Abstract: A testing device for determines values of various electrical variables associated with a device within a process system. The testing device provides bi-directional electrical communication with a device to be monitored and automatically provides a connection configuration between a processing unit and a set of input/output ports. The connection configuration governs a bi-directional flow of electrical signals between the processing unit and the device to be monitored. The processing unit outputs a test signal and a configuration control signal to the input/output port control circuitry. The input/output port control circuitry, in response to received test and configuration control signals, automatically provides a connection configuration to direct the test signal to the device to be monitored and to direct a return signal, the return signal being generated by the monitored device in response to the test signal, to the processing unit.