Patents by Inventor George Frederick Walker

George Frederick Walker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5972156
    Abstract: The invention is a radiofrequency identification tag comprising a semiconductor chip having radio frequency, logic, and memory circuits, and an antenna that are mounted on a substrate. The antenna may be used by the chip to modulate an incident RF signal to transfer information to a base station. The antenna comprises one or more lengths of thin wire that are connected directly to the chip by means of wire bonding. The chip and antenna combination are sealed with an organic film covering.
    Type: Grant
    Filed: August 21, 1997
    Date of Patent: October 26, 1999
    Assignee: Intermec IP Corp.
    Inventors: Michael John Brady, Thomas Cofino, Harley Kent Heinrich, Glen Walden Johnson, Paul Andrew Moskowitz, George Frederick Walker
  • Patent number: 5958590
    Abstract: Pastes of dendrite particles coated with an electrically conductive coating are described. A surface is placed in contact with an electrolytic or electroless plating solution. Dendrites are formed on the surface. The dendrites are exposed to another plating solution to plate a coating on the surface of the dendrites. The coated dendrites are removed from the surface to form a powder of coated dendrites. The powder is added to a polymer material to form a paste. The paste is disposed between electrical contacts on adjacent surfaces. The paste is heated to fuse the dendrite surfaces to form a network of fused dendrites which are also fused to the electrical contacts. The paste is further heated to cure the polymer to form electrical interconnections between the electrical contacts on the adjacent surfaces.
    Type: Grant
    Filed: March 31, 1995
    Date of Patent: September 28, 1999
    Assignee: International Business Machines Corporation
    Inventors: Sung Kwon Kang, Sampath Purushothaman, George Frederick Walker
  • Patent number: 5929651
    Abstract: An apparatus and a method for simultaneously testing or burning in all the integrated circuit chips on a product wafer. The apparatus comprises a glass ceramic carrier having test chips and means for connection to pads of a large number of chips on a product wafer. Voltage regulators on the test chips provide an interface between a power supply and power pads on the product chips, at least one voltage regulator for each product chip. The voltage regulators provide a specified Vdd voltage to the product chips, whereby the Vdd voltage is substantially independent of current drawn by the product chips. The voltage regulators or other electronic means limit current to any product chip if it has a short. The voltage regulator circuit may be gated and variable and it may have sensor lines extending to the product chip. The test chips can also provide test functions such as test patterns and registers for storing test results.
    Type: Grant
    Filed: November 18, 1996
    Date of Patent: July 27, 1999
    Assignee: International Business Machines Corporation
    Inventors: James Marc Leas, Robert William Koss, Jody John Van Horn, George Frederick Walker, Charles Hampton Perry, David Lewis Gardell, Steve Leo Dingle, Ronald Prilik
  • Patent number: 5855993
    Abstract: Silicon and germanium containing materials are used at surface of conductors in electronic devices. Solder can be fluxlessly bonded and wires can be wire bonded to these surfaces. These material are used as a surface coating for lead frames for packaging integrated circuit chips. These materials can be decal transferred onto conductor surfaces or electrolessly or electrolytically disposed thereon.
    Type: Grant
    Filed: February 22, 1994
    Date of Patent: January 5, 1999
    Assignee: International Business Machines Corporation
    Inventors: Michael John Brady, Curtis Edward Farrell, Sung Kwon Kang, Jeffrey Robert Marino, Donald Joseph Mikalsen, Paul Andrew Moskowitz, Eugene John O'Sullivan, Terrence Robert O'Toole, Sampath Purushothaman, Sheldon Cole Rieley, George Frederick Walker
  • Patent number: 5838160
    Abstract: The present invention is directed to probe structures for testing of electrical interconnections to integrated circuit devices and other electronic components and particularly to testing integrated circuit devices with high density area array solder ball interconnections. The probe structure is formed from a substrate having a surface having at least one electrical contact location which has a perimeter which is raised above the surface and a location within the boundaries of said perimeter which is raised above the surface.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: November 17, 1998
    Assignee: International Business Machines Corporation
    Inventors: Brian Samuel Beaman, Keith Edward Fogel, Paul Alfred Lauro, Maurice Heathcote Norcott, Da-Yuan Shih, George Frederick Walker
  • Patent number: 5837119
    Abstract: Methods for forming pastes of dendrites particles coated with an electrically conductive coating are described. A surface is placed in contact with an electrolytic or electroless plating solution. Dendrites are formed on the surface. The dendrites are exposed to another plating solution to plate a coating on the surface of the dendrites. The coated dendrites are removed from the surface to form a powder of coated dendrites. The powder is added to a polymer material to form a paste which is heated to fuse the dendrite surfaces to form a network of interconnected dendrites and further heated to cure the polymer. When the paste is disposed between adjacent electrically conductive surfaces, the coated dendrites fuse to the electrically conductive surface to form electrical interconnections.
    Type: Grant
    Filed: August 9, 1996
    Date of Patent: November 17, 1998
    Assignee: International Business Machines Corporation
    Inventors: Sung Kwon Kang, Sampath Purushothaman, George Frederick Walker
  • Patent number: 5821763
    Abstract: The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an compliant of high modulus elastomeric material. A standard packaging substrate, such as a ceramic integrated circuit chip packaging substrate is used to provide a space transformer. Wires are bonded to an array of contact pads on the surface of the space transformer. The space transformer formed from a multilayer integrated circuit chip packaging substrate. The wires are as dense as the contact location array. A mold is disposed surrounding the array of outwardly projecting wires. A liquid elastomer is disposed in the mold to fill the spaces between the wires. The elastomer is cured and the mold is removed, leaving an array of wires disposed in the elastomer and in electrical contact with the space transformer.
    Type: Grant
    Filed: November 22, 1996
    Date of Patent: October 13, 1998
    Assignee: International Business Machines Corporation
    Inventors: Brian Samuel Beaman, Keith Edward Fogel, Paul Alfred Lauro, Maurice Heathcote Norcott, Da-Yuan Shih, George Frederick Walker
  • Patent number: 5813870
    Abstract: Dielectric adhesive film patterned with clusters of electrically conductive filaments that extend through the film thickness for providing electrical interconnection and encapsulation. The dielectric adhesive material is reworkable. The clusters are formed by selectively electroplating a noble metal at a high current density.
    Type: Grant
    Filed: July 12, 1996
    Date of Patent: September 29, 1998
    Assignee: International Business Machines Corporation
    Inventors: Michael Anthony Gaynes, Jaynal Abedin Molla, Steven Paul Ostrander, Judith Marie Roldan, George John Saxenmeyer, George Frederick Walker
  • Patent number: 5682143
    Abstract: A radiofrequency identification tag has a semiconductor chip with radio frequency circuit, logic, memory circuits, and further includes an antenna that is mounted on a substrate. The antenna may be used by the chip to modulate an incident RF signal to transfer information to a base station. The antenna comprises one or more lengths of thin wire that are connected directly to the chip by means of wire bonding. The chip and antenna combination can be sealed with an organic film covering.
    Type: Grant
    Filed: September 9, 1994
    Date of Patent: October 28, 1997
    Assignee: International Business Machines Corporation
    Inventors: Michael John Brady, Thomas Cofino, Harley Kent Heinrich, Glen Walden Johnson, Paul Andrew Moskowitz, George Frederick Walker
  • Patent number: 5660921
    Abstract: A multilevel electronic package comprising at least two levels, each level including a poly(aryl ether benzimidazole), a polymide and copper. A process of preparing this package is disclosed. Several novel poly(aryl ether benzimidazoles) useful in preparing this package are also set forth.
    Type: Grant
    Filed: May 23, 1995
    Date of Patent: August 26, 1997
    Assignee: IBM Corporation
    Inventors: Kie Yeung Ahn, James Lupton Hedrick, Jr., Jeffrey William Labadie, Kang-Wook Lee, Robert James Twieg, Alfred Viehbeck, George Frederick Walker