Patents by Inventor Frank Hecht

Frank Hecht has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230344447
    Abstract: A computer-implemented method for compression of Time Tagged data including Time Tagged data records includes the step of separating the Time Tagged data records into a plurality of groups. The method also includes sorting the Time Tagged data records in at least one of the groups by a photon arrival time. The method also includes subtracting a content of a record by a content of an adjacent record resulting in modified records. The method also includes compressing the modified records with a compression method.
    Type: Application
    Filed: September 20, 2021
    Publication date: October 26, 2023
    Inventor: Frank HECHT
  • Publication number: 20230175886
    Abstract: An apparatus is configured to count N-photon events within a time-dependent sequence of events of interactions of a plurality of photons with a light sensitive detector. The apparatus includes a signal-processing device and the light sensitive detector. An N-photon event represents an occurrence of at least N timely overlapping single photon events. The light sensitive detector is adapted to generate a time-dependent digital signal comprising digital patterns representing the time-dependent sequence of events from the detection of the plurality of photons with the light sensitive detector. Each digital pattern in the digital signal comprises a digital pattern width having a continuous sequence of digital values representing at least one event of interaction of at least one photon with the light sensitive detector. The signal-processing device is adapted to identify N-photon events from the digital patterns in the digital signal in dependence from the respective digital pattern width.
    Type: Application
    Filed: April 23, 2021
    Publication date: June 8, 2023
    Inventors: Holger Birk, Frank Hecht, Luis Alvarez, Bernd Widzgowski
  • Publication number: 20220343467
    Abstract: The present invention relates to a method for generating a result image. The method comprises the steps of: acquiring a STED image of a sample, the STED image comprising pixels; calculating Fourier coefficients of arrival times for the pixels of the image, resulting in real coefficients representing a first image and in imaginary coefficients representing a second image; deriving an intensity image from the STED image; applying a spatial filter to the first image, the second image and the intensity image, resulting in a filtered first image, a filtered second image, and filtered intensity image, respectively; calculating an image G based on the filtered first image and the filtered intensity image; calculating an image S based on the filtered second image and the filtered intensity image; and calculating a result image based on the image G and the image S.
    Type: Application
    Filed: October 8, 2020
    Publication date: October 27, 2022
    Inventors: Luis ALVAREZ, Frank HECHT
  • Patent number: 11086119
    Abstract: A fluorescence-lifetime imaging microscopy method with time-correlated single-photon counting includes using excitation light pulses separated in each case by a measurement interval to excite a sample to emit fluorescence photons. A detector signal that represents the captured fluorescence photons is generated. Detection times are determined based on the detector signal. Imaging is performed based on the detection times. The detection times of all captured fluorescence photons are compiled in a first data memory, common to a plurality of image pixels. The detection times of only those fluorescence photons which were captured in a predetermined number within the respective measurement intervals are compiled in a second data memory, common to the same plurality of image pixels. The detection times compiled in the data memories are combined within a calculation step. The results of the calculation step are stored in a third data memory.
    Type: Grant
    Filed: December 18, 2018
    Date of Patent: August 10, 2021
    Assignee: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Frank Hecht, Bernd Widzgowski
  • Publication number: 20200400933
    Abstract: A fluorescence-lifetime imaging microscopy method with time-correlated single-photon counting includes using excitation light pulses separated in each case by a measurement interval to excite a sample to emit fluorescence photons. A detector signal that represents the captured fluorescence photons is generated. Detection times are determined based on the detector signal. Imaging is performed based on the detection times. The detection times of all captured fluorescence photons are compiled in a first data memory, common to a plurality of image pixels. The detection times of only those fluorescence photons which were captured in a predetermined number within the respective measurement intervals are compiled in a second data memory, common to the same plurality of image pixels. The detection times compiled in the data memories are combined within a calculation step. The results of the calculation step are stored in a third data memory.
    Type: Application
    Filed: December 18, 2018
    Publication date: December 24, 2020
    Inventors: Frank HECHT, Bernd WIDZGOWSKI
  • Patent number: 10520434
    Abstract: A fluorescence lifetime imaging microscopy method with time-correlated single photon counting includes periodically exciting a sample to emit fluorescence photons, with a measurement interval being defined between each two successive excitation light pulses. A value characterizing fluorescence decay behavior is determined based on detection times of detected fluorescence photons, and imaging is performed based one the value. An analog detector signal is sampled within a plurality of sampling intervals within a respective one of the measurement intervals and is converted into a sequence of discrete signal values associated with the sampling intervals. It is determined based thereon whether more than a predefined number of fluorescence photons has been detected within the respective measurement interval.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: December 31, 2019
    Assignee: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Volker Seyfried, Bernd Widzgowski, Frank Hecht
  • Publication number: 20190339201
    Abstract: A fluorescence lifetime imaging microscopy method with time-correlated single photon counting includes periodically exciting a sample to emit fluorescence photons, with a measurement interval being defined between each two successive excitation light pulses. A value characterizing fluorescence decay behavior is determined based on detection times of detected fluorescence photons, and imaging is performed based one the value. An analog detector signal is sampled within a plurality of sampling intervals within a respective one of the measurement intervals and is converted into a sequence of discrete signal values associated with the sampling intervals. It is determined based thereon whether more than a predefined number of fluorescence photons has been detected within the respective measurement interval.
    Type: Application
    Filed: May 24, 2017
    Publication date: November 7, 2019
    Inventors: Volker SEYFRIED, Bernd WIDZGOWSKI, Frank HECHT
  • Patent number: 10261306
    Abstract: A method for execution upon operation of a microscope or for depiction of an object, or a part thereof, imaged with the microscope includes depicting a proxy of the object on a display of the microscope or on a further display. At least one manipulation is performed on the proxy, or on the depiction of the proxy, using an input means. At least one depiction parameter for the depiction of the object or of the part of the object, or at least one microscope control parameter, is derived from the manipulation. The object or the part of the object is depicted in consideration of the derived depiction parameter or of the derived microscope control parameter.
    Type: Grant
    Filed: April 19, 2013
    Date of Patent: April 16, 2019
    Assignee: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Frank Hecht, Frank Sieckmann
  • Publication number: 20150143274
    Abstract: A method for execution upon operation of a microscope or for depiction of an object, or a part thereof, imaged with the microscope includes depicting a proxy of the object on a display of the microscope or on a further display. At least one manipulation is performed on the proxy, or on the depiction of the proxy, using an input means. At least one depiction parameter for the depiction of the object or of the part of the object, or at least one microscope control parameter, is derived from the manipulation. The object or the part of the object is depicted in consideration of the derived depiction parameter or of the derived microscope control parameter.
    Type: Application
    Filed: April 19, 2013
    Publication date: May 21, 2015
    Inventors: Frank Hecht, Frank Sieckmann
  • Patent number: 8908271
    Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction valu
    Type: Grant
    Filed: July 13, 2013
    Date of Patent: December 9, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Michael Goelles, Ralf Netz, Frank Hecht, Joerg-Michael Funk
  • Patent number: 8780443
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the f
    Type: Grant
    Filed: October 13, 2009
    Date of Patent: July 15, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ralf Engelmann, Joerg Michael Funk, Bernhard Zimmerman, Ralph Netz, Frank Hecht
  • Publication number: 20130307959
    Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction valu
    Type: Application
    Filed: July 13, 2013
    Publication date: November 21, 2013
    Inventors: Michael Goelles, Ralf Netz, Frank Hecht, Joerg-Michael Funk
  • Publication number: 20120268749
    Abstract: Laser scanning microscope and its operating method in which at least two first and second scanning systems activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, The scanning fields created by the light distributions on the sample mutually overlap to create a reference pattern on the sample with one of the light distributions, which is then captured and used to create the overlap using the second light distribution and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined.
    Type: Application
    Filed: November 18, 2011
    Publication date: October 25, 2012
    Inventors: Michael Goelles, Ralf Netz, Frank Hecht, Joerg-Michael Funk
  • Patent number: 8120771
    Abstract: By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a raster image correlation spectroscopy measurement (RICS) measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. For a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (?P) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: February 21, 2012
    Assignee: Carl Zeiss MicroImaging GmbH
    Inventors: Stephan Wagner-Conrad, Frank Hecht, Klaus Weisshart, Ralf Netz
  • Publication number: 20100225910
    Abstract: 1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2.
    Type: Application
    Filed: September 30, 2008
    Publication date: September 9, 2010
    Inventors: Stephan Wagner-Conrad, Frank Hecht, Klaus Weisshart, Ralf Netz
  • Publication number: 20100097694
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the f
    Type: Application
    Filed: October 13, 2009
    Publication date: April 22, 2010
    Inventors: Bernhard Zimmermann, Ralf Netz, Frank Hecht, Joerg-Michael Funk, Ralf Engelmann
  • Publication number: 20090296207
    Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction valu
    Type: Application
    Filed: April 6, 2007
    Publication date: December 3, 2009
    Inventors: Michael Goelles, Ralf Netz, Frank Hecht, Joerg-Michael Funk
  • Patent number: 7593581
    Abstract: Process for the acquisition of images from a sample with a microscope, wherein detected image data that correspond to three dimensional probe regions are detected and stored to memory, wherein data compression ensues in that the data of images lying next to one another and over one another on the probe are taken into consideration during compression. A stack of images is advantageously recorded and images that are respectively adjacent in the image stack are consulted for the compression of data. Temporally and/or spectrally detected and stored data shall be consulted for the compression of data.
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: September 22, 2009
    Assignee: Carl Zeiss Micro Imaging GmbH
    Inventors: Frank Hecht, Ralf Engelmann, Ralf Wolleschensky
  • Patent number: 7456026
    Abstract: An arrangement for the detection of fluorescent light with at least one imaging microscope unit and at least one device component for analyzing molecular interactions in small volumes, wherein measurement locations for the analysis of molecular interaction are determined and selected in at least two dimensions by the imaging method; the imaging microscope unit and the device components are operated with a shared control unit; and at least the analysis results of the device component are graphically depicted via the control unit and a computer.
    Type: Grant
    Filed: February 15, 2001
    Date of Patent: November 25, 2008
    Assignee: Carl Zeiss MicroImaging GmbH
    Inventors: Reinhard Janka, Volker Juengel, Tilo Jankowski, Frank Hecht
  • Patent number: D608787
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: January 26, 2010
    Assignees: Carl Zeiss MicroImaging GmbH, Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung e.V.
    Inventors: Christopher Power, Markus Turber, Daniel Mauch, Bernhard Goetze, Fabian Hermann, Frank Hecht, Joerg Engel, Steffen Suepple, Stefan Brandys