Abstract: To provide a process for producing an electrophotographic photosensitive member that can not easily cause any fog due to an increase in dark attenuation, a conductive layer is formed with use of a coating liquid for conductive layer prepared with use of a solvent, a binder material and metal oxide particles. The metal oxide particles (P) and binder material (B) in the coating liquid for conductive layer are in a mass ratio (P/B) of from 1.5/1.0 to 3.5/1.0. The metal oxide particle is a titanium oxide particle coated with tin oxide doped with phosphorus or tungsten. Where powder resistivity of the metal oxide particle is represented by x (?·cm) and powder resistivity of the titanium oxide particle as a core particle constituting the metal oxide particle is represented by y (?·cm), the y and the x satisfy the following relations (i) and (ii): 5.0×107?y?5.0×109??(i) 1.0×102?y/x?1.0×106??(ii).

Abstract: Provided are an electrophotographic photosensitive member in which leakage doesn't easily occur, a process cartridge and an electrophotographic apparatus each including the electrophotographic photosensitive member, and a method of manufacturing the electrophotographic photosensitive member. The electrophotographic photosensitive member includes a conductive layer including titanium oxide particle coated with tin oxide doped with a hetero element. When an absolute value of a maximum current amount flowing through the conductive layer in a case of performing a test of applying ?1.0 kV including DC voltage to the conductive layer is defined as Ia, and an absolute value of a current amount flowing through the conductive layer in a case where a decrease ratio of a current amount per minute reaches 1% or less for the first time is defined as Ib, the relations of Ia?6000 and 10?Ib are satisfied. A volume resistivity of the conductive layer before the test is 1.0×108 ?·cm to 5.0×1012 ?·cm.

Abstract: A method for producing an electrophotographic photosensitive member in which leakage hardly occurs is provided. For this, in the method for producing an electrophotographic photosensitive member according to the present invention, a coating liquid for a conductive layer is prepared using a solvent, a binder material, and a metallic oxide particle having a water content of not less than 1.0% by mass and not more than 2.0% by mass; using the coating liquid for a conductive layer, a conductive layer having a volume resistivity of not less than 1.0×108 ?·cm and not more than 5.0×1012 ?·cm is formed; the mass ratio (P/B) of the metallic oxide particle (P) to the binder material (B) in the coating liquid for a conductive layer is not less than 1.5/1.0 and not more than 3.5/1.

Abstract: An electrophotographic photosensitive member in which a leakage hardly occurs, a process cartridge and electrophotographic apparatus having the electrophotographic photosensitive member, and a method for producing the electrophotographic photosensitive member are provided. The conductive layer in the electrophotographic photosensitive member contains metal oxide particle coated with tin oxide doped with niobium or tantalum. The relations: Ia?6,000 and 10?Ib are satisfied. The conductive layer before the test is performed has a volume resistivity of not less than 1.0×108 ?·cm and not more than 5.0×1012 ?·cm.

Abstract: An electrophotographic photosensitive member having a specific conductive layer and promising less variation in light-area potential and residual potential in reproducing images repeatedly, and a process cartridge and an electrophotographic apparatus which have such an electrophotographic photosensitive member are provided. Where a test in which a voltage of ?1.0 kV having only a DC voltage component is continuously applied to the conductive layer for 1 hour is conducted, the conductive layer has volume resistivity satisfying the following mathematical expressions (1) and (2), as values before and after the test: ?2.00?(log|?2|?log|?1|)?2.00??(1), and 1.0×108??1?2.0×1013??(2), where, in the expressions (1) and (2), ?1 is volume resistivity (?·cm) of the conductive layer as measured before the test and ?2 is volume resistivity (?·cm) of the conductive layer as measured after the test.

Abstract: An electrophotographic photosensitive member that can not easily cause charging lines even where it is an electrophotographic photosensitive member employing as a conductive layer a layer containing metal oxide particles is disclosed. Also disclosed are a process cartridge and an electrophotographic apparatus which have such an electrophotographic photosensitive member. The electrophotographic photosensitive member has a conductive layer which contains titanium oxide particles coated with tin oxide doped with phosphorus or tungsten.

Abstract: An electrophotographic photosensitive member in which a leakage hardly occurs, a process cartridge and electrophotographic apparatus having the electrophotographic photosensitive member, and a method for producing the electrophotographic photosensitive member are provided. The conductive layer in the electrophotographic photosensitive member contains metal oxide particle coated with tin oxide doped with niobium or tantalum. The relations: Ia?6,000 and 10?Ib are satisfied. The conductive layer before the test is performed has a volume resistivity of not less than 1.0×108 ?·cm and not more than 5.0×1012 ?·cm.

Abstract: Provided are an electrophotographic photosensitive member in which leakage doesn't easily occur, a process cartridge and an electrophotographic apparatus each including the electrophotographic photosensitive member, and a method of manufacturing the electrophotographic photosensitive member. The electrophotographic photosensitive member includes a conductive layer including titanium oxide particle coated with tin oxide doped with a hetero element. When an absolute value of a maximum current amount flowing through the conductive layer in a case of performing a test of applying ?1.0 kV including DC voltage to the conductive layer is defined as Ia, and an absolute value of a current amount flowing through the conductive layer in a case where a decrease ratio of a current amount per minute reaches 1% or less for the first time is defined as Ib, the relations of Ia?6000 and 10?Ib are satisfied. A volume resistivity of the conductive layer before the test is 1.0×108 ?·cm to 5.0×1012 ?·cm.

Abstract: To provide a process for producing an electrophotographic photosensitive member that can not easily cause any fog due to an increase in dark attenuation, a conductive layer is formed with use of a coating liquid for conductive layer prepared with use of a solvent, a binder material and metal oxide particles. The metal oxide particles (P) and binder material (B) in the coating liquid for conductive layer are in a mass ratio (P/B) of from 1.5/1.0 to 3.5/1.0. The metal oxide particle is a titanium oxide particle coated with tin oxide doped with phosphorus or tungsten. Where powder resistivity of the metal oxide particle is represented by x (?·cm) and powder resistivity of the titanium oxide particle as a core particle constituting the metal oxide particle is represented by y (?·cm), the y and the x satisfy the following relations (i) and (ii): 5.0×107?y?5.0×109??(i) 1.0×102?y/x?1.0×106??(ii).

Abstract: An inverted microscope that allows observation of a specimen from underneath includes an objective lens holding unit that holds an objective lens configured to collect at least observation light from the specimen, a tube lens configured to focus the observation light collected by the objective lens, a branching unit configured to branch an optical path of the observation light from the tube lens, and an observation image switching device that is removably provided in a microscope main body between the objective lens and the tube lens and is configured to switch between wavelengths of an observation image or between magnifications of the observation image.

Abstract: An electrophotographic photosensitive member is provided in which black spots on an output image are hardly caused by local charge injection from a support to a photosensitive layer. For this purpose, a conductive layer is formed using a coating liquid for a conductive layer prepared using a solvent, a binder material and a metal oxide particle that satisfies the following relation (i): 45?A×?×D?65 (i) wherein A denotes the surface area of the metal oxide particle per unit mass [m2/g], D denotes the number average particle diameter of the metal oxide particle [?m], and ? denotes the density of the metal oxide particle [g/cm3]. The metal oxide particle is a titanium oxide particle coated with tin oxide doped with phosphorus.

Abstract: An electrophotographic photosensitive member is provided in which black spots on an output image are hardly caused by local charge injection from a support to a photosensitive layer. For this purpose, a conductive layer is formed using a coating liquid for a conductive layer prepared using a solvent, a binder material and a metal oxide particle that satisfies the following relation (i): 45?A×?×D?65 (i) wherein A denotes the surface area of the metal oxide particle per unit mass [m2/g], D denotes the number average particle diameter of the metal oxide particle [?m], and ? denotes the density of the metal oxide particle [g/cm3]. The metal oxide particle is a titanium oxide particle coated with tin oxide doped with phosphorus.

Abstract: An electrophotographic photosensitive member having a specific conductive layer and promising less variation in light-area potential and residual potential in reproducing images repeatedly, and a process cartridge and an electrophotographic apparatus which have such an electrophotographic photosensitive member are provided. Where a test in which a voltage of ?1.0 kV having only a DC voltage component is continuously applied to the conductive layer for 1 hour is conducted, the conductive layer has volume resistivity satisfying the following mathematical expressions (1) and (2), as values before and after the test: ?2.00?(log|?2|?log|?1|)?2.00??(1), and 1.0×108??1?2.0×1013??(2), where, in the expressions (1) and (2), ?1 is volume resistivity (?·cm) of the conductive layer as measured before the test and ?2 is volume resistivity (?·cm) of the conductive layer as measured after the test.

Abstract: An electrophotographic photosensitive member that can not easily cause charging lines even where it is an electrophotographic photosensitive member employing as a conductive layer a layer containing metal oxide particles is disclosed. Also disclosed are a process cartridge and an electrophotographic apparatus which have such an electrophotographic photosensitive member. The electrophotographic photosensitive member has a conductive layer which contains titanium oxide particles coated with tin oxide doped with phosphorus or tungsten.

Abstract: A visual inspection apparatus includes: a first substrate holding portion that holds a substrate so that a top surface is observable; a second substrate holding portion that holds the substrate so that a bottom surface is observable; a first substrate holding portion moving mechanism that moves the first substrate holding portion; a second substrate holding portion moving mechanism that moves the second substrate holding portion; and a control device that controls the first substrate holding portion moving mechanism and the second substrate holding portion moving mechanism so that the position of the substrate when observing the top surface of the substrate in the first substrate holding portion substantially matches the position of the substrate when observing the bottom surface of the substrate in the second substrate holding portion.

Abstract: A visual inspection apparatus includes: a first substrate holding portion that holds a substrate so that a top surface is observable; a second substrate holding portion that holds the substrate so that a bottom surface is observable; a first substrate holding portion moving mechanism that moves the first substrate holding portion; a second substrate holding portion moving mechanism that moves the second substrate holding portion; and a control device that controls the first substrate holding portion moving mechanism and the second substrate holding portion moving mechanism so that the position of the substrate when observing the top surface of the substrate in the first substrate holding portion substantially matches the position of the substrate when observing the bottom surface of the substrate in the second substrate holding portion.

Abstract: An AF apparatus for a microscope (1) of the present invention includes: an observational optical system (6) which radiates light on an object under inspection (3) via one of multiple interchangeable objective lens (2) and which has a CCD (imaging device) (5) for observing reflected light from the object under inspection (3); a light flooding portion (7) which radiates a laser (non-visible light) on the object under inspection (3) via the objective lens (2) of the observational optical system (6); a focal point detection optical system (10) which has a photo-detector (photo-electric conversion portion) (8) that is arranged at an image surface of a light figure of the reflected laser from the object under inspection and that outputs signals corresponding to the position of the light figure inside the image surface, and which detects the relative distance between the objective lens (2) and the object under inspection (3); an object position adjusting unit (11) which adjusts the focal position of the object under

Abstract: A visual inspection apparatus of the present invention comprising illuminating units such as a wide range illuminating unit irradiating light on a wafer, a slit illuminating unit, and a spot illuminating unit, a swinging mechanism that movably swings and retains a wafer, and a control unit that controls these illuminating units and the swinging mechanism. This visual inspection apparatus wherein inspection condition setting values are input by a keyboard, mouse and so on, summarized by inspection process and stored in a storage unit as setting information for inspection processes, which are selected and inspected by a setting information selection unit in the control unit.

Abstract: A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: An inspection apparatus has a unit which calculates a luminance adjustment value to adjust a luminance of a first image at a desired value by use of image information on the first image, a storage unit which stores the calculated luminance adjustment value, a unit which searches the first image having image information corresponding to a second image different from the first image, a unit which reads out a luminance adjustment value corresponding to the searched first image from the storage unit, and a unit which adjusts a luminance of the second image based on the luminance adjustment value read out from the storage unit.