Patents by Inventor Hanns-Ingo Maack
Hanns-Ingo Maack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10945690Abstract: An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.Type: GrantFiled: June 24, 2016Date of Patent: March 16, 2021Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Thomas Koehler, Gerhard Martens, Roland Proksa, Hanns-Ingo Maack, Udo Van Stevendaal, Franz Josef Pfeiffer, Peter Benjamin Theodor Noel, Maximilian Von Teuffenbach
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Patent number: 10918352Abstract: The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44).Type: GrantFiled: July 9, 2018Date of Patent: February 16, 2021Assignee: KONINKLIJKE PHILIPS N.V.Inventor: Hanns-Ingo Maack
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Publication number: 20210041582Abstract: Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.Type: ApplicationFiled: January 28, 2019Publication date: February 11, 2021Inventors: MATTHIAS SIMON, HANNS-INGO MAACK
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Patent number: 10912532Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.Type: GrantFiled: July 26, 2018Date of Patent: February 9, 2021Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Thomas Koehler, Hanns-Ingo Maack, Andriy Yaroshenko, Klaus Juergen Engel, Bernd Menser
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Patent number: 10896485Abstract: The present invention relates to an apparatus (10) for feature suppression in dark field or phase contrast X-ray imaging. The apparatus comprises an input unit (20), a processing unit (30) and an output unit (40). The input unit is configured to provide the processing unit with an X-ray attenuation image of a region of interest of an object. The input unit is also configured to provide the processing unit with a dark field or phase contrast X-ray image of the region of interest of the object. The processing unit is further configured to identify a first feature in the X-ray attenuation image; to identify a second anatomical feature in the X-ray attenuation image; and to identify the second anatomical feature in the dark field or phase contrast X-ray image. The first feature is an obscuring anatomical feature depicted in the X-ray attenuation image with higher contrast than in the dark field or phase contrast X-ray image.Type: GrantFiled: May 4, 2017Date of Patent: January 19, 2021Assignee: KONINKLIJKE PHILIPS N.V.Inventor: Hanns-Ingo Maack
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Publication number: 20200383652Abstract: The present invention relates to an apparatus (10) for presentation of dark field information. It is described to provide (210) an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (220). A plurality of sub-regions of the region of interest are defined (230) based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived (240) for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned (250) to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region.Type: ApplicationFiled: November 22, 2018Publication date: December 10, 2020Inventors: RAFAEL WIEMKER, ANDRIY YAROSHENKO, KARSTEN RINDT, JÖRG SABCZYNSKI, THOMAS KOEHLER, HANNS-INGO MAACK
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Patent number: 10827986Abstract: An image processing apparatus (IP) comprising an input port (IN) for receiving projection data through respective 3D locations in an imaging region, said projection date collected in a scan operation by an imaging apparatus (IM). An image segment generator (IGS) of said apparatus (IP) is configured to generate, based on said projection data, a first image segment for said 3D locations. A visualizer (VIZ) configured to effect displaying said first image segment on a display device before or whilst the image apparatus collects projection data for a different 3D location.Type: GrantFiled: December 15, 2016Date of Patent: November 10, 2020Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Klaus Erhard, Frank Bergner, Hanns-Ingo Maack
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Patent number: 10813618Abstract: A calibration method and corresponding object for calibrating an X-ray imaging system with respect to dark field imaging is disclosed. The calibration object (1) generically comprises a plurality of sections (10, 20), wherein at least a part of the sections comprises two different materials, respectively. One material (101, 201) in a corresponding section leads to attenuation of passing X-ray beams and the other material (102, 202) is a dark field active material leading to small-angle scattering signals of incident X-rays. The ratio of the two materials in one section varies from section to section. The calibration object can be used to calibrate an X-ray imaging system with respect to a non-linear behavior of the dark field visibility.Type: GrantFiled: June 8, 2017Date of Patent: October 27, 2020Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Hanns-Ingo Maack, Thomas Koehler
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Publication number: 20200330056Abstract: A system and method for indicating a desired target radiation area of a radiation beam from a phase contrast radiology system on a subject comprising a first and second light field generator to project light fields on a subject. Both light fields are decoupled from path of the radiation beam. The overlapping area of both light fields indicates the target radiation area. The light fields do not substantially match a radiation beam path.Type: ApplicationFiled: October 17, 2018Publication date: October 22, 2020Inventor: HANNS-INGO MAACK
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Publication number: 20200305810Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface.Type: ApplicationFiled: December 11, 2018Publication date: October 1, 2020Inventors: ANDRIY YAROSHENKO, THOMAS KOEHLER, HANNS-INGO MAACK, MATTHIAS TEDERS
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Patent number: 10789674Abstract: An image processing module and related method. The module (IP) comprises—one or more input interfaces (IN) configured for receiving i) a first input image (II) acquired of an object by an imaging apparatus (IM) at a first geometrical configuration of the X-ray imaging apparatus and ii) a specification of a change from said first geometrical configuration to a second geometrical configuration of the imaging apparatus. An upsampler component (US) of the module (IP) computes a new image (I+) of the object (OB) by applying a geometrical transformation to said first input image. The geometrical transformation corresponds to said change in geometrical configuration of the imaging apparatus.Type: GrantFiled: September 21, 2016Date of Patent: September 29, 2020Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Hanns-Ingo Maack, Tobias Reusch
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Patent number: 10779776Abstract: The present invention relates to an apparatus for X-ray imaging an object. It is described to provide (20) data relating to the detection of X-rays, wherein an X-ray detector is configured to be positioned relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. An X-ray interferometer arrangement is configured to be positioned relative to the examination region. At least one X-ray dark field factor and at least one transmission factor are determined for the X-ray radiation transmitted through at least part of the object is determined. An intensity of X-ray radiation to be emitted towards the at least part of the object is controlled as a function of the determined at least one dark field factor and the determined at least one transmission factor.Type: GrantFiled: November 21, 2016Date of Patent: September 22, 2020Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Thomas Koehler, Hanns-Ingo Maack, Thomas Pralow
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Publication number: 20200229785Abstract: The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10); a pattern remover (11); and a first subtraction module (12); wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31); wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43); wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42); and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44).Type: ApplicationFiled: July 9, 2018Publication date: July 23, 2020Inventor: HANNS-INGO MAACK
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Publication number: 20200205765Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.Type: ApplicationFiled: July 26, 2018Publication date: July 2, 2020Inventors: THOMAS KOEHLER, HANNS-INGO MAACK, ANDRIY YAROSHENKO, KLAUS JUERGEN ENGEL, BERND MENSER
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Publication number: 20200187893Abstract: The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.Type: ApplicationFiled: April 17, 2018Publication date: June 18, 2020Inventors: ANDRIY YAROSHENKO, HANNS-INGO MAACK, THOMAS KOEHLER, FABIO DE MARCO, LUCAS BENEDICT GROMANN, WILLER KONSTANTIN, PETER NOEL
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Publication number: 20200100757Abstract: The present invention relates to an X-ray radiograph apparatus (10). It is described to placing (110) an X-ray source (20) relative to an X-ray detector (30) to form an examination region for the accommodation of an object, wherein, a reference spatial coordinate system is defined on the basis of geometry parameters of the X-ray radiography apparatus. A camera (40) is located (120) at a position and orientation to view the examination region. A depth image of the object is acquired (130) with the camera within a camera spatial coordinate system, wherein within the depth image pixel values represent distances for corresponding pixels.Type: ApplicationFiled: June 15, 2018Publication date: April 2, 2020Inventors: JULIEN SENEGAS, SASCHA ANDREAS JOCKEL, HANNS-INGO MAACK, MARTIN BERGTHOLDT
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Publication number: 20200022668Abstract: An image processing system (IPS) and a related method. The system comprises an input interface (IN) for receiving two or more input images that include respectively an attenuation signal of an imaged object and a dark-field signal of the object. A combiner (COM) is configured to combine the two or more input images in a linear combination operation to form a combined image. An output (OUT) port configured to output the combined image.Type: ApplicationFiled: December 14, 2017Publication date: January 23, 2020Inventor: HANNS-INGO MAACK
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Patent number: 10507004Abstract: The present invention relates to phantom device for a dark field imaging system. Although dark field imaging is known to be sensitive to changes in the micro-structure of the tissue of a human subject that may be caused during a disease progression, there may be a need to quantify information provided by an image of the human subject. A detector signal component representing the dark image may be altered by changes of the X-ray spectrum which passes tissue of the human subject comprising micro-structures. This may be caused due to an attenuation of the X-ray radiation previously provided by an X-ray source, wherein the attenuation may be caused by tissue of the human subject, which covers said micro-structure comprising tissue. In order to provide information in clinical practice regarding the influence of attenuation to the X-ray radiation before it passes the micro-structure issue of the human subject, the phantom device for dark field imaging is proposed.Type: GrantFiled: December 18, 2017Date of Patent: December 17, 2019Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Heiner Daerr, Thomas Koehler, Hanns-Ingo Maack
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Patent number: 10470735Abstract: The present invention relates to a device for signal compensation in medical X-ray images. The device (100) comprises a generation module (10) configured to generate an X-ray ghosting image based on an X-ray detector read-out subsequent to a last X-ray exposure of a plurality of X-ray exposures; a scaling module (20) configured to scale the X-ray ghosting image into a scaled X-ray ghosting image; and a subtraction module (30) configured to subtract the scaled X-ray ghosting image from any subsequent X-ray image recorded during a respective subsequent X-ray exposure of the plurality of X-ray exposures.Type: GrantFiled: November 23, 2015Date of Patent: November 12, 2019Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Detlef Mentrup, Hanns-Ingo Maack
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Patent number: 10463323Abstract: The present invention relates to a rotatable X-ray detector. In order to improve clinical workflow, an X-ray detector arrangement (10) is provided that comprises an X-ray detector unit (12) and a rotation unit (14). The X-ray detector unit (12) comprises an X-ray detector (16) with a plurality of X-ray detecting elements arranged as a detector surface (18). The rotation unit (14) is configured to rotate the X-ray detector about an axis (20) perpendicular to the detecting surface (18) at least at a point of intersection with the detector surface (18) upon receiving a rotation signal (22). Further, the rotation signal (22) is dependently ruled by a collimator configuration of an X-ray source arrangement for providing X-ray radiation towards the X-ray detector unit.Type: GrantFiled: October 9, 2015Date of Patent: November 5, 2019Assignee: KONINKLIJKE PHILIPS N.V.Inventor: Hanns-Ingo Maack