Patents by Inventor Gerard Nicolaas Anne van Veen

Gerard Nicolaas Anne van Veen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
    Patent number: 7474419
    Abstract: A particle-optical apparatus comprising: A first source, for generating a first irradiating beam (E) along a first axis (A1); A second source, for generating a second irradiating beam (I) along a second axis (A2) that intersects the first axis at a beam intersection point, the first and second axes (A1, A2) defining a beam plane, A stage assembly (3) for positioning a sample in the vicinity of the beam intersection point, provided with: A sample table (21) to which the sample can be mounted; A set of actuators, arranged so as to effect translation of the sample table along directions substantially parallel to an X-axis perpendicular to the beam plane, a Y-axis parallel to the beam plane, and a Z-axis parallel to the beam plane, said X-axis, Y-axis and Z-axis being mutually orthogonal and passing through the beam intersection point, wherein the set of actuators is further arranged to effect: rotation of the sample table about a rotation axis (RA) substantially parallel to the Z-axis, and; rotation of the sa
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: January 6, 2009
    Assignee: FEI Company
    Inventors: Hendrik Gezinus Tappel, Ian Johannes Bernardus van Hees, Danny Lankers, Gerard Nicolaas Anne van Veen, Richard Young, Lucille Ann Giannuzzi
  • Method for the manufacture and transmissive irradiation of a sample, and particle-optical system
    Patent number: 6963068
    Abstract: The invention provides a method for the manufacture and transmissive irradiation of a sample, comprising the steps of: A Providing a particle-optical system having an internal low-pressure chamber and suitable for the generation of an electron beam and an intersecting ion beam in said chamber; B Providing a specimen within the chamber, carried by a manipulator; C Irradiating the specimen with the ion beam so as to cut a sample from the specimen; D Relatively displacing the sample thus cut to a sample holder than can be manipulated; E Attaching the sample to the sample holder; F Using an electron beam to perform transmissive irradiation of the sample thus attached to the sample holder, characterized in that step F is performed in the low-pressure chamber of the particle-optical system according to step A.
    Type: Grant
    Filed: January 15, 2004
    Date of Patent: November 8, 2005
    Assignee: FEI Company
    Inventors: Peter Emile Stephan Joseph Asselbergs, Hendrik Gezinus Tappel, Gerard Nicolaas Anne van Veen
  • Method for the manufacture and transmissive irradiation of a sample, and particle-optical system
    Publication number: 20040144924
    Abstract: The invention provides a method for the manufacture and transmissive irradiation of a sample, comprising the steps of:
    Type: Application
    Filed: January 15, 2004
    Publication date: July 29, 2004
    Inventors: Peter Emile Stephan Joseph Asselbergs, Hendrik Gezinus Tappel, Gerard Nicolaas Anne van Veen