Abstract: A system tests a device under test (DUT) that includes an antenna. The system includes a probe antenna, a network emulator, and a near-field antenna. The probe antenna measures beam characteristics of a beam-locked beam emitted over the air by the antenna of the DUT as the DUT is moved relative to the probe antenna during testing of the DUT. The network emulator emulates a base station of a communications network in communications with the DUT. The near-field antenna maintains a call link between the network emulator and the DUT using surface waves between the near-field antenna and the DUT as the DUT is moved relative to the probe antenna.

Abstract: A reward card platform includes a database storing funding accounts, reward card purchase transactions, reward card brand options, and denomination options. The platform provides a user interface for purchasing reward cards from multiple third party suppliers. The user interface commits reward card purchase transactions using the funding accounts and specified reward card brand and denomination options. The platform obtains reward card items from supplier APIs corresponding to specified reward card brand and denomination options. The platform includes a buffer storing reward card inventory items.

Abstract: A device for detecting and selectively reflecting an incident microwave signal or millimeter-wave signal is disclosed. The device includes a plurality of antennae disposed in an array; and a diode disposed at each input of each antenna, each diode having an input adapted to selectively receive a reverse bias signal, or a zero bias signal, or a forward bias signal. The device also includes a switching device connected to each input, and configured to selectively apply the forward bias signal, or the reverse bias signal or the zero bias signal to each of the diodes. In forward bias, each of the plurality of antennae reflects the incident microwave signal or millimeter wave signal; and in zero bias or reverse bias each of the plurality of antennae detects the incident microwave signal or millimeter wave signal.

Abstract: A device for detecting and selectively reflecting an incident microwave signal or millimeter-wave signal is disclosed. The device includes a plurality of antennae disposed in an array; and a diode disposed at each input of each antenna, each diode having an input adapted to selectively receive a reverse bias signal, or a zero bias signal, or a forward bias signal. The device also includes a switching device connected to each input, and configured to selectively apply the forward bias signal, or the reverse bias signal or the zero bias signal to each of the diodes. In forward bias, each of the plurality of antennae reflects the incident microwave signal or millimeter wave signal; and in zero bias or reverse bias each of the plurality of antennae detects the incident microwave signal or millimeter wave signal.

Abstract: A device for selectively reflecting an incident microwave signal or millimeter-wave signal includes multiple antennae disposed in an array. Each antenna has an input adapted to selectively receive a forward bias signal or a zero bias signal. The device also includes a diode disposed at each input of each antenna. The device also includes a switching device connected to each input, and configured to selectively apply a forward bias or zero bias to each of the diodes. In forward bias, each of the antennae detects the incident microwave signal or millimeter wave signal, and in zero bias, each of the antennae reflects the incident microwave signal or millimeter wave signal.

Abstract: A device for detecting and selectively reflecting an incident microwave signal or millimeter-wave signal is disclosed. The device includes a plurality of antennae disposed in an array; and a diode disposed at each input of each antenna, each diode having an input adapted to selectively receive a reverse bias signal, or a zero bias signal, or a forward bias signal. The device also includes a switching device connected to each input, and configured to selectively apply the forward bias signal, or the reverse bias signal or the zero bias signal to each of the diodes. In forward bias, each of the plurality of antennae reflects the incident microwave signal or millimeter wave signal; and in zero bias or reverse bias each of the plurality of antennae detects the incident microwave signal or millimeter wave signal.

Abstract: A method of testing vehicular radar includes acquiring binary phase codes of transmitters in a radar DUT; acquiring desired FOVs and desired angular resolutions of the transmitters to determine target angles of emulated targets; calculating far field phases of a PMCW signal for binary phase states of the transmit array at each of the target angles to determine resultant phase symbol streams; calculating excess roundtrip time delay for each emulation delay, between the DUT and the emulated targets, and each setup delay between the DUT and each emulator receiver; time-shifting the resultant phase symbol streams by the excess roundtrip time delays; subtracting the time-shifted resultant phase symbol streams from the resultant phase symbol streams to obtain difference phase symbol streams; modulating a PMCW signal transmitted by the DUT by the difference phase symbol streams; and emulating the echo signals at the target angles in response to the modulated PMCW signal.

Abstract: A system for testing vehicular radar is described. The system include a diffractive optical element (DOE) configured to diffract electromagnetic waves incident on a first side from a radar device under test (DUT). The system also includes a re-illumination element adapted to receive the electromagnetic waves diffracted from the DOE from a second side. The re-illumination element being adapted to transmit apparent angle of arrival (AoA) electromagnetic waves back to the DOE.

Abstract: A device for selectively reflecting an incident microwave signal or millimeter-wave signal includes multiple antennae disposed in an array. Each antenna has an input adapted to selectively receive a forward bias signal or a zero bias signal. The device also includes a diode disposed at each input of each antenna. The device also includes a switching device connected to each input, and configured to selectively apply a forward bias or zero bias to each of the diodes. In forward bias, each of the antennae detects the incident microwave signal or millimeter wave signal, and in zero bias, each of the antennae reflects the incident microwave signal or millimeter wave signal.

Abstract: An electrical connector configured to electrically couple a signal transmission line to another signal transmission line is disclosed. The electrical connector comprises: a first electrical conductor disposed around a center axis, the first electrical conductor having a taper along its length, wherein the first electrical conductor is substantially azimuthally symmetric around the center axis; a second electrical conductor disposed around the center axis, the second electrical conductor having the taper along its length, the second electrical conductor being substantially azimuthally symmetric around the center axis; a dielectric region comprising a gas, and disposed between the first electrical conductor and the second electrical conductor, the dielectric region having the taper along its length; and a dielectric element disposed in the dielectric region between the first and second electrical conductors, the dielectric element being substantially azimuthally symmetric around the center axis.

Abstract: The present disclosure relates to compositions comprising Gilsonite in a concentrated liquid form, and methods for producing the concentrated liquid Gilsonite. The composition can include Gilsonite in vegetable oils, paraffinic oils, naphthenic oils, and combinations thereof.

Abstract: A system for testing a DUT having an AAS transceiver. The system includes a scanning array divided into first and partial scanning arrays including first and second probe antennas, respectively, the first partial scanning array determining a first portion and the second partial scanning array determining a second portion of a near field pattern of the DUT. A test transceiver receives an RF signal from the DUT via the scanning array while testing the DUT in a transmit mode. A processing unit selects a first reference probe antenna from the first probe antennas and a second reference probe antenna from the second probe antennas to provide reference signals, and to alternate between consecutively scanning first signals from the first probe antennas and comparing them to the second reference signal, and consecutively scanning second signals from the second probe antennas and comparing them to the first reference signal.

Abstract: A system for testing a DUT having an AAS transceiver. The system includes a scanning array divided into first and partial scanning arrays including first and second probe antennas, respectively, the first partial scanning array determining a first portion and the second partial scanning array determining a second portion of a near field pattern of the DUT. A test transceiver receives an RF signal from the DUT via the scanning array while testing the DUT in a transmit mode. A processing unit selects a first reference probe antenna from the first probe antennas and a second reference probe antenna from the second probe antennas to provide reference signals, and to alternate between consecutively scanning first signals from the first probe antennas and comparing them to the second reference signal, and consecutively scanning second signals from the second probe antennas and comparing them to the first reference signal.

Abstract: A coaxial transmission line, e.g. a coaxial cable, includes an inner electrical conductor, an outer electrical conductor, a dielectric region between the inner electrical conductor and the outer electrical conductor, and an electrically thin resistive layer within the dielectric region and concentric with the inner electrical conductor and the outer electrical conductor. The electrically thin resistive layer is a resistive layer configured to be transparent to a subtantially transverse-electromagnetic (TEM) mode of transmission, while absorbing higher order modes of transmission.

Abstract: An optical modulator that is adapted to modulate a light signal at very high RF frequencies and provide the modulating RF signal to equipment separate from the modulator is disclosed. The modulator includes a Mach-Zehnder Modulator in which light loses due to the crossing of the RF waveguide conductors and the optical waveguides are reduced. In addition, problems arising from asynchrony between the RF signals and the optical signals are reduced. The modulator also reduces signal losses due to resonances in the modulator. The modulator can be configured to be used in test probes that require a compact configuration that is adapted to designs having multiple test probes that are proximate to each other.

Abstract: A test system for testing a DUT includes a first array of probe elements located in the near field of the DUT antenna that is either mechanically translated or electrically scanned in a first direction while being electrically scanned in a second direction that is different from the first direction to sense a bounded radiation surface comprising RF signals transmitted by the DUT antenna. A test system receiver receives first near field values contained in the RF signals and inputs them to processing logic of the test system. A reference measurement apparatus of the test system detects the RF signals and obtains reference information therefrom. Processing logic of the test system uses the reference information to correct near field phase values contained in or derived from the first near field values for phase shift between the local oscillator (LO) of the DUT and the LO of the test system.

Abstract: A signal transmission line includes: a first electrical conductor; a second electrical conductor; a dielectric region between the first electrical conductor and the second electrical conductor; and an electrically thin resistive layer disposed within the dielectric region and disposed between the first electrical conductor and the second electrical conductor. A gap exists in the electrically thin resistive layer.

Abstract: A method determines far field EVM of a DUT using over-the-air (OTA) testing, the DUT having a transmitter/receiver and an antenna that are integrated together such that there is no connection port for interfacing a test system for directly measuring the EVM. Modulated RF signals transmitted by the DUT propagate OTA via the antenna. The method includes performing a near field scan of a bounded radiation surface, which includes measurement points at which waveforms of a repeatedly transmitted modulated RF signal are measured; downconverting the waveforms to intermediate frequency (IF), and digitizing the IF waveforms; synthesizing digital waveforms corresponding to the IF waveforms; accounting for corresponding RF propagation in the far field for the digital waveforms; providing a modulated digital IF waveform using the digital waveforms for which RF propagation has been accounted; and calculating EVM of the DUT in the far field using the modulated digital IF waveform.

Abstract: A test system for testing a DUT includes near field and intermediate field measurement devices located in a near field and an intermediate field, respectively, of the DUT antenna that sample first and second bounded radiation surfaces, respectively, comprising RF signals emitted by the DUT antenna in at least first and second directions in which the bounded radiation surfaces extend. A receiver of the test system generates first and second matrices of near field and intermediate field values, respectively, from the samples obtained by the near field and intermediate field measurement devices, respectively and inputs them to processing logic of the test system. The processing logic processes the first and second matrices of near field and intermediate field values, respectively, and derives a third matrix of near field phase values therefrom.

Abstract: A coaxial transmission line, e.g. a coaxial cable, includes an inner electrical conductor, an outer electrical conductor, a dielectric region between the inner electrical conductor and the outer electrical conductor, and an electrically thin resistive layer within the dielectric region and concentric with the inner electrical conductor and the outer electrical conductor. The electrically thin resistive layer is a resistive layer configured to be transparent to a substantially transverse-electromagnetic (TEM) mode of transmission, while absorbing higher order modes of transmission.