Abstract: Provided is an organic photoelectric conversion element having improved durability. An organic photoelectric conversion element (10) comprises a layered structure (20) comprising a pair of electrodes (40) comprising a first electrode (42) and a second electrode (44), and an active layer (50) provided between the pair of electrodes, wherein at least one electrode of the pair of electrodes comprise an electrode containing a getter material (46) comprising an conductive material layer (46a) having interstitial spaces (46aa) which a first harmful substance contained in the layered structure permeates and at least one kind of the getter material (46b) which is capable of reacting with the first harmful substance, and the getter material is contained at least a part of the interstitial spaces.

Abstract: Embodiments relate to systems and methods for defect detection and localization in semiconductor chips. In an embodiment, a plurality of registers is arranged in a semiconductor chip. The particular number of registers can vary according to a desired level of localization, and the plurality of registers are geometrically distributed such that defect detection and localization over the entire chip area or a desired chip area, such as a central active region, is achieved in embodiments. In operation, a defect detection and localization routine can be run in parallel with other normal chip functions during a power-up or other phase. In embodiments, the registers can be multi-functional in that they can be used for other operational functions of the chip when not used for defect detection and localization, and vice-versa. Embodiments thereby provide fast, localized defect detection.