SRAM) circuit coupled to a non-volatile circuit, such as a ferroelectric-RAM (F-RAM) circuit, in which the F-RAM circuit stores a bit of data from the SRAM circuit during power-out periods, the F-RAM circuit is further coupled to bit-line(s) to output the bit of data stored in the F-RAM circuit when operation power is restored.

Abstract: An apparatus that includes a reference generating circuit configured to generate a reference signal for a non-volatile memory (NVM) device, the reference generating circuit including a first circuit comprising at least one metal-oxide-semiconductor capacitor, the first circuit generating a first signal component of the reference signal, and a second circuit comprising at least one ferroelectric capacitor, the second circuit generating a second signal component of the reference signal, in which the second signal component is temperature dependent.

Abstract: A memory cell including a storage cell, a write port cell, and a read port cell is discussed. The storage cell is configured to store a logic value. The write port cell is configured to write the logic value. The read port cell is configured to read the stored logic value and includes a plurality of read ports. At least a first port of the plurality of read ports includes a first and a second active diffusion region that are each configured to be used for implementation of a second p-channel transistor. At least a second read port of the plurality of read ports includes a third and fourth active diffusion regions that are each configured to be used for implementation of a second n-channel transistor.

Abstract: Disclosed herein is an apparatus that includes a ferrocapacitor disposed on a damascene barrier film. The damascene barrier film includes a hydrogen barrier region and an oxygen barrier region, with each being in contact with a bottom surface of the ferrocapacitor.

Abstract: A device including a ferroelectric memory and methods of manufacturing the same are provided. In one embodiment, the device includes a semiconductor die with an integrated circuit fabricated thereon, a stress buffer die mounted to the semiconductor die overlying the integrated circuit, and a molding compound encapsulating the semiconductor die and the stress buffer die. Generally the integrated circuit includes a ferroelectric memory. In some embodiments, the device further includes a polyimide layer between the stress buffer and the semiconductor die. Other embodiments are also provided.

Abstract: An interaction system is provided. The interaction system has a first mobile device, configured to capture images of a scene, and a server, configured to recognize a first electronic device from the images captured by the first mobile device, so that the first electronic device and the first mobile device interact with each other.