Abstract: Apparatus and related method for dark-field imaging. The apparatus operates on projective intensities detected at a detector in different energy channels. An energy weighting is used to improve the signal to noise ratio. The model operates in a logarithmic domain.

Abstract: The invention relates to a photon counting x-ray radiation detection system. The system (31) comprises an x-ray radiation device (2) for providing polychromatic x-ray radiation (4) for traversing an examination zone (5) during a detection period of a scan. A photon counting detection device (6) comprising detection elements (3) detects the x-ray radiation after having traversed the examination zone and measures for each detection element photon counts in one or more energy bins during the detection period. A correction unit (12) estimates for each detection element an amount of a build up charge present in the detection element and corrects the measured photon counts for the detection element based on the estimated amount of the build up charge. This allows the corruption of the photon count rates caused by the build up charges to be compensated and to improve the determination of the photon counts.

Abstract: An X-ray detector comprises a directly converting semiconductor layer having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source or light omitted by at least one light source. An evaluation unit calculates evaluation signals per pixel or group of pixels from first electrical measurement signals generated when light from said at least one light source at a first intensity is coupled into the semiconductor layer, and second electrical measurement signals generated when light from said at least one light source at a second intensity is coupled into the semiconductor layer. A detection unit determines detection signals from electrical measurement signals generated when x-ray radiation is incident onto the semiconductor layer, and a calibration unit calibrates the detection unit on the basis of the evaluation signals.

Abstract: The intensity of an X-ray signal received at a detector after passing through an object of interest is a function of the attenuation, phase change, and scattering caused by the object of interest. In traditional X-ray systems, it was not possible to resolve these components. This application discusses an X-ray measurement technique which is insensitive to the variations in the interferometric pattern caused by phase differences in portions of the object of interest. Thus, received intensity measurements are caused only by attenuation and scattering components. By making two independent measurements of the object of interest using such a phase-invariant imager, the attenuation and scattering components may be separated, providing valuable extra information about the imaged object of interest arising from so-called “dark field” effects.

Abstract: An apparatus and related method for processing image data supplied by a scanning phase contrast or dark-field imaging apparatus (MA). Beam hardening artifact in phase contrast and dark-field imaging can be reduced by applying a beam hardening processing operation by a beam hardening processing module (BHC) in respect of a plurality of detector readings that contribute signals to the same image pixel position or geometric ray of an imaging region of the apparatus (MA). In one embodiment, a phantom body (PB) is used to acquire calibration data on which the beam hardening processing is based.

Abstract: The invention relates to a system (31) for generating spectral computed tomography projection data. A spectral projection data generation device (6) comprising an energy-resolving detector generates spectral computed tomography projection databased on polychromatic radiation (4), which has been provided by a radiation device (2), after having traversed an examination zone (5), and a reference values generation device generates energy-dependent reference values based on radiation, which has not traversed the examination zone. A spectral parameter providing unit (12) provides a spectral parameter being indicative of a spectral property of the radiation device based on the energy-dependent reference values.

Abstract: An imaging system includes a radiation source (108) configured to rotate about an examination region (106)and emit radiation that traverses the examination region. The imaging system further includes an array of radiation sensitive pixels (112) configured to detect radiation traversing the examination region and output a signal indicative of the detected radiation. The array of radiation sensitive pixels is disposed opposite the radiation source, across the examination region. The imaging system further includes a rigid flux filter device (130) disposed in the examination region between the radiation source and the radiation sensitive detector array of photon counting pixels. The rigid flux filter device is configured to filter the radiation traversing the examination region and incident thereon. The radiation leaving the rigid flux filter device has a predetermined flux.

Abstract: The present invention relates to an X-ray detector comprising a directly converting semiconductor layer (60) having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source (2) or light emitted by at least one light source (30, 33).

Abstract: The invention relates to a system (31) for generating spectral computed tomography projection data. A spectral projection data generation device (6) comprising an energy-resolving detector generates spectral computed tomography projection databased on polychromatic radiation (4), which has been provided by a radiation device (2), after having traversed an examination zone (5), and a reference values generation device generates energy-dependent reference values based on radiation, which has not traversed the examination zone. A spectral parameter providing unit (12) provides a spectral parameter being indicative of a spectral property of the radiation device based on the energy-dependent reference values.

Abstract: The present invention relates to a detection device (6) for detecting photons emitted by a radiation source (2). The detection device (6) is configured to detect the photons during a first time period. The detection device (6) comprises a sensor (10) having an intermediate direct conversion material for converting photons into electrons and holes, a shaping element (20), and a compensation unit (450, INT, 950). The compensation unit (450, INT, 950) is adapted to provide a compensation signal based on the electrical pulse and on a photoconductive gain of said sensor (10). The core of the invention is to provide circuits to reduce artifacts due to inherent errors with direct conversion detectors in spectral computed tomography by determining a compensation current, by detecting or monitoring a baseline restorer feedback signal, or by ignoring signals above the baseline level.

Abstract: A method includes determining calibration factors for calibrating photon-counting detectors of a spectral imaging system by combining a heuristic calibration of the photon-counting detectors and an analytical calibration of the photon-counting detectors and generating a set of photon-counting calibration factors based on the combining of the a heuristic calibration and the analytical calibration. The photon-counting calibration factors, when applied to measured energy-resolved data from the photon-counting detectors of a spectral CT scan of a subject or object, mitigate spectral distortion caused by a radiation intensity profile shaper that filters a radiation beam of the spectral CT scan.

Abstract: An X-ray imaging method includes acquiring a differential phase contrast imaging X-ray scan with an X-ray imaging system having an X-ray source, an X-ray detector, and a grating arrangement having a source grating, a phase grating and an analyzer grating. The source grating is misaligned in respect to an interferometer such that moiré fringes are detectable in the plane of the detector. A translation signal is computed for translating the source grating for achieving a predetermined moiré pattern. The positioning of the source grating is adjusted in an X-ray projection direction based on the translation signal such that at least 2 pi of phase changes are covered with the Moiré fringes over the width of the detector. And a further differential phase contrast imaging X-ray scan is acquired.

Abstract: A phantom body (PB) for use in a differential phase contrast imaging apparatus (IM) for calibration of same. The phantom body (PB) allows for simultaneous calibration of three different image signal channels, namely refraction, phase shift and small angle scattering.

Abstract: The present invention relates to a detection device (6) for detecting photons emitted by a radiation source (2). The detection device (6) is configured to detect the photons during a first time period. The detection device (6) comprises a sensor (10) having an intermediate direct conversion material for converting photons into electrons and holes, a shaping element (20), and a compensation unit (450, INT, 950). The compensation unit (450, INT, 950) is adapted to provide a compensation signal based on the electrical pulse and on a photoconductive gain of said sensor (10). The core of the invention is to provide circuits to reduce artifacts due to inherent errors with direct conversion detectors in spectral computed tomography by determining a compensation current, by detecting or monitoring a baseline restorer feedback signal, or by ignoring signals above the baseline level.

Abstract: An imaging system (100) includes a radiation source (110) with a focal spot (204) that emits a beam of x-ray photons that traverses an examination region (106). The imaging system further includes a photon counting detector array (122) that detects a sub-set of the x-ray photons that traverse an examination region. The imaging system further includes a controller (116) that generates and transmits a pause signal, in response to a calculated drop in an intensity of the emitted the beam of x-ray photons below a predetermined intensity level, which causes the photon counting detector array to pause detecting the sub-set of the x-ray photons. The imaging system further includes a counter (136) that counts, for each of a plurality of counting periods, the x-ray photons of the sub-set detected by the photon counting detector array in the corresponding counting period.

Abstract: A phase contrast imaging apparatus (MA) and related image processing method. The imaging apparatus includes a movable arm (AR) that carries a detector (D) and one or more interferometric gratings (G0, G1, G2). The imaging apparatus includes a rigidizer (RGD) to control the rigidity of at least the arm (AR) or a mounting (GM) for the gratings (G0, G1, G2). This allows controlling a drift of a Moiré pattern as detected in a sequence of readouts. A phase of the so controlled Moiré pattern can be used to calibrate the imaging apparatus by using the image processing method.

Abstract: A method includes determining calibration factors for calibrating photon-counting detectors of a spectral imaging system by combining a heuristic calibration of the photon-counting detectors and an analytical calibration of the photon-counting detectors and generating a set of photon-counting calibration factors based on the combining of the a heuristic calibration and the analytical calibration. The photon-counting calibration factors, when applied to measured energy-resolved data from the photon-counting detectors of a spectral CT scan of a subject or object, mitigate spectral distortion caused by a radiation intensity profile shaper that filters a radiation beam of the spectral CT scan.

Abstract: The invention relates to a method and a pulse processing circuit (100) for the processing of current pulses (CP) generated by incident photons (X) in a piece of converter material, for instance in a pixel (11) of a radiation detector. Deviations of the pulse shape from a reference are detected and used to identify pulse corruption due to pile-up effects at high count rates and/or charge sharing between neighboring pixels. The deviation detection may for instance be achieved by generating, with a pulse shaper (110), bipolar shaped pulses from the current pulse (CP) and/or two shaped pulses of different shapes which can be compared to each other.

Abstract: The present invention relates handling misalignment in an X-ray imaging system for differential phase contrast imaging. In order to provide a reduction for the pretuning and adjustment requirements for manufacture and maintenance in a differential phase contrast imaging system, an X-ray imaging system (10) for differential phase contrast imaging, is provided that comprises a differential phase contrast setup (12) with an X-ray source (14) and an X-ray detector (16), a grating arrangement (18) comprising a source grating (20), a phase grating (22) and an analyser grating (24), wherein the source grating is arranged between the X-ray source and the phase grating, and the analyser grating is arranged between the phase grating and the detector. Further, a moving arrangement for a relative movement between an object under examination and at least one of the gratings is provided, as well as a processing unit (32), and a translation arrangement (34) for translating the source grating.

Abstract: An imaging system (600) includes a radiation source (608) that emits polychromatic radiation that traverses an examination region and a detector array (610) located opposite the radiation source, across the examination region, which includes a paralyzable photon counting detector pixel (611) that detects photons of the radiation that traverse the examination region and illuminate the detector pixel and that generates a signal indicative of each detected photon. An output photon count rate to input photon count rate map (626) includes at least one map which maps multiple input photon count rates of the detector pixel to a single output photon count rate of the detector pixel, and an input photon count rate determiner (624) identifies one input photon count rate of the multiple input photon count rates of the map as a correct input photon count rate for the detector pixel. A reconstructor that reconstructs the signal based on the identified input photon count rate.