Abstract: Techniques efficiently improve an integrated circuit design by simultaneously analyzing timing paths of the circuit design. A design management component can access data relating to the integrated circuit design from a design database. The design management component can perform a static timing analysis of the integrated circuit design and generate a timing path distribution, filtered analytics, and/or a probability density function associated with the integrated circuit design, wherein all of the timing paths of the integrated circuit design can be evaluated. The design management component can determine a modification to make to a cell, device, interconnection between cells or devices, or another element(s) of the integrated circuit design, based at least in part on the static timing analysis, the timing path distribution, the filtered analytics, and/or the probability density function, to generate a modified integrated circuit design, in accordance with defined design criteria.

Abstract: Various aspects provide for detecting voltage droops. For example, a system can include a voltage calibrator component and a comparator component. The voltage calibrator component can convert a first supply voltage associated with a power distribution network of an integrated circuit to a second supply voltage via a resistance ladder circuit. The comparator component can generate a comparison output signal in response to a determination that a comparison between the second supply voltage and a reference voltage satisfies a defined criterion.

Abstract: A self-referenced on-die voltage droop detector generates a reference voltage from the supply voltage of an integrated circuit's power distribution network, and compares this reference voltage to the transient supply voltage in order to detect voltage droops. The detector responds to detected occurrences of voltage droop with low latency by virtue of being located on-die. Also, by generating the reference voltage from the integrated circuit's power domain rather than using a separate reference voltage source, the detector does not introduce noise and distortion associated with a separate power domain.

Abstract: Techniques efficiently improve an integrated circuit design by simultaneously analyzing timing paths of the circuit design. A design management component can access data relating to the integrated circuit design from a design database. The design management component can perform a static timing analysis of the integrated circuit design and generate a timing path distribution, filtered analytics, and/or a probability density function associated with the integrated circuit design, wherein all of the timing paths of the integrated circuit design can be evaluated. The design management component can determine a modification to make to a cell, device, interconnection between cells or devices, or another element(s) of the integrated circuit design, based at least in part on the static timing analysis, the timing path distribution, the filtered analytics, and/or the probability density function, to generate a modified integrated circuit design, in accordance with defined design criteria.

Abstract: A self-referenced on-die voltage droop detector generates a reference voltage from the supply voltage of an integrated circuit's power distribution network, and compares this reference voltage to the transient supply voltage in order to detect voltage droops. The detector responds to detected occurrences of voltage droop with low latency by virtue of being located on-die. Also, by generating the reference voltage from the integrated circuit's power domain rather than using a separate reference voltage source, the detector does not introduce noise and distortion associated with a separate power domain.

Abstract: Various aspects provide a high frequency voltage supply monitor capable of monitoring high frequency variations of the voltage supply inside a microelectronic circuit substantially in real time. The voltage supply monitor can comprise a differential amplifier circuit having a substantially constant gain over a wide bandwidth, allowing the supply voltage variations to be amplified according to a known gain under a wide range of conditions. The amplified signal can then be sent to an output port for monitoring and measurement by an external display device.

Abstract: Various aspects provide a high frequency voltage supply monitor capable of monitoring high frequency variations of the voltage supply inside a microelectronic circuit substantially in real time. The voltage supply monitor can comprise a differential amplifier circuit having a substantially constant gain over a wide bandwidth, allowing the supply voltage variations to be amplified according to a known gain under a wide range of conditions. The amplified signal can then be sent to an output port for monitoring and measurement by an external display device.

Abstract: A latch device is provided with a driver and a shadow latch. The driver has an input to accept a binary driver input signal, an input to accept a clock signal, and an input to accept a shadow-Q signal. The driver has an output to supply a binary Q signal equal to the inverse of the driver input signal, in response to the driver input signal, the shadow-Q signal, and the clock signal. The shadow latch has an input to accept the driver input signal, and an input to accept the clock signal. The shadow latch has an output to supply the shadow-Q signal equal to the inverted Q signal, in response to the driver input signal and clock signal.

Abstract: Disclosed herein is a pseudo single-phase flip-flop. The master section includes a pre-dissipation stage and a first keeper. The pre-dissipation stage discharges the first keeper to the mDb second binary value, and selectively charges the first keeper with the mDb first binary value in the master pass mode. The pre-dissipation stage selectively prevents the first keeper from charging to the mDb first binary value in response to one of the clock phases. The slave section includes a pre-charge stage, a second keeper, a post-dissipation stage, and a third keeper. The second keeper maintains a first binary value in a slave pass mode when the mDb signal has a second binary value. The second keeper supports the second binary value in the slave pass mode when the mDb signal has the first binary value. The third keeper maintains the Q signal binary value during the slave hold mode.

Abstract: A latch device is provided with a relay and a shadow latch. The relay has an input to accept a binary relay input signal, an input to accept a clock signal, an input to accept a shadow-Q signal, and an output to supply a binary Q signal value equal to the relay input signal value. The relay output is supplied in response to the relay input signal, the shadow-Q signal, and the clock signal. The shadow latch has an input to accept the relay input signal, an input to accept the clock signal, and an output to supply the shadow-Q signal with a value equal to an inverted Q signal value. The shadow latch output is supplied in response to the relay input signal and clock signal.

Abstract: A hazard-free minimal-latency flip-flop (HFML-FF) is provided. A master latch includes an input to accept a D1 signal, an input to accept a clock signal, an input to accept an inverted shadow-D2 signal, and an output to supply a D2 signal. The master latch has an input to accept a shadow-D1 signal, an input to accept the clock signal, and an output to supply a shadow-D2 signal and the inverted shadow-D2 signal. The slave latch has an input to accept the D2 signal, an input to accept the clock signal, an input to accept an inverted shadow-Q signal, and an output to supply a Q signal. The slave latch has an input to accept either the D2 signal or the shadow-D2 signal, an input to accept the clock signal, and an output to supply a shadow-Q signal and the inverted shadow-Q signal. The design may use clocked inverters or pass gates.

Abstract: A system is provided with a digital complementary-metal-oxide-semiconductor (CMOS) device and a noise cancellation circuit. The CMOS device has a first interface to accept a binary logic input signal, a second interface to accept a source current, a third interface to supply a binary logic output signal, and a fourth interface connected to a first dc voltage (e.g., ground) to sink current. A first resistor is interposed between a second dc voltage (e.g., Vdd), with a potential higher than the first dc voltage, and the second interface of the CMOS device. The noise cancellation circuit has a first interface connected to the second dc voltage. The noise cancellation circuit high pass filters ac noise on the second dc voltage, amplifies the filtered noise, and supplies the amplified noise at a second interface connected to the second interface of the CMOS device.

Abstract: One embodiment provides an integrated circuit including a first circuit, a second circuit, and a third circuit. The first circuit is configured to provide a calibrated signal. The second circuit is configured to low pass filter the calibrated signal and provide a filtered calibrated signal. The third circuit is configured to provide a control signal and store the control signal based on the filtered calibrated signal. The third circuit averages stored controlled signals to provide a calibration result.

Abstract: A voltage controlled oscillator circuit includes first and second power rails, a control voltage rail, an input terminal, and an output terminal. A plurality of domino stages are series connected in a ring, with each of the domino stages being connected across the first and second power rails and being responsive to the control voltage rail. A plurality of feedback paths is provided with each path connected to enable one of the plurality of domino stages to input a feedback output signal to a preceding serially connected domino stage. A reset signal is asserted to place the domino stages in a post charge state and deasserted to allow the domino stages to begin producing an oscillating signal.

Abstract: An electrical idle detection circuit including a full wave rectifier and a first amplifier. The full wave rectifier is configured to receive differential input signals and provide a rectified output signal based on the differential input signals. The first amplifier is configured to receive a first input signal based on the rectified output signal and a second input signal based on a reference signal. The first amplifier is configured to provide an output signal that indicates the differential input signals are one of active and in electrical idle based on the first input signal and the second input signal.

Abstract: A data sampler including a first stage and a second stage. The first stage is configured to receive differential signals and provide a first edge rate in a first output signal and a second edge rate in a second output signal based on the differential signals. The second stage is configured to amplify the difference between the first output signal and the second output signal to provide regenerated output signals. The second stage provides a third edge rate in a first internal signal and a fourth edge rate in a second internal signal based on the first edge rate and the second edge rate.

Abstract: A clock data recovery circuit includes a first circuit, a second circuit, and a third circuit. The first circuit is configured to receive data and a clock signal and to detect transitions in the data and provide a first signal based on the clock signal and the transitions in the data. The second circuit is configured to receive the first signal and provide a first shift signal based on the first signal. The third circuit is configured to receive the first shift signal, wherein the first circuit, the second circuit, and the third circuit are configured to form a first circuit loop and the third circuit is configured to disable the first circuit loop and shift the clock signal based on the first shift signal.

Abstract: One embodiment provides an integrated circuit including a first circuit and a second circuit. The first circuit is configured to obtain a sample of a first clock via a second clock and provide a selected clock from multiple clocks based on the sample. The second circuit is configured to provide a first pointer clock based on the first clock and a second pointer clock based on the selected clock. An edge of the second pointer clock relative to an edge of the first pointer clock is limited to an uncertainty range of within one-half a first pointer clock cycle.

Abstract: One embodiment provides an integrated circuit including an input stage and an impedance. The input stage is configured to receive a single-ended input signal and provide a differential output signal. The impedance is configured to receive the single-ended input signal and provide compensation to the input stage to provide symmetrical differential signals in the differential output signal.

Abstract: One embodiment provides an integrated circuit including a first circuit, a second circuit, and a third circuit. The first circuit is configured to provide a calibrated signal. The second circuit is configured to low pass filter the calibrated signal and provide a filtered calibrated signal. The third circuit is configured to provide a control signal and store the control signal based on the filtered calibrated signal. The third circuit averages stored controlled signals to provide a calibration result.