Abstract: Certain embodiments pertain to Multiplexed Fourier Ptychographic imaging systems and methods. In one example, the Multiplexed Fourier Ptychographic imaging system includes an LED array configured to illuminate a sequence of LED patterns for illuminating a sample being imaged. The system includes LED circuitry configured to independently control power to turn on multiple LEDs simultaneously in each LED pattern of the array. The system has a light detector that acquires a first set of lower resolution images of the sample each image acquired during exposure time during illumination by a unique LED pattern. The system uses the first set of lower resolution images to generate a second set of lower resolution images associated with each LED in the LED array and iteratively updates overlapping regions in the Fourier domain with the second set of lower resolution images to generate a higher resolution image.

Abstract: In one aspect, the present disclosure provides a system for Fourier ptychographic microscopy, the system comprising (i) an image capture apparatus including an objective lens, (ii) at least one processor, and (iii) data storage including program instructions stored thereon that when executed by the at least one processor, cause the system to: (a) capture, via the image capture apparatus, a plurality of initial images of an object, wherein each of the plurality of initial images of the object have a first resolution, and (b) process each of the plurality of initial images in Fourier space to generate a final image of the object having a second resolution, wherein the second resolution is greater than the first resolution.

Abstract: Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods that implement an embedded pupil function recovery

Abstract: A surface wave assisted system having an aperture layer with a surface and an aperture, and a plurality of grooves around the aperture. The plurality of grooves is configured to generate an optical transfer function at the aperture by inducing a surface wave for interfering with transmission of light of a range of spatial frequency.

Abstract: Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.

Abstract: Certain aspects pertain to aperture-scanning Fourier ptychographic imaging devices comprising an aperture scanner that can generate an aperture at different locations at an intermediate plane of an optical arrangement, and a detector that can acquire lower resolution intensity images for different aperture locations, and wherein a higher resolution complex image may be constructed by iteratively updating regions in Fourier space with the acquired lower resolution images.

Abstract: A Talbot-illuminated imaging system for focal plane tuning, the device comprising a Talbot element, a tunable illumination source, a scanning mechanism, a light detector, and a processor. The element generate san array of focused light spots at a focal plane. The tunable illumination source shifts the focal plane to a plane of interest by adjusting a wavelength of light incident the Talbot element. The scanning mechanism scans an object across an array of focused light spots in a scanning direction. The light detector determines time-varying light data associated with the array of focused light spots as the object scans across the array of light spots. The processor constructs an image of the object based on the time-varying data.

Abstract: A light-field pixel for detecting a wavefront, the light-field pixel comprises an aperture layer, a light detector layer, and a processor. The aperture layer has a non-conventional aperture and a non-conventional aperture. The non-conventional aperture has a higher gradient of transmission at normal incidence than the conventional aperture. The light detector is configured to measure a first intensity of light through the non-conventional aperture and a second intensity of light through the conventional aperture. The processor is configured to detect the wavefront based on the first intensity normalized by the second intensity.

Abstract: Methods of rapid distinction between growing cells and debris, which determine a time-lapse movie of specimen images, track features of each entity, and categorize each entity as growing cells or debris.

Abstract: Methods, systems, and devices of Fourier ptychographic X-ray imaging by capturing a plurality of variably-illuminated, low-resolution intensity X-ray images of a specimen and computationally reconstructing a high-resolution X-ray image of the specimen by iteratively updating overlapping regions in Fourier space with the variably-illuminated, low-resolution intensity X-ray images.

Abstract: Systems, devices, and methods of Fourier ptychographic imaging by computationally reconstructing a high-resolution image by iteratively updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Abstract: A Talbot-illuminated imaging system for focal plane tuning, the device comprising a Talbot element, a tunable illumination source, a scanning mechanism, a light detector, and a processor. The element generate san array of focused light spots at a focal plane. The tunable illumination source shifts the focal plane to a plane of interest by adjusting a wavelength of light incident the Talbot element. The scanning mechanism scans an object across an array of focused light spots in a scanning direction. The light detector determines time-varying light data associated with the array of focused light spots as the object scans across the array of light spots. The processor constructs an image of the object based on the time-varying data.

Abstract: A surface wave assisted system having an aperture layer with a surface and an aperture, and a plurality of grooves around the aperture. The plurality of grooves is configured to generate an optical transfer function at the aperture by inducing a surface wave for interfering with transmission of light of a range of spatial frequency.

Abstract: An e-Petri dish comprising a transparent layer having a specimen surface and a light detector configured to sample a sequence of sub-pixel shifted projection images of a specimen located on the specimen surface. The sub-pixel shifted projection images associated with light from a plurality of illumination angles provided by an illumination source.

Abstract: A light guided pixel having a guide layer and a light detector layer. The guide layer has a light guide. The light detector layer has a light detecting element that receives light channeled by the light guide. The light guide may include a filter for channeling emissions to the light detecting element.

Abstract: A light-field pixel for detecting a wavefront, the light-field pixel comprises an aperture layer, a light detector layer, and a processor. The aperture layer has a non-conventional aperture and a non-conventional aperture. The non-conventional aperture has a higher gradient of transmission at normal incidence than the conventional aperture. The light detector is configured to measure a first intensity of light through the non-conventional aperture and a second intensity of light through the conventional aperture. The processor is configured to detect the wavefront based on the first intensity normalized by the second intensity.

Abstract: Embodiments of the present invention relate to a surface wave enabled darkfield aperture structure comprising an aperture layer, a aperture in the aperture layer and a plurality of grooves around the aperture. The aperture layer has a first and second surface. The plurality of grooves is in the first surface. A surface wave propagates along at least the first surface. The plurality of grooves is configured to generate a darkfield at the aperture by modifying the surface wave to cancel out direct transmission of a uniform incident light field received by the aperture.

Abstract: A scanning projective lensless microscope device comprises a specimen surface, a scanning illumination source with a light element, a light detector outside the specimen surface, and a processor. The scanning illumination source scans the light element to a plurality of scanning locations to provide illumination to an object on the specimen surface. The light detector samples a sequence of sub-pixel shifted projection object images corresponding to the plurality of scanning locations. The processor constructs a high resolution image of the object based on the sequence of sub-pixel shifted projection images and a motion vector of the projections at a plane of interest.

Abstract: A super resolution optofluidic microscope device comprises a body defining a fluid channel having a longitudinal axis and includes a surface layer proximal the fluid channel. The surface layer has a two-dimensional light detector array configured to receive light passing through the fluid channel and sample a sequence of subpixel shifted projection frames as an object moves through the fluid channel. The super resolution optofluidic microscope device further comprises a processor in electronic communication with the two-dimensional light detector array. The processor is configured to generate a high resolution image of the object using a super resolution algorithm, and based on the sequence of subpixel shifted projection frames and a motion vector of the object.

Abstract: Embodiments of the present invention relate to a surface wave enabled darkfield aperture structure comprising an aperture layer, a aperture in the aperture layer and a plurality of grooves around the aperture. The aperture layer has a first and second surface. The plurality of grooves is in the first surface. A surface wave propagates along at least the first surface. The plurality of grooves is configured to generate a darkfield at the aperture by modifying the surface wave to cancel out direct transmission of a uniform incident light field received by the aperture.