Abstract: A method for making a secondary collimator that includes at least one plate having a plurality of slits defined therein includes determining a gap thickness between plate positions of the secondary collimator based on at least one dimension of the at least one plate and fabricating a base plate from a base plate blank. The base plate includes at least two slots being spaced apart by the gap thickness. The at least one plate is inserted into a first slot of the at least two slots to form the secondary collimator.

Abstract: A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.

Abstract: A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.

Abstract: Methods, a processor, and a system for improving an accuracy of identification of a substance are described. One of the methods includes determining whether a relative molecular interference function of the substance includes at least one peak.

Abstract: System and method for XRD-based threat detection. An object is scanned with a first threat detection system. One or more alarm objects are identified. Data about the one or more alarm objects is passed from the first threat detection system to a second threat detection system and is used to move and/or to rotate the object in a predetermined ray path that decreases attenuation of scattered x-ray radiation. Also disclosed is a secondary collimator for XRD-based false alarm resolution in computed tomography {“CT”) threat detection systems. The secondary collimator comprises one or more slit apertures configured to provide a multi-angle capability that extends a range of momenta for which XRD intensities are measured for a predetermined range of photon intensities.

Abstract: A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.

Abstract: A method for making a secondary collimator that includes at least one plate having a plurality of slits defined therein includes determining a gap thickness between plate positions of the secondary collimator based on at least one dimension of the at least one plate and fabricating a base plate from a base plate blank. The base plate includes at least two slots being spaced apart by the gap thickness. The at least one plate is inserted into a first slot of the at least two slots to form the secondary collimator.

Abstract: A multiple-plane X-ray diffraction imaging (XDI) device for generating an X-ray diffraction (XRD) profile of an object is described. The XDI device includes an X-ray source configured to generate X-rays and a first primary collimator configured to generate a first primary X-ray fan-beam. The XDI device also includes a second primary collimator configured to generate a second primary X-ray fan-beam. The XDI device also includes a first scatter detector array configured to detect a first set of scattered radiation generated upon intersection of the first primary X-ray fan-beam with the object, and a second scatter detector array configured to detect a second set of scattered radiation generated upon intersection of the second primary X-ray fan-beam with the object.

Abstract: A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.

Abstract: A method for assembling a secondary collimator including a first face plate having a first surface and an opposing second surface is provided. The method includes positioning a lamella assembly on the first face plate, wherein the lamella assembly includes at least one radiation-absorbing material layer and at least one radiation-transmitting material layer, such that a first surface of the lamella assembly is adjacent the second surface of the first face plate. The method also includes coupling a second face plate to the first face plate and the lamella assembly such that a first surface of the second face plate is adjacent a second surface of the lamella assembly.

Abstract: A method for developing a primary collimator is described. The method includes placing a primary collimator element at an intersection of a first set of at least two beams.

Abstract: Systems and methods for reducing a degradation effect on a signal are described. One of the methods includes pre-processing data based on a scan of a reference object and a scan of a substance. The reference object includes a material having an atomic number ranging from and including forty to sixty.

Abstract: An integrated, multi-sensor, Level 1 screening device is described, which system provides a next-generation Explosives Detection System (EDS) that enables high throughput, while drastically reducing false alarms. In exemplary embodiments, the present system comprises a non-rotational, Computed Tomography (CT) system and a non-translational, X-ray diffraction (XRD) system, both in an inline configuration.

Abstract: A method for operating an X-ray diffraction imaging (XDI) system to scan an object includes generating an X-ray beam from at least one source focus at a first focus location, and receiving first scatter radiation at a first scatter angle at a scatter detector. The first scatter radiation is produced when the X-ray beam interacts with the object. The method further includes displacing the at least one source focus from the first focus location to a second focus location, generating a displaced X-ray beam from the at least one source focus at the second focus location, and receiving second scatter radiation at a second scatter angle at the scatter detector. The second scatter radiation is produced when the displaced X-ray beam interacts with the object. An identification of the object based on one of the first scatter radiation and the second scatter radiation is output.

Abstract: A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system includes a multi-focus x-ray source (MFXS) that emits radiation sequentially from a plurality of focus points denoted by F1, F2, . . . Fn with a running index i. The method includes measuring a diffraction profile Xk for each coherent scatter detector Dk of the plurality of coherent scatter detectors. The diffraction profile includes a spectrum of a number of photons measured in a plurality of corresponding coherent scatter detectors. Each coherent scatter detector Dk is corrected to remove scatter from a plurality of primary beams directed to remaining coherent scatter detectors of the plurality of coherent scatter detectors.

Abstract: System and method for XRD-based false alarm resolution in computed tomography (“CT”) threat detection systems. Following a scan of an object with a megavoltage CT-based threat detection system, a suspicious area in the object is identified. The three dimensional position of the suspicious area is used to determine a ray path for the XRD-based threat detection system that provides minimal X-ray attenuation. The object is then positioned for XRD scanning of the suspicious area along this determined ray path. The XRD-based threat detection system is configured to detect high density metals (“HDMs) as well as shielded Special Nuclear Materials (“SNMs”) based on cubic or non-cubic diffraction profiles.

Abstract: An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.

Abstract: A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line.

Abstract: A contraband detection system includes a first contraband detection apparatus designed to perform a first scan on an object and a second contraband detection apparatus positioned in-line with the first contraband detection apparatus to perform a second scan on the object. A computer is included in the contraband detection system and is programmed to cause the first contraband detection apparatus to perform the first scan and acquire object data therefrom. The computer is further programmed to identify one or more regions of interest (ROI) in the object based on the object data, cause the second contraband detection apparatus to perform the second scan on the one or more identified ROIs, and acquire object data from the second scan.

Abstract: An x-ray diffraction imaging device includes at least one x-ray detector and at least one scatter collimator positioned upstream of the at least one x-ray detector. The at least one collimator includes a plurality of successive plates. Each of the plurality of plates defines a plurality of rectangular holes. The plurality of successive plates are arranged such that the plurality of rectangular holes define a plurality of quadrilateral passages extending through the at least one scatter collimator. Each of the plurality of quadrilateral passages is configured to increase a rate of detection of first x-rays that define an x-ray transit path enclosed within a single such quadrilateral passage. Also, the plurality of quadrilateral passages is configured to decrease a rate of detection of second x-rays that define an x-ray transit path that intersects more than one such quadrilateral passage.