Abstract: A first analog block includes a first plurality of switched capacitors and a second analog block includes a second plurality of switched capacitors. A switch associated with the first plurality of switched capacitors as well as a switch associated with the second plurality of switched capacitors may be configured based on one or more analog functions. The configuring of the first analog and the second analog block may include the configuring of the switch associated with the first plurality of switched capacitors when the analog function is associated with a first single ended signal and the configuring of both the switch associated with the first plurality of switched capacitors and the switch associated with the second plurality of switched capacitors when the analog function is associated with a differential signal.

Abstract: A first analog block includes a first plurality of switched capacitors and a second analog block includes a second plurality of switched capacitors. A switch associated with the first plurality of switched capacitors as well as a switch associated with the second plurality of switched capacitors may be configured based on one or more analog functions. The configuring of the first analog and the second analog block may include the configuring of the switch associated with the first plurality of switched capacitors when the analog function is associated with a first single ended signal and the configuring of both the switch associated with the first plurality of switched capacitors and the switch associated with the second plurality of switched capacitors when the analog function is associated with a differential signal.

Abstract: A first portion of a programmable switched capacitor block includes a first plurality of switched capacitors and a second portion of the programmable switched capacitor block includes a second plurality of switched capacitors. A first switch associated with the first plurality of switched capacitors as well as a second switch associated with the second plurality of switched capacitors may be configured based on a type of analog function that is to be provided. The configuring of the first analog and the second analog block may include the configuring of the first switch associated with the first plurality of switched capacitors when the analog function operates on a first single ended signal and the configuring of both the first and second switches when the analog function operates on a differential signal.

Abstract: A first portion of a programmable switched capacitor block includes a first plurality of switched capacitors and a second portion of the programmable switched capacitor block includes a second plurality of switched capacitors. A first switch associated with the first plurality of switched capacitors as well as a second switch associated with the second plurality of switched capacitors may be configured based on a type of analog function that is to be provided.

Abstract: An active integrator for sensing capacitance of a touch sense array is disclosed. The active integrator is configured to receive from the touch sense array a response signal having a positive portion and a negative portion. The response signal is representative of a presence or an absence of a conductive object on the touch sense array. The active integrator is configured to continuously integrate the response signal.

Abstract: A first analog block includes a first plurality of switched capacitors and a second analog block includes a second plurality of switched capacitors. A switch associated with the first plurality of switched capacitors as well as a switch associated with the second plurality of switched capacitors may be configured based on one or more analog functions.

Abstract: A system for the calibration of a programmable system-on-a-chip is described. More specifically, embodiments of the present invention relate to a system that calibrates a programmable analog block in a system-on-a-chip without the use of external components.

Abstract: A processing system measures an input voltage received at an input of an analog circuit, such as an analog-to-digital converter (ADC), where the input voltage is measured by comparing the input voltage to a reference voltage. The reference voltage is determined by the difference between a first voltage and a ground voltage. The processing system includes a programmable reference signal selection circuit to maintain the reference voltage at a constant level.

Abstract: Buffer circuit embodiments are described. A buffer circuit includes an input configured to receive an input signal and a buffer configured to generate an output signal based on the input signal. In one embodiment, the buffer circuit includes a programmable chopping module coupled with the buffer, wherein the programmable chopping module is programmable with a selected configuration from a plurality of configurations, and wherein the programmable chopping modulates the input signal based on the selected configuration. In another embodiment, the buffer circuit further includes a programmable output filter coupled with the buffer, wherein the programmable output filter is programmable with a selected configuration form a plurality of configurations, and wherein the programmable output filter filters a frequency band of the output signal based on the selected configuration.

Abstract: A system for the calibration of a programmable system-on-a-chip is described. More specifically, embodiments of the present invention relate to a system that calibrates a programmable analog block in a system-on-a-chip without the use of external components.

Abstract: A programmable device includes an operational amplifier and circuitry. The operational amplifier is configured to generate an output voltage based on input voltages at input terminals thereof. The circuitry is configured to provide the input voltages to the operational amplifier. The configuration of the circuitry allows the programmable device to implement discrete-time or continuous-time functions. The circuitry includes a resistor network and a capacitor network configured to be selectively coupled to the operational amplifier.

Abstract: An active integrator for sensing capacitance of a touch sense array is disclosed. The active integrator is configured to receive from the touch sense array a response signal having a positive portion and a negative portion. The response signal is representative of a presence or an absence of a conductive object on the touch sense array. The active integrator is configured to continuously integrate the response signal.

Abstract: A programmable processing device having a control system and a programmable reference block. The control system sends digital control signals to the programmable reference block, which in turn generates analog variable signals used as reference signals for the programming of the one or more reconfigurable data converters.

Abstract: A system for the calibration of a programmable system-on-a-chip is described. More specifically, embodiments of the present invention relate to a system that calibrates a programmable analog block in a system-on-a-chip without the use of external components.

Abstract: A programmable system includes a programmable analog device including an operational amplifier to generate an output voltage based on input voltages at terminals of the operational amplifier. The programmable system also includes a system controller to direct the programmable analog device to reconfigure analog circuitry providing the input voltages to the operational amplifier. The reconfiguration of the analog circuitry allows the programmable analog device to implement discrete-time or continuous-time functions.

Abstract: A buffer circuit includes an input configured to receive an input signal; and a buffer configured to generate an output signal based on the input signal. In an embodiment, the output signal has a linear relationship with the input signal when the input signal is within the input voltage range; and the buffer circuit further includes a level-shifting circuit coupled with the input, wherein the level shifting circuit determines an input voltage range, and wherein one of an upper limit and a lower limit of the input voltage range is within 50 millivolts from a supply rail voltage. In another embodiment, the buffer circuit further includes a programmable chopping module coupled with the buffer, wherein the programmable chopping module is programmable with a selected configuration from a plurality of configurations, and wherein the programmable chopping modulates the input signal based on the selected configuration.

Abstract: A system includes an analog-to-digital modulator to convert at least one analog input signal into at least one digital output signal. The system also includes a processing device to set an operational order and a quantization level of the analog-to-digital modulator. The analog-to-digital modulator converts the analog input signal into the digital output signal according to the operational order and the quantization level.

Abstract: The apparatus includes a diode laser and a current source interconnected with the diode laser. Two independent circuits in the current source are configured to limit current flowing through the diode laser. A first current limiter circuit configured to limit a current output from the current source to an anode of the diode laser, and an independent second current limiter circuit configured to limit a current return from a cathode of the diode laser to the current source so that laser output power does not exceed a specified maximum regardless of a single fault in either the first or second current limiter circuits.

Abstract: Analog channel calibration methods, devices and systems are disclosed. One embodiment of the present invention pertains to a method for calibrating a channel offset of a current sensor which comprises measuring a channel offset native to a current sensor channel. The method also comprises storing the channel offset native to the current sensor channel to a register associated with the current sensor channel as a value. Additionally, the method comprises calibrating an output signal generated in response to an input signal to the current sensor channel based on the value.

Abstract: A method and an apparatus are described for an offset correction in a high gain amplifier. An embodiment of an amplifier circuit includes an amplifier to convert a current signal into a voltage signal, where the amplifier generates an offset voltage in the voltage signal. The amplifier circuit also includes a sampling component coupled with the amplifier, with the sampling component subtracting a first sample of the voltage signal from a second sample of the voltage signal to produce a difference value. The amplifier circuit further includes a gain component coupled with the sampling component to amplify the difference between the first sample and the second sample.