Abstract: A method and structures are provided for implementing vertical transistors utilizing wire vias as gate nodes. The vertical transistors are high performance transistors fabricated up in the stack between the planes of the global signal routing wire, for example, used as vertical signal repeater transistors. An existing via or a supplemental vertical via between wire planes provides both an electrical connection and the gate node of the novel vertical transistor.

Abstract: A semiconductor chip has self aligned (where a gate electrode and associated spacers define the source/drain implant with respect to the gate electrode) Field Effect Transistors (FETs) in a back end of the line (BEOL) portion of the semiconductor chip. The FETs are used to make buffer circuits in the BEOL to improve delay and signal integrity of long signal paths on the semiconductor chip.

Abstract: A monitor bank consists of test one time programmable memory that is programmed distinctively from functional one time programmable memory in order to determine whether the functional one time programmable memory has or will program successfully. In a specific embodiment, each monitor bank consists of a first eFuse configured to expectedly never blow, a second eFuse configured to expectedly always blow, and at least a third eFuse configured to be more difficult to blow than the first eFuse, but easier to blow than the second eFuse. The method of determining whether functional eFuses have or will be programmed successfully is described: programming a monitor bank; sensing whether the test eFuses have blown; creating a monitor bank bit line blow pattern; determining an anticipated bit line blow pattern; comparing the two patterns; and determining that the functional eFuses will not blow successfully if the patterns do not match.

Abstract: A security tag adapted for use with a radiofrequency identification (RFID) system, includes: circuitry for at least one of transmitting and receiving an RFID signal, at least one one-time-programmable-read-only-memory (OTPROM) and at least one fuse (eFUSE) coupled to the OTPROM; wherein the circuitry is adapted for communication with the OTPROM and providing instructions for at least one of selectively reading the at least one fuse and selectively blowing the at least one fuse.

Abstract: A monitor bank consists of test one time programmable memory that is programmed distinctively from functional one time programmable memory in order to determine whether the functional one time programmable memory has or will program successfully. In a specific embodiment, each monitor bank consists of a first eFuse configured to expectedly never blow, a second eFuse configured to expectedly always blow, and at least a third eFuse configured to be more difficult to blow than the first eFuse, but easier to blow than the second eFuse. The method of determining whether functional eFuses have or will be programmed successfully is described: programming a monitor bank; sensing whether the test eFuses have blown; creating a monitor bank bit line blow pattern; determining an anticipated bit line blow pattern; comparing the two patterns; and determining that the functional eFuses will not blow successfully if the patterns do not match.

Abstract: In a multithreaded processor, a method and an apparatus to selectively disable one or more threads is disclosed. As multithreading is increasingly becoming the normative paradigm of computer architecture, there still may instances which warrant disabling a thread, such as using operating systems not coded for the specific number of threads, having defective registers/arrays peculiar to a thread, certain kinds of testing procedures. Thus a method is disclosed to test the function of each thread separately and discern if any threads have defective register/arrays. If so or for other reasons, a method and apparatus are disclosed to selectively disable access to the registers/arrays peculiar to the thread. Features of the invention allow the disablement of individual storage elements in multithreaded registers/arrays or to disable access to hardware registers or individual bits in hardware registers associated with the failed thread.

Abstract: A method, apparatus, and a program product to protect against thread loss in a multithreaded computer processor. The processor may experience the failure of one or more threads; in accordance with the invention, a functional test can be run to determine which thread is experiencing the failure. If the thread failure results the failure of a register/array that is uniquely associated with the thread, then the invention will disable access to those register/arrays. Each thread may have its own set of register/arrays or it may be uniquely assigned to one of a plurality of storage elements in a multithreaded register/array. Using this invention, a processor may continue processing other threads and the instructions and data associated with the disabled or defective thread can be rerouted.