Abstract: A temperature information output apparatus includes: a first comparison unit provided to match with a specific row in a pixel array unit and receiving and comparing an analog pixel signal output from a pixel and a reference signal having a ramp waveform having a predetermined inclination and a signal period; a first count unit carrying out a count operation during a count period within a reset period and a count period within a signal period; a first data output unit outputting the pixel data based on a count value obtained by the first count unit; a local voltage/temperature signal generating unit generating a local voltage and a temperature signal; a second comparison unit receiving and comparing the temperature signal and the reference signal; a second count unit carrying out a count operation during a count period within a reset period and a count period within a signal period; and a second data output unit outputting temperature data based on a count value obtained by the second count unit.

Abstract: In a reference signal comparison AD conversion scheme, a reference signal SLP_ADC and each of P and D phases of a pixel signal voltage Vx are compared. A count clock CKcnt1 is counted based on the comparison result. The counting result data is converted into signal data Dsig, i.e., the difference between the P and D phases, which is also subjected to CDS. At this time, the n-bit AD conversion is performed on each of the P and D phases of the pixel signal voltage Vx, followed by summation for digital integration. This prevents any possible detrimental effects that may be caused by summation in the analog domain. Although the signal data becomes W times greater, noise will likely become ?W times greater. This alleviates the problem of random noise resulting from AD conversion such as quantizing noise and circuit noise that do not exist in the analog domain, thus reducing the noise.

Abstract: A solid-state imaging device includes: a pixel section having pixels performing photoelectric conversion arranged in a matrix form; a pixel signal reading unit including an AD converting part that reads pixel signals in a unit of pixels, and compares a reference signal as a ramp waveform with the pixel signals to perform AD conversion; a clamp unit clamping the signal line with a clamp voltage such that the pixel signals are held at or greater than a set voltage; a correction bias circuit generating a clamp voltage according to a clamp voltage set value supplied and supplies the clamp voltage to the clamp unit; and a correction bias selecting unit selecting the clamp voltage set value such that the clamp voltage is generated in association with slope determining information for determining a slope of the reference signal, and supplies the clamp voltage set value to the correction bias circuit.

Abstract: An imaging device that can not only reduce noises including shading but also read out a pixel at high speed, a method for controlling the imaging device, and a camera using the imaging device are provided. In a 3-transistor-driven pixel circuit 11, the drain of a reset transistor 113 is connected to a drive signal line DRNL (n), and the drain of an amplifier transistor 114 is connected to a source voltage VDD. A row drive circuit 12a quickly decreases the voltage level applied to the drive signal line DRNL (n) from a high-level voltage VH to a lowest level voltage VLL, then increases it from the lowest level voltage VLL to a low-level voltage VL, and then gradually returns it to the high-level voltage VH.

Abstract: A reference voltage circuit for generating a reference voltage to be referred when a pixel signal is digitally converted, includes ramp voltage generating means for generating a ramp voltage which drops from a predetermined initial voltage at a certain gradient, a transistor for forming, together with the ramp voltage generating means, a current mirror circuit, and gain change means for changing a current value of a current flowing from a predetermined power supply via the transistor to change the gradient of the ramp voltage generated by the ramp voltage generating means.

Abstract: Disclosed herein is an image pickup circuit including: amplifying means for amplifying a charge corresponding to an amount of light received by a photodetector, and outputting a pixel signal; ramp signal generating means for generating a ramp signal whose voltage drops with a fixed slope from a predetermined initial voltage; and comparing means for comparing the pixel signal output by the amplifying means with the ramp signal output by the ramp signal generating means. A reference potential of the pixel signal output by the amplifying means and a reference potential of the ramp signal output by the ramp signal generating means are at a same level.

Abstract: An imaging device is disclosed. The device includes: a unit pixel that outputs an analog electric signal in accordance with a signal charge; a local voltage supply circuit that generates a local voltage different from an operation voltage; a reference signal generation section that generates a reference signal based on the local voltage provided by the local voltage supply circuit; and a processing section that converts, by referring to the reference signal generated by the reference signal generation section, the analog signal provided by the unit pixel into a digital signal. In the imaging device, the reference signal generation section keeps constant a load current of the local voltage supply circuit in an operating state.

Abstract: A solid-state imaging device includes plural photoelectric conversion means arranged along light receiving surfaces, readout means for reading out signal charge generated in the photoelectric conversion means, a voltage supply means for supplying various levels of voltages to respective units including the photoelectric conversion means and the readout means, a detection means for detecting level change of a prescribed supply voltage in supply voltages by the voltage supply means and a control means for controlling so that the level change is converged when level change of the prescribed supply voltage is detected by the detection means.