Patents by Inventor Fan Ho
Fan Ho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6462608Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: GrantFiled: July 18, 1997Date of Patent: October 8, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Patent number: 6456149Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: GrantFiled: February 27, 2001Date of Patent: September 24, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Patent number: 6444558Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: GrantFiled: August 7, 1998Date of Patent: September 3, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Publication number: 20020050625Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: ApplicationFiled: November 21, 2001Publication date: May 2, 2002Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Patent number: 6365421Abstract: An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.Type: GrantFiled: March 20, 2000Date of Patent: April 2, 2002Assignee: Micron Technology, Inc.Inventors: Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt Beigel, Fan Ho, Patrick J. Mullarkey, Dien Luong, Hua Zheng, Michael Shore, Jeffrey P. Wright, Adrian E. Ong, Todd A. Merritt
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Publication number: 20020027815Abstract: The cancellation of a redundant element of an integrated circuit with a cancel bank is disclosed. In one embodiment, a fuse or antifuse bank is coupled to the redundant element and permanently programmed to respond to the address of a defective primary element. If the redundant element is found to be defective, the fuise or antifuse bank is canceled, and a result the redundant element is also canceled. A cancel line of the fuse or antifuse bank, along with the cancel line of each of a plurality of other fuse or antiflise banks, is coupled to a cancel bank. The cancel bank comprises a multiplexer and a plurality of cancel antifuses less in number than the number of fuise or antifise banks. The cancel antifises are selectively enabled such that the fuse or antifuise bank coupled to the defective redundant element may be canceled.Type: ApplicationFiled: August 15, 2001Publication date: March 7, 2002Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Patent number: 6351140Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: GrantFiled: February 27, 2001Date of Patent: February 26, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Patent number: 6351424Abstract: The cancellation of a redundant element of an integrated circuit with a cancel bank is disclosed. In one embodiment, a fuse or antifuse bank is coupled to the redundant element and permanently programmed to respond to the address of a defective primary element. If the redundant element is found to be defective, the fuse or antifuse bank is canceled, and a result the redundant element is also canceled. A cancel line of the fuse or antifuse bank, along with the cancel line of each of a plurality of other fuse or antifuse banks, is coupled to a cancel bank. The cancel bank comprises a multiplexer and a plurality of cancel antifuses less in number than the number of fuse or antifuse banks. The cancel antifuses are selectively enabled such that the fuse or antifuse bank coupled to the defective redundant element may be canceled.Type: GrantFiled: August 8, 2000Date of Patent: February 26, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Publication number: 20020006676Abstract: An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.Type: ApplicationFiled: March 20, 2000Publication date: January 17, 2002Inventors: Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt Beigel, Fan Ho, Patrick J. Mullarkey, Dien Luong, Hua Zheng, Michael Shore, Jeffrey P. Wright, Adrian E. Ong, Todd A. Merritt
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Patent number: 6323536Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: GrantFiled: August 7, 1998Date of Patent: November 27, 2001Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Publication number: 20010040269Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: ApplicationFiled: August 7, 1998Publication date: November 15, 2001Inventors: DOUGLAS J. CUTTER, FAN HO, KURT D. BEIGEL
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Publication number: 20010013805Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: July 18, 1997Publication date: August 16, 2001Inventors: DOUGLAS J. CUTTER, KURT D. BEIGEL, FAN HO
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Publication number: 20010008382Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: February 27, 2001Publication date: July 19, 2001Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Publication number: 20010007431Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: February 27, 2001Publication date: July 12, 2001Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Publication number: 20010006351Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: February 27, 2001Publication date: July 5, 2001Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Patent number: 6255894Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: GrantFiled: August 9, 1999Date of Patent: July 3, 2001Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Patent number: 6194738Abstract: An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.Type: GrantFiled: February 27, 1998Date of Patent: February 27, 2001Assignee: Micron Technology, Inc.Inventors: Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt Beigel, Fan Ho, Patrick J. Mullarkey, Dien Luong, Hua Zheng, Michael Shore, Jeffrey P. Wright, Adrian E. Ong, Todd A. Merritt
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Patent number: 6185705Abstract: Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.Type: GrantFiled: March 7, 1997Date of Patent: February 6, 2001Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett M. Debenham, Dien Luong, Kim Pierce, Patrick J. Mullarkey
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Patent number: 6154410Abstract: Method and apparatus are disclosed for reducing antifuse programming time by connecting the programming voltage to the electrode of the antifuse element that has roughened polysilicon.Type: GrantFiled: February 5, 1997Date of Patent: November 28, 2000Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Fan Ho, Patrick J. Mullarkey, Dien Luong, Brett Debenham, Kim Pierce
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Patent number: 6154398Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: GrantFiled: July 18, 1997Date of Patent: November 28, 2000Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho