Abstract: A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received.

Abstract: A measurement application device calibration unit, system, and method includes at least one coupling element comprising a first and second connections for coupling the coupling element into a signal measurement path that is coupled to a measurement application device, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive a predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined known calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

Abstract: The present disclosure provides a measurement application device calibration unit, comprising a coupling element comprising a first connection and a second connection for coupling the coupling element into a signal measurement path, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and comprising a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive the predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

Abstract: A detector circuit for a measurement instrument is described. The detector circuit includes a first signal input, a second signal input, and an averaging sub-circuit. The first signal input is configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test. The second signal input is configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test. The averaging sub-circuit is configured to determine an average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal. The averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal. Further, a signal processing circuit and a measurement instrument are described.

Abstract: A signal processing circuit for a measurement instrument is described. The signal processing circuit includes an analysis circuit, a measurement input, and at least two parallel measurement channels. The parallel measurement channels are configured to process the input signal, thereby generating first and second complex-valued measurement signals. The analysis circuit is configured to determine first and second error quantities associated with the first and second complex-valued measurement signals, respectively. The analysis circuit is configured to determine a complex-valued average signal corresponding to a combined average of the first and second complex-valued measurement signals. The analysis circuit is configured to determine a combined error quantity based on the complex-valued average signal. The analysis circuit is configured to determine a comparison quantity based on the combined error quantity as well as based on the first error quantity and/or the second error quantity.

Abstract: A phase noise measurement method of measuring phase noise of a device under test is described. The phase noise measurement method includes the steps of: determining, by a measurement circuit, measurement IQ data based on an output signal of a device under test; setting, by a control circuit, a magnitude threshold; determining, by an analysis circuit, critical samples of reference IQ data for which a magnitude of a reference signal is smaller than the magnitude threshold; discarding the critical samples of the reference IQ data and corresponding critical samples of the measurement IQ data, thereby obtaining modified reference IQ data and modified measurement IQ data; and determining, by the analysis circuit, a phase noise spectrum of the output signal of the device under test based on the modified reference IQ data and based on the modified measurement IQ data. Further, a measurement system is described.

Abstract: A signal processing method for selectively removing noise from a digital input signal is provided. The method includes the steps of, for example, receiving, by a signal input, a digital input signal of a device under test, determining, by an analysis circuit, a DUT noise contribution to noise of the digital input signal, wherein the DUT noise contribution is associated with noise originating from the device under test, reducing, by the analysis circuit, a noise level of the digital input signal to a noise level of the DUT noise contribution determined, thereby obtaining a noise-reduced output signal, and providing the noise-reduced output signal to a measurement application for further processing. A signal processing system for carrying out the method or others is also provided.

Abstract: Embodiments of the present disclosure relate to methods of finding optimized analog measurement hardware settings of a measurement system for a target measurement. The method can include one or more of the following steps: applying initial settings to the measurement system; varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal; performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers.

Abstract: The present disclosure relates to a method for testing a device under test by using a test system. The method comprises the steps of: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a test and measurement instrument; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

Abstract: A method of customized setting at least one measurement device, comprises the steps of setting an intended measurement setup on the at least one measurement device manually via a user interface, recording, via a command recorder, at least one remote control command assigned to the manual setting of the intended measurement setup, converting the at least one remote control command recorded into specific instructions, and generating a standalone executable code at least based on the specific instructions obtained from the remote control command recorded. Further, a measurement system is provided.

Abstract: A multiuser measurement system is provided. The multiuser measurement system may authenticate a specific user. When the user has been authenticated, user related data may be obtained from a memory. The user related data are stored in the memory in an encrypted manner, and the encrypted data are only decrypted after authenticating the user.

Abstract: The present disclosure relates to a predistortion method and a predistortion system for a non-linear device-under-test, DUT. The predistortion method comprises the steps of: providing a reference input waveform to the DUT; deriving a predistorted waveform for the DUT based on the reference input waveform using an iterative direct digital predistortion technique; analyzing a relationship between the reference input waveform and the calculated predistorted waveform using a mathematical model; deriving a predistortion algorithm for the DUT based on said analysis; and applying said predistortion algorithm to an input signal and feeding the, thus, predistorted input signal to the DUT.

Abstract: A method of providing signal level performance information with respect to an electronic component is described. The electronic component includes a signal input. An input signal is received at the signal input or immediately upstream of the signal input. At least one power level parameter is determined, wherein the power level parameter is indicative of a power level of the input signal received. A performance indicator is provided, which includes information on a performance of the electronic component in dependence of the at least one power level parameter. A signal level performance information is determined with respect to the electronic component based on the at least one determined power level parameter and based on the performance indicator. Further, a monitoring system is described.

Abstract: A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Abstract: A measurement method includes providing a test signal to a first signal path and to a second signal path within a predefined time interval, thereby obtaining a first signal and a second signal, respectively; consecutively modifying at least one of a phase and an amplitude of the first signal and of the second signal, thereby obtaining a first modified signal and a second modified signal, respectively; applying a first window at least to the first signal, thereby obtaining a first set of measurement data being associated with at least the first signal; applying a second window at least to the second signal, thereby obtaining a second set of measurement data being associated with at least the second signal; and determining a response function difference between the signal paths based on the first set of measurement data and the second set of measurement data. Further, a measurement system is described.

Abstract: A setting of a measurement instrument comprises the providing a reference measurement instrument that uses at least one instrument parameter. A training phase is performed for a particular signal type to be processed by said reference measurement instrument in order to retrieve an optimal setting for said at least one instrument parameter. A lookup table is created for said particular signal type, said lookup table comprising at least said optimal setting for said at least one instrument parameter.

Abstract: A signal analysis method comprising: receiving an input signal, the input signal comprising a symbol sequence; receiving samples of a reference signal based on a known sample rate, the reference signal comprising the same symbol sequence as the input signal; determining symbol points of the symbol sequence based on the samples; determining measurement times based on the symbol points; and determining at least one signal quality parameter at the measurement times, wherein the at least one signal quality parameter is indicative of a signal quality of the input signal. Further, a measurement system is described.

Abstract: A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Abstract: A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received.

Abstract: A measurement method includes providing a test signal to a first signal path and to a second signal path within a predefined time interval, thereby obtaining a first signal and a second signal, respectively; consecutively modifying at least one of a phase and an amplitude of the first signal and of the second signal, thereby obtaining a first modified signal and a second modified signal, respectively; applying a first window at least to the first signal, thereby obtaining a first set of measurement data being associated with at least the first signal; applying a second window at least to the second signal, thereby obtaining a second set of measurement data being associated with at least the second signal; and determining a response function difference between the signal paths based on the first set of measurement data and the second set of measurement data. Further, a measurement system is described.