Abstract: Network analysis employs a band-limited multi-tone test signal having a tunable center frequency to test a device under test (DUT). A hybrid network analyzer includes a test signal source to provide the band-limited multi-tone test signal, and a local oscillator (LO) source to provide a tunable LO signal configured to track the tunable center frequency of the band-limited multi-tone test signal. The hybrid network analyzer further includes a receiver to convert into an intermediate frequency (IF) signal using the tunable LO signal one or both of the band-limited multi-tone test signal and a response signal from a device under test (DUT) produced in response to the band-limited multi-tone test signal. The test signal source is further configured to provide a tunable single-tone test signal and a broadband multi-tone test signal to test the DUT in various modes.

Abstract: Network analysis employs a band-limited multi-tone test signal having a tunable center frequency to test a device under test (DUT). A hybrid network analyzer includes a test signal source to provide the band-limited multi-tone test signal, and a local oscillator (LO) source to provide a tunable LO signal configured to track the tunable center frequency of the band-limited multi-tone test signal. The hybrid network analyzer further includes a receiver to convert into an intermediate frequency (IF) signal using the tunable LO signal one or both of the band-limited multi-tone test signal and a response signal from a device under test (DUT) produced in response to the band-limited multi-tone test signal. The test signal source is further configured to provide a tunable single-tone test signal and a broadband multi-tone test signal to test the DUT in various modes.

Abstract: A droplet sample holder, especially a sample holder for use in a measuring instrument utilizing surface plasmon resonance. The sample holder reduces or minimizes the measurement distortion result of the droplet “pherpheral concentration effect” by surrounding the analysis zone with a wettable (hydrophilic) zone that captures the periphery of the droplet to keep the pheriphery of the droplet and the increased concentration of the analyte out of the analysis zone. The wettable zone is surrounded by a nonwettable (hydrophobic) zone that restricts the periphery of the droplet to analysis zone and the wettable zone.

Abstract: A surface plasmon resonance (SPR) spectrometer sensor apparatus for measuring a property of an analyte substance that can be adsorbed on a surface by directing a beam of incident radiation on the apparatus at an incident angle relative thereto, receiving a beam of reflected radiation off the apparatus, and measuring dips in reflected radiation as a function of incident angle or wavelength, the dips being indicative of resonances in the apparatus. The SPR spectrometer comprises a conductive layer having a first side which receives incident radiation, and having a second side opposite to the first side; and a dielectric stack having first and second sides opposite to each other, the first side being in contact with the conductive layer, the second side for receiving an analyte sample to be disposed thereon.

Abstract: A system, method, and device for tracking motion across a surface by creating an interference pattern by reflecting light from the surface. There is produced, as a result of sensor moving across the surface, at least one signal pattern corresponding to a detection of a dimension of the interference pattern. This detected dimension is associated with an assumed dimensional value to determine a distance traveled by the sensor.

Abstract: The use of a high power and an incoherent light source to reduce noise associated when investigating unknown molecules in Surface Plasmon Resonance (SPR) systems. High power and incoherent light sources can improve resolution and accuracy of SPR system measurements.

Abstract: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

Abstract: A system and method of using a refractive index sensor to determine a characteristic of a sample. The operation of the system and method allow for determining a change in a bulk index of the sample, and an amount of sample adsorption, using a reflected beam from an interface of the sensor. An embodiment of a system and method further provide for identifying changes in incident angles determine from reflective measurement data of the sensor, in combination with different proportionality constants of the refractive index sensor to determine a characteristic of the sample.

Abstract: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

Abstract: A computer cursor control device includes (1) a light source generating light directed toward a stationary surface, (2) an optional phase modulator, (3) an optional function generator causing the phase modulator to periodically phase shift the light, and (4) a signal processor determining a direction in which the device is moving from a beat frequency or an asymmetry in the light intensity. Another computer cursor control device includes (1) an optical element combining reference and measurement beams to form a heterodyned beam, (2) a phase modulator located in an optical path of the reference beam or the measurement beam, (3) a function generator causing the phase modulator to phase shift the reference beam, and (4) a signal processor determining a direction in which the device is moving from a beat frequency of the heterodyned beam.

Abstract: A surface plasmon resonance (SPR) spectrometer sensor apparatus for measuring a property of an analyte substance that can be adsorbed on a surface by directing a beam of incident radiation on the apparatus at an incident angle relative thereto, receiving a beam of reflected radiation off the apparatus, and measuring dips in reflected radiation as a function of incident angle or wavelength, the dips being indicative of resonances in the apparatus. The SPR spectrometer comprises a conductive layer having a first side which receives incident radiation, and having a second side opposite to the first side; and a dielectric stack having first and second sides opposite to each other, the first side being in contact with the conductive layer, the second side for receiving an analyte sample to be disposed thereon.

Abstract: A voltage sensor capable of single-point or simultaneous multi-point contactless voltage measurement has an electro-optic transducer, a surface plasmon resonance (SPR) and an optical system. The electro-optic transducer is operable to translate an electric field dependent on the voltage in a device under test field to a variation in refractive index. The surface plasmon resonance (SPR) transducer is juxtaposed with the electro-optic transducer and is operable to translate the variation in the refractive index of the electro-optic transducer to a variation in reflectivity. The optical system is configured to illuminate the SPR transducer with incident light at a surface plasmon resonance-inducing angle of incidence and to detect light reflected by the SPR transducer at a single point or at multiple points within a region.

Abstract: A voltage sensor capable of single-point or simultaneous multi-point contactless voltage measurement has an electro-optic transducer, a surface plasmon resonance (SPR) and an optical system. The electro-optic transducer is operable to translate an electric field dependent on the voltage in a device under test field to a variation in refractive index. The surface plasmon resonance (SPR) transducer is juxtaposed with the electro-optic transducer and is operable to translate the variation in the refractive index of the electro-optic transducer to a variation in reflectivity. The optical system is configured to illuminate the SPR transducer with incident light at a surface plasmon resonance-inducing angle of incidence and to detect light reflected by the SPR transducer at a single point or at multiple points within a region.

Abstract: The use of a high power and an incoherent light source to reduce noise associated when investigating unknown molecules in Surface Plasmon Resonance (SPR) systems. High power and incoherent light sources can improve resolution and accuracy of SPR system measurements.

Abstract: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.

Abstract: A nonlinear filtering system determines the duration of a designated event in an SPR sensorgram, selects a filter length based on the determined duration of the designated event in the SPR sensorgram, and applies a nonlinear filter, having the selected filter length to the SPR sensorgram, to establish an output signal.

Abstract: Optical phase detection includes generating a first lightwave having a first polarization and a second lightwave having a polarization that is offset from the first polarization, and imposing a relative delay between the first and second lightwaves. The relative delay causes a frequency offset between the lightwaves as wavelength is tuned over a designated wavelength range. Directing the first and second lightwaves to a target provides a third lightwave and a fourth lightwave. A polarization component of the third lightwave and a polarization component of the fourth lightwave are detected to provide a detected signal at the frequency offset. The optical phase detection then includes extracting a phase difference, induced by the target, between the polarization components of the third and the fourth lightwaves.

Abstract: A system for characterizing optical properties of a device under test (DUT) uses an expanded local oscillator signal to perform multiple parallel interferometric measurements. In one system, the expanded local oscillator signal is optically connected to a lens array. The lens array focuses the expanded swept local oscillator signal into multiple beams. The multiple beams are then used in multiple parallel interferometric measurements. The multiple beams may be used as the reference beams or applied to the DUT and used as the test beams depending on the application. The test beams and reference beams are combined to perform the interferometric measurements. In another system, a portion of the expanded local oscillator signal is applied directly to a DUT as the test beam while another portion of the expanded local oscillator signal is used for the reference beam.

Abstract: By making combined interferometric and polarimetric measurements on a device under test, the relative phase uncertainty in device characterizations performed with a polarimeter or polarization analyzer alone is removed. This allows determination of the group delay to within a constant offset and the chromatic dispersion of the device under test.

Abstract: Characterizing active and passive properties of an optical device involves applying a local oscillator signal to a device under test (DUT) and providing a portion of the local oscillator signal (referred to as the reference local oscillator signal) directly to the an optical analyzer. Providing the reference local oscillator signal to the optical analyzer enables interferometric measurements associated with the DUT to be obtained along with direct measurements, where the interferometric measurements result from combining the portion of the local oscillator signal that is applied to the DUT with the reference local oscillator signal. The interferometric measurements are used to characterize passive properties of the DUT while the direct measurements are used to characterize active properties of the DUT.