Abstract: A signal analysis method comprising: receiving an input signal, the input signal comprising a symbol sequence; receiving samples of a reference signal based on a known sample rate, the reference signal comprising the same symbol sequence as the input signal; determining symbol points of the symbol sequence based on the samples; determining measurement times based on the symbol points; and determining at least one signal quality parameter at the measurement times, wherein the at least one signal quality parameter is indicative of a signal quality of the input signal. Further, a measurement system is described.

Abstract: A measurement device with automatic optimization capabilities comprises at least one signal processing component with a physical detector and a virtual detector component comprising at least one virtual detector for a signal processing component without physical detector. The physical detector is configured to physically measure a measurement value assigned to the signal processing component. The virtual detector component is configured to use a model of a signal processing chain from the physical detector to the location of the virtual detector. The model comprises at least one model parameter for the signal processing chain. The measurement device is configured to adapt the virtual detector component with respect to a measurement type for the signal to be measured. The virtual detector component is configured to use the model and the at least one measurement value.

Abstract: A method for at least one of identifying and compensating for system errors in a measurement system is disclosed, wherein the measurement system comprises a signal generator and a signal analyzer. The method comprises: generating a test signal via the signal generator, the test signal having predetermined properties; forwarding the test signal to a device under test; processing the test signal via the device under test, thereby generating a transmission signal; receiving the transmission signal via the signal analyzer; determining a response function of the device under test based on the test signal and based on the transmission signal; and determining at least one periodic component of the response function. Further, a measurement system as well as a calibration system are disclosed.

Abstract: A method for at least one of identifying and compensating for system errors in a measurement system is disclosed, wherein the measurement system comprises a signal generator and a signal analyzer. The method comprises: generating a test signal via the signal generator, the test signal having predetermined properties; forwarding the test signal to a device under test; processing the test signal via the device under test, thereby generating a transmission signal; receiving the transmission signal via the signal analyzer; determining a response function of the device under test based on the test signal and based on the transmission signal; and determining at least one periodic component of the response function. Further, a measurement system as well as a calibration system are disclosed.

Abstract: A frame trigger recreation method is provided. Said frame trigger recreation method comprises the steps of generating a periodic trigger on the basis of a receiver clock with at least one period adjustment and at least one offset based on a difference between the receiver clock and a transmitter clock.

Abstract: A frame trigger recreation method is provided. Said frame trigger recreation method comprises the steps of generating a periodic trigger on the basis of a receiver clock with at least one period adjustment and at least one offset based on a difference between the receiver clock and a transmitter clock.

Abstract: A method of setting a measurement instrument comprises the steps of: Providing a reference measurement instrument that uses at least one instrument parameter; Performing a training phase for a particular signal type to be processed by said reference measurement instrument in order to retrieve an optimal setting for said at least one instrument parameter; and Creating a lookup table for said particular signal type, said lookup table comprising at least said optimal setting for said at least one instrument parameter. Further, a system for setting a measurement instrument is described.

Abstract: A measurement system for automated measurement of several contributions to signal degradation is provided. Said measurement system comprises a device under test, a signal analyzer, and a controller. In this context, the controller comprises at least one command sequence for the device under test and/or the signal analyzer. In addition to this, each of the at least one command sequence comprises respective commands to compensate for a specific cause of signal degradation.

Abstract: A measurement device with automatic optimization capabilities comprises at least one signal processing component with a physical detector and a virtual detector component comprising at least one virtual detector for a signal processing component without physical detector. The physical detector is configured to physically measure a measurement value assigned to the signal processing component. The virtual detector component is configured to use a model of a signal processing chain from the physical detector to the location of the virtual detector. The model comprises at least one model parameter for the signal processing chain. The measurement device is configured to adapt the virtual detector component with respect to a measurement type for the signal to be measured. The virtual detector component is configured to use the model and the at least one measurement value.

Abstract: A method for testing a device under test by using a test system is disclosed. The method comprises: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a vector signal analyzer; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

Abstract: A method of customized setting at least one measurement device, comprises the steps of setting an intended measurement setup on the at least one measurement device manually via a user interface, recording, via a command recorder, at least one remote control command assigned to the manual setting of the intended measurement setup, converting the at least one remote control command recorded into specific instructions, and generating a standalone executable code at least based on the specific instructions obtained from the remote control command recorded. Further, a measurement system is provided.

Abstract: A method for identifying the noise figure of a device under test is described. A signal generator that outputs the modulated signal, a device under test and an analyzer are provided. The signal generator is connected with the analyzer directly wherein at least two error vector magnitude measurements are performed. The signal generator is connected with the device under test and the device under test is connected with the analyzer wherein at least two error vector magnitude measurements are performed. The noise contribution of the device under test is determined from the error vector magnitude measurements performed. A gain measurement is performed on the device under test. The noise figure of the device under test is calculated based on the noise contribution of the device under test obtained and the gain of the device under test obtained. Further, a measurement system is described.

Abstract: A method for identifying the noise figure of a device under test is described. A signal generator that outputs the modulated signal, a device under test and an analyzer are provided. The signal generator is connected with the analyzer directly wherein at least two error vector magnitude measurements are performed. The signal generator is connected with the device under test and the device under test is connected with the analyzer wherein at least two error vector magnitude measurements are performed. The noise contribution of the device under test is determined from the error vector magnitude measurements performed. A gain measurement is performed on the device under test. The noise figure of the device under test is calculated based on the noise contribution of the device under test obtained and the gain of the device under test obtained. Further, a measurement system is described.

Abstract: A multiuser measurement system is provided. The multiuser measurement system may authenticate a specific user. When the user has been authenticated, user related data may be obtained from a memory. The user related data are stored in the memory in an encrypted manner, and the encrypted data are only decrypted after authenticating the user.

Abstract: A digital triggering system for processing data relating to a signal received is described, with an analog-to-digital converter, an IQ data source providing IQ data, a first digital signal processor, and at least a second digital signal processor. The first digital signal processor is connected with the IQ data source via a first signal path. The second digital signal processor is connected with the IQ data source via a second signal path. The first digital signal processor has at least a first signal processing parameter. The second digital signal processor has at least a second signal processing parameter. The first signal processing parameter and the second signal processing parameter are independent from each other. The first digital signal processor generates a trigger signal based upon a characteristic of the IQ data obtained from the IQ data source. The first digital signal processor triggers the second digital signal processor via the trigger signal to acquire IQ data obtained from the IQ data source.

Abstract: A digital triggering system for processing data relating to a signal received is described, with an analog-to-digital converter, an IQ data source providing IQ data, a first digital signal processor, and at least a second digital signal processor. The first digital signal processor is connected with the IQ data source via a first signal path. The second digital signal processor is connected with the IQ data source via a second signal path. The first digital signal processor has at least a first signal processing parameter. The second digital signal processor has at least a second signal processing parameter. The first signal processing parameter and the second signal processing parameter are independent from each other. The first digital signal processor generates a trigger signal based upon a characteristic of the IQ data obtained from the IQ data source. The first digital signal processor triggers the second digital signal processor via the trigger signal to acquire IQ data obtained from the IQ data source.