Abstract: The invention relates to a capacitive microsystem, which can be used to replace conventional strain gauges used currently. The microsystem has substantial advantages with regard to handling, overload stability and endurance. Capacitive microsystems of this type can be used to record deformations and to calculate forces, torque etc. They can be used in particular to determine the weight of vehicle seats, to provide for example deployment data for an airbag.

Abstract: A confocal imaging system is equipped with a retroreflector, which oscillates with a high frequency, for increasing the data rate during the recording of distance values. A mirror system having a small mass is provided that, by use of an electrostatic drive, makes extremely rapid focusing movements or height detections possible in the case of a small mass. The mirror system includes two separate micromechanically produced mirrors, which are set at 90° to one another and which synchronously oscillate in the direction of the optical axis of the confocal imaging system.

Abstract: The present invention is based on an use of the already existing actuator bottom as a deformation element for a direct measurement of braking force, and on its geometric configuration in order to measure a force in a way which is largely independent of temperature and free of hysteresis. Accordingly, a force sensor is integrated into an actuator for generally or transmitting a force in the force flux. The actuator bottom is transverse to the force flux.

Abstract: The inventive confocal imaging system is equipped with a retroreflector, which oscillates with a high frequency, for increasing the data rate during the recording of distance values. A mirror system having a small mass is provided that, by means of an electrostatic drive, makes extremely rapid focussing movements or height detections possible in the case of a small mass. The mirror system is comprised of two separate micromechanically produced mirrors, which are set at 90° to one another and which synchronously oscillate in the direction of the optical axis of the confocal imaging system.

Abstract: In a spatially resolving range-finding system, an object is illuminated in a pixelwise fashion by illuminating beams emanating from an array of light sources with returned imaging beams striking a corresponding array of solid state receiving elements. The particular arrangement of the light sources and the receiving elements may be varied. The laser light sources and receiving elements may be selectively operated such that one light source may illuminate one or more receiving elements or several light sources may illuminate a single receiving element. The light sources are driven serially, allowing limits of laser protection regulations to be reliably complied with. An advantage is a substantially better signal quality at the receiving elements.

Abstract: Surface shape determination and an exact speed measurement of a moving object is undertaken with an arrangement including semiconductor elements and having two spaced semiconductor sensor lines. Illumination of the moving object occurs via at least one laser diode that is arranged in the proximity of the semiconductor sensor lines. The semiconductor sensor lines are used to perform a registration of cross-sectional profiles by integrating a number of range vectors calculated from sensed reflected light pulses at times when the moving object is not present and present. Successively registered cross-sectional profiles of a vehicle are converted into cross-sectional areas and into longitudinal profiles. The speed can be identified on the basis of the time-offset between identical registration in the first and second semiconductor sensor lines.

Abstract: The invention relates to a capacitive microsystem, which can be used to replace conventional strain gauges used currently. The microsystem has substantial advantages with regard to handling, overload stability and endurance. Capacitive microsystems of this type can be used to record deformations and to calculate forces, torque etc. They can be used in particular to determine the weight of vehicle seats, to provide for example deployment data for an airbag.

Abstract: In order to precisely and unambiguously measure braking forces, measurements must be carried out as close as possible to the location where the force is directly introduced onto the brake lining (18). To this end, the invention provides that the deflection &Dgr;Z of the actuator bottom (2) is used as a measured variable for the braking force and that the actuator bottom is correspondingly designed for this purpose. The supporting ring (3) of the actuator (1) rests in an annular manner on the brake lining (18). The braking force (F) is centrically applied to the actuator bottom (2). Various measures are taken in order to eliminate, to the greatest possible extent, the influences of temperature and hysteresis effects as the braking force (F) is converted into a proportional deformation &Dgr;Z.

Abstract: The principle of the invention is based on the combination of the following elements: an object 7 is illuminated in a pixelwise fashion by illuminating beams 5 emanating from light sources 1, imaging beams 6 striking receiving elements 2. The arrangement of the light sources 1 and the receiving elements 2 is corresponding, and the pixel access in the solid state image sensor is optional. The light sources 1 are driven serially, limits of laser protection regulations thereby being reliably complied with. An advantage is a substantially better signal quality at the receiving elements 2.

Abstract: A solder testing apparatus comprising image processing means for performing image processing on an image of an appearance of a soldered portion to identify shape characterizing amounts for the soldered portion; and defect determining means for performing good/bad determination on the soldered portion from data derived by the image processing means and data from test parameter storing means for storing shape characterizing amounts at design time, wherein tested-object standard shape estimating means is included for extracting shape characterizing amounts of a non-defective soldered portion by statistically processing shape characterizing amounts for soldered portions identified by the image processing means, and defect determining parameters stored in the test parameter storing means are updated based on standard shape values from the tested-object standard shape estimating means, so that a highly reliable test is realized by setting defect determining parameters based on actual shapes and dimensions of leads

Abstract: The stopping of a load suspended from a crane requires a swing control or, respectively, a swing damping. Upon employment of microwave measuring units, spacings between a carrying cable suspension and a load suspension point are determined on the basis of transit time measurements. The position of the load suspension point can be determined from the transit time measurements quickly and with high precision. Swinging motions are avoided by controlled opposing control of the carrying cable suspension.

Abstract: The stopping of a load suspended from a crane requires a swing control or, respectively, a swing damping. Upon employment of microwave measuring units, spacings between a carrying cable suspension and a load suspension point are determined on the basis of transit time measurements. The position of the load suspension point can be determined from the transit time measurements quickly and with high precision. Swinging motions are avoided by controlled opposing control of the carrying cable suspension.

Abstract: Testing techniques for three-dimensional testing of printed circuit boards overcome the disadvantages that presently exist such as, for example, too little height resolution, low processing speed and difficult manipulation. The testing in the microscopic domain occurs within unaltering, displaceable evaluation windows on the basis of the calculation of cross-sectional areas at each scan point on a printed circuit board. Microscopic testing occurs on the basis of the calculation of defined, simple geometric values within a scan field and by following comparisons to reference values. The arrangement for the implementation of the methods utilize a laser scanner for triangulation, an evaluation unit, and at least one high-resolution, position-sensitive detector.

Abstract: Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the number of required leads and switch elements can be drastically reduced. In the present apparatus, every measuring locations of the printed circuit board can be selected by an associated busbar and by an intermediate mask that prevents the contacting of non-selected measuring locations. The busbars preferably are orientated transversely relative to the principal direction of the wiring of the printed circuit board. The bus bar interconnecting a number of elements, each of the contact elements being a test probe.

Abstract: A drive device for an apparatus for electrical function testing of wiring matrices, which has optimally simple electrode shapes for the purpose of a further miniaturization with a two-electrode arrangement. For testing printed circuit boards a non-touching plasma contacting is used whereby two respectively selected measuring locations of a wiring matrix can be contacted via allocated discharge channels and their electrodes. The drive of the measuring locations (test points) occurs via control gas discharges that are generated by applying an adequately high voltage between the electrodes. By applying a voltage between the gas discharges, a current conduction that can be evaluated for test purposes is generated for a conductive connection between the test points.

Abstract: A sensor for measuring the torque acting on a rotating shaft has two electrode structures which are respectively mechanically coupled to two axially spaced points on the shaft to be measured so that a relative movement between the two electrode structures occurs due to the torque. The electrode structures each have a number of parallel, spaced electrodes and are asymmetrically mounted in a plane so that a number of capacitors are formed by electrode pairs each having an electrode from each electrode structure. Because of the asymmetrical arrangement, the electrodes in a pair are spaced a relatively large distance away from the next closest electrode, so that a capacitive decoupling between the pairs is achieved. Changes in the spacing between the points on the shaft due to torsion of the shaft caused by the torque will change the spacing between the electrodes in each pair, thereby resulting in a total capacitance change which is proportional to the torque.

Abstract: Measurement sensor for length or distance changes, particularly for non-contacting measurement of torques of rotating shafts. In known measurement sensors, the length or distance change (.DELTA.x) is amplified by a mechanical lever system and is then converted into an electrical quantity. In the novel measurement sensor of the present invention, the length or distance change (.DELTA.x) to be measured is transmitted to a displacer in order to enhance the precision. A displaced liquid, particularly mercury, is introduced into a capillary and the length of a liquid column in the capillary is converted into an electrical quantity, preferably as a change of a resistor. The new measurement sensor is particularly suitable for torque measurement.

Abstract: A selection device for reliable selection of a plurality of lines or of a plurality of contact locations. In order to select at least two of a plurality of lines, at least two selection lines are connected to every line via a photoresistor, whereby every photoresistor is preferably controllably chargeable with light via a deflectable beam. The selection occurs when selected photoresistors are changed to a low resistance state by light impingement. For selecting at least two of a plurality of contact locations arranged in a grid pattern, the contact locations are connected to the lines via photoresistors. The device of the present invention is preferably utilized for the electrical function testing of printed circuit boards.

Abstract: Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the number of required leads and switch elements can be drastically reduced. In the present apparatus, every measuring locations of the printed circuit board can be selected by an associated busbar and by an intermediate mask that prevents the contacting of non-selected measuring locations. The busbars preferably are orientated transversely relative to the principal direction of the wiring of the printed circuit board.

Abstract: A device for the electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the contacting of selected measuring locations results via gas discharging channels. The plurality of leads required for the selection of the individual measuring locations is drastically reduced. In the new device, every gas discharge channel is selectable by an associated busbar and by the controllable charging with light of a photoconductor arranged between the gas discharge channel and the associated busbar.