Abstract: A system (IPS) and related method for image processing, in particular dark-field or phase contrast imaging to reduce motion artifacts. The system comprises an input interface (IN) for receiving a series of projection images (?) acquired by an X-ray imaging apparatus (XI) of an object (OB) for a given projection direction, the imaging apparatus (XI) configured for phase-contrast and/or dark-field imaging A phase-contrast and/or dark-field image generator (IGEN) applies an image generation algorithm to compute a first image based on the series the projection images (?). A motion artifact detector (MD) detects a motion artifact in the first image. A combiner (?) combines, if a motion artifact is so detected, a part of the first image with a part of at least one auxiliary image to obtain a combined image. The auxiliary image was previously computed by a gated application of the image generation algorithm in respect of a subset of the series of the projection images (?).

Abstract: An X-ray imaging detector (102) is proposed, wherein the X-ray imaging detector comprises an X-ray converter (103) for converting X-ray radiation into electrical charges. The X-ray imaging detector further comprises a detector plate (104) for collecting the electrical charges generated by the X-ray converter and for generating an image. In addition, the X-ray imaging detector comprises a structured plate (105) for modulating the intensity of backscattered X-ray radiation, wherein the structured plate is arranged at a side of the detector plate opposite the side of the X-ray converter. Moreover, the X-ray imaging detector comprises a data processing system, which is configured for mitigating image distortions caused by backscattered X-ray radiation. Thereto, the data processing system uses information about the structured plate.

Abstract: The invention relates to a control module for controlling an x-ray system (140) during the acquisition of step images for phase imaging. The control module comprises a step image quantity providing unit (111) for providing a step image quantity, a detector dose providing unit (112) for providing a target detector dose, an applied detector dose determination unit (113) for determining an applied detector dose absorbed by a part of the detector (144) during the acquisition of a step image, and a step image acquisition control unit (114) for controlling the x-ray imaging system (140) during the acquisition of each step image based on the applied detector dose, the target detector dose and the step image quantity. The control module allows to control the x-ray imaging system such that the target detector dose is not exceeded while at the same time ensuring a sufficient quality of the step images.

Abstract: The invention concerns a storage device for cleaning and charging portable X-ray detectors, and an X-ray system comprising such storage device. The storage device comprises a receiving unit for receiving at least one portable X-ray detector, a cleaning unit for cleaning the portable X-ray detector when being received by the receiving unit, and a charging unit for charging the portable X-ray detector, wherein the cleaning unit is configured for mechanically and/or chemically cleaning the portable X-ray detector. Further, the invention concerns a method of cleaning and charging a portable X-ray detector in a storage device.

Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface.

Abstract: The present invention relates to an apparatus (10) for presentation of dark field information. It is described to provide (210) an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (220). A plurality of sub-regions of the region of interest are defined (230) based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived (240) for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned (250) to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region.

Abstract: Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.

Abstract: The present invention relates to processing X-ray images of an object. In order to improve the accuracy for interactive geometrical measurements, a device (10) for processing of an X-ray image of an object (30) is provided. The device comprises an input unit (12) and a processing unit (14). The input unit is configured to provide a shape related information (16) from an object (30) to be irradiated. The input unit is also configured to provide a generic object model (20), and to provide an actual X-ray image (18) of the object. The processing unit is configured to adapt the generic object model based on the shape related information in order to generate an individual object model (22). The processing unit is also configured to determine, based on the individual object model, an individual image processing modificator (24) for processing at least one part of the X-ray image, and to apply the individual image processing modificator for further processing of the X-ray image.

Abstract: The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.

Abstract: The present invention relates to an X-ray radiograph apparatus (10). It is described to placing (110) an X-ray source (20) relative to an X-ray detector (30) to form an examination region for the accommodation of an object, wherein, a reference spatial coordinate system is defined on the basis of geometry parameters of the X-ray radiography apparatus. A camera (40) is located (120) at a position and orientation to view the examination region. A depth image of the object is acquired (130) with the camera within a camera spatial coordinate system, wherein within the depth image pixel values represent distances for corresponding pixels.

Abstract: An image processing system (IPS) and a related method. The system comprises an input interface (IN) for receiving two or more input images that include respectively an attenuation signal of an imaged object and a dark-field signal of the object. A combiner (COM) is configured to combine the two or more input images in a linear combination operation to form a combined image. An output (OUT) port configured to output the combined image.

Abstract: An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.

Abstract: The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44).

Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.

Abstract: The present invention relates to an apparatus (10) for feature suppression in dark field or phase contrast X-ray imaging. The apparatus comprises an input unit (20), a processing unit (30) and an output unit (40). The input unit is configured to provide the processing unit with an X-ray attenuation image of a region of interest of an object. The input unit is also configured to provide the processing unit with a dark field or phase contrast X-ray image of the region of interest of the object. The processing unit is further configured to identify a first feature in the X-ray attenuation image; to identify a second anatomical feature in the X-ray attenuation image; and to identify the second anatomical feature in the dark field or phase contrast X-ray image. The first feature is an obscuring anatomical feature depicted in the X-ray attenuation image with higher contrast than in the dark field or phase contrast X-ray image.

Abstract: An image processing apparatus (IP) comprising an input port (IN) for receiving projection data through respective 3D locations in an imaging region, said projection date collected in a scan operation by an imaging apparatus (IM). An image segment generator (IGS) of said apparatus (IP) is configured to generate, based on said projection data, a first image segment for said 3D locations. A visualizer (VIZ) configured to effect displaying said first image segment on a display device before or whilst the image apparatus collects projection data for a different 3D location.

Abstract: A calibration method and corresponding object for calibrating an X-ray imaging system with respect to dark field imaging is disclosed. The calibration object (1) generically comprises a plurality of sections (10, 20), wherein at least a part of the sections comprises two different materials, respectively. One material (101, 201) in a corresponding section leads to attenuation of passing X-ray beams and the other material (102, 202) is a dark field active material leading to small-angle scattering signals of incident X-rays. The ratio of the two materials in one section varies from section to section. The calibration object can be used to calibrate an X-ray imaging system with respect to a non-linear behavior of the dark field visibility.

Abstract: An image processing module and related method. The module (IP) comprises—one or more input interfaces (IN) configured for receiving i) a first input image (II) acquired of an object by an imaging apparatus (IM) at a first geometrical configuration of the X-ray imaging apparatus and ii) a specification of a change from said first geometrical configuration to a second geometrical configuration of the imaging apparatus. An upsampler component (US) of the module (IP) computes a new image (I+) of the object (OB) by applying a geometrical transformation to said first input image. The geometrical transformation corresponds to said change in geometrical configuration of the imaging apparatus.

Abstract: The present invention relates to an apparatus for X-ray imaging an object. It is described to provide (20) data relating to the detection of X-rays, wherein an X-ray detector is configured to be positioned relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. An X-ray interferometer arrangement is configured to be positioned relative to the examination region. At least one X-ray dark field factor and at least one transmission factor are determined for the X-ray radiation transmitted through at least part of the object is determined. An intensity of X-ray radiation to be emitted towards the at least part of the object is controlled as a function of the determined at least one dark field factor and the determined at least one transmission factor.

Abstract: The present invention relates to phantom device for a dark field imaging system. Although dark field imaging is known to be sensitive to changes in the micro-structure of the tissue of a human subject that may be caused during a disease progression, there may be a need to quantify information provided by an image of the human subject. A detector signal component representing the dark image may be altered by changes of the X-ray spectrum which passes tissue of the human subject comprising micro-structures. This may be caused due to an attenuation of the X-ray radiation previously provided by an X-ray source, wherein the attenuation may be caused by tissue of the human subject, which covers said micro-structure comprising tissue. In order to provide information in clinical practice regarding the influence of attenuation to the X-ray radiation before it passes the micro-structure issue of the human subject, the phantom device for dark field imaging is proposed.