Patents by Inventor Hanns-Ingo Maack

Hanns-Ingo Maack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11051783
    Abstract: The present invention relates to an X-ray radiograph apparatus (10). It is described to placing (110) an X-ray source (20) relative to an X-ray detector (30) to form an examination region for the accommodation of an object, wherein, a reference spatial coordinate system is defined on the basis of geometry parameters of the X-ray radiography apparatus. A camera (40) is located (120) at a position and orientation to view the examination region. A depth image of the object is acquired (130) with the camera within a camera spatial coordinate system, wherein within the depth image pixel values represent distances for corresponding pixels.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: July 6, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Julien Senegas, Sascha Andreas Jockel, Hanns-Ingo Maack, Martin Bergtholdt
  • Patent number: 11039807
    Abstract: An image processing system (IPS) and a related method. The system comprises an input interface (IN) for receiving two or more input images that include respectively an attenuation signal of an imaged object and a dark-field signal of the object. A combiner (COM) is configured to combine the two or more input images in a linear combination operation to form a combined image. An output (OUT) port configured to output the combined image.
    Type: Grant
    Filed: December 14, 2017
    Date of Patent: June 22, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventor: Hanns-Ingo Maack
  • Publication number: 20210153833
    Abstract: The present invention relates to processing X-ray images of an object. In order to improve the accuracy for interactive geometrical measurements, a device (10) for processing of an X-ray image of an object (30) is provided. The device comprises an input unit (12) and a processing unit (14). The input unit is configured to provide a shape related information (16) from an object (30) to be irradiated. The input unit is also configured to provide a generic object model (20), and to provide an actual X-ray image (18) of the object. The processing unit is configured to adapt the generic object model based on the shape related information in order to generate an individual object model (22). The processing unit is also configured to determine, based on the individual object model, an individual image processing modificator (24) for processing at least one part of the X-ray image, and to apply the individual image processing modificator for further processing of the X-ray image.
    Type: Application
    Filed: May 14, 2018
    Publication date: May 27, 2021
    Inventors: HANNS-INGO MAACK, BERND MENSER, DETLEF MENTRUP
  • Patent number: 10945690
    Abstract: An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.
    Type: Grant
    Filed: June 24, 2016
    Date of Patent: March 16, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Thomas Koehler, Gerhard Martens, Roland Proksa, Hanns-Ingo Maack, Udo Van Stevendaal, Franz Josef Pfeiffer, Peter Benjamin Theodor Noel, Maximilian Von Teuffenbach
  • Patent number: 10918352
    Abstract: The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44).
    Type: Grant
    Filed: July 9, 2018
    Date of Patent: February 16, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventor: Hanns-Ingo Maack
  • Publication number: 20210041582
    Abstract: Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.
    Type: Application
    Filed: January 28, 2019
    Publication date: February 11, 2021
    Inventors: MATTHIAS SIMON, HANNS-INGO MAACK
  • Patent number: 10912532
    Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.
    Type: Grant
    Filed: July 26, 2018
    Date of Patent: February 9, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Thomas Koehler, Hanns-Ingo Maack, Andriy Yaroshenko, Klaus Juergen Engel, Bernd Menser
  • Patent number: 10896485
    Abstract: The present invention relates to an apparatus (10) for feature suppression in dark field or phase contrast X-ray imaging. The apparatus comprises an input unit (20), a processing unit (30) and an output unit (40). The input unit is configured to provide the processing unit with an X-ray attenuation image of a region of interest of an object. The input unit is also configured to provide the processing unit with a dark field or phase contrast X-ray image of the region of interest of the object. The processing unit is further configured to identify a first feature in the X-ray attenuation image; to identify a second anatomical feature in the X-ray attenuation image; and to identify the second anatomical feature in the dark field or phase contrast X-ray image. The first feature is an obscuring anatomical feature depicted in the X-ray attenuation image with higher contrast than in the dark field or phase contrast X-ray image.
    Type: Grant
    Filed: May 4, 2017
    Date of Patent: January 19, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventor: Hanns-Ingo Maack
  • Publication number: 20200383652
    Abstract: The present invention relates to an apparatus (10) for presentation of dark field information. It is described to provide (210) an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (220). A plurality of sub-regions of the region of interest are defined (230) based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived (240) for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned (250) to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region.
    Type: Application
    Filed: November 22, 2018
    Publication date: December 10, 2020
    Inventors: RAFAEL WIEMKER, ANDRIY YAROSHENKO, KARSTEN RINDT, JÖRG SABCZYNSKI, THOMAS KOEHLER, HANNS-INGO MAACK
  • Patent number: 10827986
    Abstract: An image processing apparatus (IP) comprising an input port (IN) for receiving projection data through respective 3D locations in an imaging region, said projection date collected in a scan operation by an imaging apparatus (IM). An image segment generator (IGS) of said apparatus (IP) is configured to generate, based on said projection data, a first image segment for said 3D locations. A visualizer (VIZ) configured to effect displaying said first image segment on a display device before or whilst the image apparatus collects projection data for a different 3D location.
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: November 10, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Klaus Erhard, Frank Bergner, Hanns-Ingo Maack
  • Patent number: 10813618
    Abstract: A calibration method and corresponding object for calibrating an X-ray imaging system with respect to dark field imaging is disclosed. The calibration object (1) generically comprises a plurality of sections (10, 20), wherein at least a part of the sections comprises two different materials, respectively. One material (101, 201) in a corresponding section leads to attenuation of passing X-ray beams and the other material (102, 202) is a dark field active material leading to small-angle scattering signals of incident X-rays. The ratio of the two materials in one section varies from section to section. The calibration object can be used to calibrate an X-ray imaging system with respect to a non-linear behavior of the dark field visibility.
    Type: Grant
    Filed: June 8, 2017
    Date of Patent: October 27, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Hanns-Ingo Maack, Thomas Koehler
  • Publication number: 20200330056
    Abstract: A system and method for indicating a desired target radiation area of a radiation beam from a phase contrast radiology system on a subject comprising a first and second light field generator to project light fields on a subject. Both light fields are decoupled from path of the radiation beam. The overlapping area of both light fields indicates the target radiation area. The light fields do not substantially match a radiation beam path.
    Type: Application
    Filed: October 17, 2018
    Publication date: October 22, 2020
    Inventor: HANNS-INGO MAACK
  • Publication number: 20200305810
    Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface.
    Type: Application
    Filed: December 11, 2018
    Publication date: October 1, 2020
    Inventors: ANDRIY YAROSHENKO, THOMAS KOEHLER, HANNS-INGO MAACK, MATTHIAS TEDERS
  • Patent number: 10789674
    Abstract: An image processing module and related method. The module (IP) comprises—one or more input interfaces (IN) configured for receiving i) a first input image (II) acquired of an object by an imaging apparatus (IM) at a first geometrical configuration of the X-ray imaging apparatus and ii) a specification of a change from said first geometrical configuration to a second geometrical configuration of the imaging apparatus. An upsampler component (US) of the module (IP) computes a new image (I+) of the object (OB) by applying a geometrical transformation to said first input image. The geometrical transformation corresponds to said change in geometrical configuration of the imaging apparatus.
    Type: Grant
    Filed: September 21, 2016
    Date of Patent: September 29, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Hanns-Ingo Maack, Tobias Reusch
  • Patent number: 10779776
    Abstract: The present invention relates to an apparatus for X-ray imaging an object. It is described to provide (20) data relating to the detection of X-rays, wherein an X-ray detector is configured to be positioned relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. An X-ray interferometer arrangement is configured to be positioned relative to the examination region. At least one X-ray dark field factor and at least one transmission factor are determined for the X-ray radiation transmitted through at least part of the object is determined. An intensity of X-ray radiation to be emitted towards the at least part of the object is controlled as a function of the determined at least one dark field factor and the determined at least one transmission factor.
    Type: Grant
    Filed: November 21, 2016
    Date of Patent: September 22, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Thomas Koehler, Hanns-Ingo Maack, Thomas Pralow
  • Publication number: 20200229785
    Abstract: The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44).
    Type: Application
    Filed: July 9, 2018
    Publication date: July 23, 2020
    Inventor: HANNS-INGO MAACK
  • Publication number: 20200205765
    Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.
    Type: Application
    Filed: July 26, 2018
    Publication date: July 2, 2020
    Inventors: THOMAS KOEHLER, HANNS-INGO MAACK, ANDRIY YAROSHENKO, KLAUS JUERGEN ENGEL, BERND MENSER
  • Publication number: 20200187893
    Abstract: The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.
    Type: Application
    Filed: April 17, 2018
    Publication date: June 18, 2020
    Inventors: ANDRIY YAROSHENKO, HANNS-INGO MAACK, THOMAS KOEHLER, FABIO DE MARCO, LUCAS BENEDICT GROMANN, WILLER KONSTANTIN, PETER NOEL
  • Publication number: 20200100757
    Abstract: The present invention relates to an X-ray radiograph apparatus (10). It is described to placing (110) an X-ray source (20) relative to an X-ray detector (30) to form an examination region for the accommodation of an object, wherein, a reference spatial coordinate system is defined on the basis of geometry parameters of the X-ray radiography apparatus. A camera (40) is located (120) at a position and orientation to view the examination region. A depth image of the object is acquired (130) with the camera within a camera spatial coordinate system, wherein within the depth image pixel values represent distances for corresponding pixels.
    Type: Application
    Filed: June 15, 2018
    Publication date: April 2, 2020
    Inventors: JULIEN SENEGAS, SASCHA ANDREAS JOCKEL, HANNS-INGO MAACK, MARTIN BERGTHOLDT
  • Publication number: 20200022668
    Abstract: An image processing system (IPS) and a related method. The system comprises an input interface (IN) for receiving two or more input images that include respectively an attenuation signal of an imaged object and a dark-field signal of the object. A combiner (COM) is configured to combine the two or more input images in a linear combination operation to form a combined image. An output (OUT) port configured to output the combined image.
    Type: Application
    Filed: December 14, 2017
    Publication date: January 23, 2020
    Inventor: HANNS-INGO MAACK