Abstract: A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: A semiconductor wafer inspection apparatus is provided with a rotatable table on which a semiconductor wafer is held by suction, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: A semiconductor wafer inspection apparatus of the present invention is provided with the following a rotatable table on which a semiconductor wafer is sucked and held, an illuminating device which illuminates at least an edge portion of the semiconductor wafer held on the rotatable table, an imaging device which captures an image of the edge portion of the semiconductor wafer when the edge portion is illuminated by the illuminating device, an image processing device which detects at least an edge cut amount or a crack by acquiring the image of the edge portion which is captured by the imaging device, and a display section which displays an image of the edge portion subjected to image processing by the image processing device.

Abstract: A defect detecting apparatus comprising an illuminating unit which irradiates an object with illumination an image sensing unit which senses an image of the object an angle controller which controls an inclination angle of at least one of the illuminating unit and the image sensing unit, an image processor which senses images of the object while the angle controller changes the inclination angle of at least one of the illuminating unit and the image sensing unit and obtains a relationship between each inclination angle and optical information corresponding to the each inclination angle, and a determination unit which determines an image sensing condition suited to observation in accordance with the relationship wherein the angle controller sets the inclination angle of the illuminating unit or the image sensing unit on the basis of a determination result from the determination unit such that the inclination angle matches the image sensing condition.

Abstract: A defect detecting apparatus comprising an illuminating unit which irradiates an object with illumination an image sensing unit which senses an image of the object an angle controller which controls an inclination angle of at least one of the illuminating unit and the image sensing unit, an image processor which senses images of the object while the angle controller changes the inclination angle of at least one of the illuminating unit and the image sensing unit and obtains a relationship between each inclination angle and optical information corresponding to the each inclination angle, and a determination unit which determines an image sensing condition suited to observation in accordance with the relationship wherein the angle controller sets the inclination angle of the illuminating unit or the image sensing unit on the basis of a determination result from the determination unit such that the inclination angle matches the image sensing condition.

Abstract: An electrophotographic image-forming method has a contact charging step of charging the surface of an electrophotographic photosensitive member; an electrostatic latent image forming step of forming an electrostatic latent image on the surface of the electrophotographic photosensitive member charged; a developing step of developing the electrostatic latent image formed into a toner image; and a transfer step of transferring the toner image formed by the development from the electrophotographic photosensitive member to a transfer material, the developing step serving also as a cleaning step for collecting a toner remaining on the electrophotographic photosensitive member after transfer.

Abstract: An electrophotographic apparatus is disclosed which has an electrophotographic photosensitive member and a transfer device. The photosensitive member has a conductive support and a photosensitive layer, and further has a surface layer formed of a binder resin, fluorine atom- or silicon atom-containing compound particles incompatible with the binder resin, and a fluorine atom- or silicon atom-containing compound compatible with the binder resin. In the surface layer, the proportion of fluorine atoms and silicon atoms to carbon atoms, (F+Si)/C, as measured by X-ray photoelectron spectroscopy is 0.01 to 1.0. Additionally, the transfer device is a multiple-transfer device.

Abstract: An electrophotographic photosensitive member includes an electroconductive substrate, a photosensitive layer disposed on the electroconductive substrate, and a protective layer disposed on the photosensitive layer, the protective layer containing a resin formed by polymerization of compounds each having two or more ion polymerizable functional groups, and electroconductive particles.

Abstract: An electrophotographic photosensitive member has an electroconductive support, a photosensitive layer, and a protection layer in named order. The protection layer contains a binder resin and a particulate electroconductive material. The particulate electroconductive material has been treated for adhesion of a siloxane compound represented by Formula (1) and subsequently is heat-treated at a temperature of not lower than 120.degree. C.

Abstract: An electrophotographic apparatus is disclosed which has an electrophotographic photosensitive member and a transfer member. The photosensitive member has a conductive support and a photosensitive layer, and further has a surface layer formed of a binder resin, fluorine atom- or silicon atom-containing compound particles incompatible with the binder resin, and a fluorine atom- or silicon atom-containing compound compatible with the binder resin. In the surface layer, the proportion of fluorine atoms and silicon atoms to carbon atoms, (F+Si)/C, as measured by X-ray photoelectron spectroscopy is 0.01 to 1.0. Additionally, the transfer member is a multiple-transfer member.