Patents by Inventor Heinz Matt

Heinz Matt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9088294
    Abstract: A method and apparatus for characterizing an A/D converter are provided. The A/D converter is configured to convert an input signal into a digital output signal. The method and apparatus may provide: applying an input signal to the A/D converter that in a first phase at least includes a gradient of a rising exponential function with Euler's number as the base, and in a further phase has a profile of a falling exponential function with Euler's number as the base, integrating a digital output signal associated with the A/D converter during the first phase to provide a first sum, integrating the digital output signal associated with the A/D converter during the further phase to provide a second sum, and calculating from the first sum and the second sum at least a gain error of the A/D converter and/or a zero point error of the A/D converter.
    Type: Grant
    Filed: May 7, 2014
    Date of Patent: July 21, 2015
    Assignee: INFINEON TECHNOLOGIES AG
    Inventor: Heinz Mattes
  • Patent number: 8860592
    Abstract: A signal generating circuit, may include an analog signal generator having an output and a control input, the analog signal generator configured to generate at the output an analog output signal in accordance with a timing parameter; an analog-to-digital converter (ADC) having an input and an output, the input coupled to the output of the analog signal generator, the ADC configured to generate a sequence of signal values dependent on the analog signal received at the input; a configurable digital signal generator comprising an output and a control input, the digital signal generator configured to generate a digital output signal in accordance with signal parameters received at the control input; and a control circuit having an input coupled to the output of the ADC.
    Type: Grant
    Filed: October 7, 2013
    Date of Patent: October 14, 2014
    Assignee: Infineon Technologies AG
    Inventors: Heinz Mattes, Ralf Arnold, Hermann Obermeir
  • Patent number: 8060800
    Abstract: An evaluation circuit and method for detecting faulty data words in a data stream is disclosed. In one embodiment the evaluation circuit according to the invention includes a first linear automaton circuit and also a second linear automaton circuit connected in parallel, each having a set of states z, which have a common input line for receiving a data stream Tn. The first linear automaton circuit and the second linear automaton circuit are designed such that a first signature and a second signature, respectively, can be calculated. Situated downstream of the two linear automaton circuits are respectively a first logic combination gate and a second logic combination gate, which compare the signature respectively calculated by the linear automaton circuit with a predeterminable good signature and output a comparison value.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: November 15, 2011
    Assignee: Infineon Technologies AG
    Inventors: Michael Goessel, Andreas Leininger, Heinz Mattes, Sebastian Sattler
  • Patent number: 7945406
    Abstract: M periods of the test signal and of the reference signal are received. The periods of the test signal and of the reference signal are in each case Tsig long. The test signal is sampled with N sampled values at a sampling frequency fs=1/Ts. Also, N*Ts=M*Tsig, where N>M. The sampled values are numbered progressively by n, for which 0?n ?N?1. The sampled values have a defined relative phase shift with respect to the reference signal. The phase shift T? is calculated by ? i = 0 M - 1 ? ? Idx ? ( i ) + K , K being a constant and Idx(i) corresponding to the number n which is either the first sampled value after a test signal zero crossing during the reference signal's ith period or the last sampled value before a test signal zero crossing during the reference signal's ith period. Either only rising or only falling zero crossings are taken into account.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: May 17, 2011
    Assignee: Infineon Technologies AG
    Inventors: Stephane Kirmser, Heinz Mattes, Sebastian Sattler
  • Patent number: 7720645
    Abstract: A test apparatus for testing digitized test responses has a generator and a signal extractor. The generator uses direct digital synthesis to generate a set of n digital reference signals which are orthogonal to one another. In this case, n is a natural number greater than 1. The signal extractor contains a test input and reference inputs. The test input receives a digitized test response and the reference inputs are connected to the reference signals which are generated by the generator. The signal extractor generates scalar products from a respective reference signal and the test response and uses the products to calculate whether a combination of reference signals is contained in the test response.
    Type: Grant
    Filed: September 21, 2006
    Date of Patent: May 18, 2010
    Assignee: Infineon Technologies AG
    Inventors: Stephane Kirmser, Heinz Mattes, Sebastian Sattler
  • Publication number: 20100079170
    Abstract: An apparatus and method for the analysis of a periodic signal. One embodiment provides signal values. Signs are assigned to the signal values. The signed signal values are summed to a first sum. At least one signal property is determined on the basis of the first sum.
    Type: Application
    Filed: September 29, 2008
    Publication date: April 1, 2010
    Applicant: INFINEON TECHNOLOGIES AG
    Inventors: Heinz Mattes, Jaafar Mejri, Stephane Kirmser, Frank Demmerle
  • Patent number: 7653170
    Abstract: An electrical circuit used for measuring times is disclosed. In one embodiment, the electrical circuit has a counter, a decoder and a multiplicity of time trap elements. At least the counter and the time trap elements are located together on an integrated semiconductor component. Each time trap element has a data input, a clock input, a delay output and a output port. The time trap element contains a delay element and a flip flop. The delay element outputs a signal change at the data input with a time delay at the delay output. The flip flop has a data input, a clock input and an output port, the data inputs, the clock inputs and the output ports of the flip flop and of the time trap element being connected to one another. The time trap elements are connected as ring oscillator.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: January 26, 2010
    Assignee: Infineon Technologies AG
    Inventors: Heinz Mattes, Thomas Piorek, Sebastian Sattler, Olaf Stroeble
  • Patent number: 7644528
    Abstract: Machine guns having detachable barrels and methods of operating the same are disclosed. An illustrated example firearm includes a housing; a removable barrel; a latch to releasably secure the barrel in the housing, the latch having a released state and a secured state; and a carrying handle movable between a rest position and a carry position. The carrying handle cooperates with the latch such that the latch can only be moved into the released state to permit removal of the barrel when the carrying handle is at least substantially in the carry position.
    Type: Grant
    Filed: January 15, 2008
    Date of Patent: January 12, 2010
    Assignee: Heckler & Koch, GmbH
    Inventors: Ernst Wössner, Heinz Matt
  • Patent number: 7561639
    Abstract: To estimate physical properties of a wired or wireless transmission channel it is proposed to sample a signal, received via the transmission channel, for example a system response of the corresponding transmission system, in order, on the basis of the sampled values thus obtained, to ascertain the moments of the order 0 . . . n of the received signal. Using these moments of the order 0 . . . n, n parameters of a transmission function of the transmission channel can be determined, wherein the parameters can be polynomial coefficients, zero points or coefficients of a residual notation of the transmission function. Using this transmission function the physical properties of the transmission channel, such as the attenuation and dispersion properties, can be determined exactly or at least approximately assessed.
    Type: Grant
    Filed: October 21, 2004
    Date of Patent: July 14, 2009
    Assignee: Infineon Technologies AG
    Inventors: Peter Gregorius, Paul Georg Lindt, Heinz Mattes
  • Patent number: 7558991
    Abstract: A test device contains a data pattern generator for providing a delta-sigma-modulated data stream sampled with a sampling frequency fs at its output. A phase modulator generates a test clock subjected to jitter and having the clock frequency ft at its output. The output of the data pattern generator is connected to a terminal for connection to a data input of a semiconductor component to be tested. The output of the phase modulator is connected to a terminal for connection to a clock input of a semiconductor component to be tested. An evaluation device determines the jitter parameters of the input signal at the input of the data device from the low-frequency component of the input signal. In this case, the low-frequency component contains only frequency components of frequencies which are less than half the sampling frequency fs/2.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: July 7, 2009
    Assignee: Infineon Technologies AG
    Inventors: Heinz Mattes, Sebastian Sattler
  • Patent number: 7471220
    Abstract: The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE1).
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: December 30, 2008
    Assignee: Infineon Technologies AG
    Inventors: Heinz Mattes, Sebastian Sattler
  • Patent number: 7400995
    Abstract: A test device and method is disclosed. In one embodiment, the test device includes a precision signal generator for generating a test signal, which generator is connected via a respective connecting line to a respective input contact intended for connection to an input of an integrated circuit, and at least one reference signal generator for generating a reference signal. Furthermore, at least one comparator unit is provided for a respective input contact said comparator unit being able to be operated in a test mode. In the test mode, the test signal is compared with the reference signal. The precision signal generator is turned off by the comparator unit if the test signal exceeds or falls below the reference signal.
    Type: Grant
    Filed: July 8, 2004
    Date of Patent: July 15, 2008
    Assignee: Infineon Technologies AG
    Inventors: Heinz Mattes, Sebastian Sattler
  • Patent number: 7391349
    Abstract: A method for testing AD converters (10) may have the steps of a) producing a digital test signal, b) producing an analog test signal as input signal for the AD converter (10) from the digital test signal, c) producing a sinusoidal, digital reference signal whose frequency is equal to or an integer multiple of the frequency of the analog test signal, d) mixing the test response from the AD converter (10) with the sine and the cosine of the digital reference signal to form mixed signals, e) determining the DC components of the mixed signals, and f) determining at least one of the parameters including amplitude, power components and phase angle for a fundamental or harmonic of the test response from the DC components of the mixed signals.
    Type: Grant
    Filed: March 28, 2007
    Date of Patent: June 24, 2008
    Assignee: Infineon Technologies AG
    Inventors: Claus Dworski, Heinz Mattes, Sebastian Sattler
  • Publication number: 20080134557
    Abstract: Machine guns having detachable barrels and methods of operating the same are disclosed. An illustrated example firearm includes a housing; a removable barrel; a latch to releasably secure the barrel in the housing, the latch having a released state and a secured state; and a carrying handle movable between a rest position and a carry position. The carrying handle cooperates with the latch such that the latch can only be moved into the released state to permit removal of the barrel when the carrying handle is at least substantially in the carry position.
    Type: Application
    Filed: January 15, 2008
    Publication date: June 12, 2008
    Inventors: Ernst Wossner, Heinz Matt
  • Patent number: 7355414
    Abstract: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.
    Type: Grant
    Filed: February 7, 2006
    Date of Patent: April 8, 2008
    Assignee: Infineon Technologies, AG
    Inventors: Ralf Arnold, Heinz Mattes, Klaus Standner
  • Patent number: 7347023
    Abstract: Machine guns having detachable barrels and methods of operating the same are disclosed. An illustrated example firearm includes a housing; a removable barrel; a latch to releasably secure the barrel in the housing, the latch having a released state and a secured state; and a carrying handle movable between a rest position and a carry position. The carrying handle cooperates with the latch such that the latch can only be moved into the released state to permit removal of the barrel when the carrying handle is at least substantially in the carry position.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: March 25, 2008
    Assignee: Heckler & Koch, GmbH
    Inventors: Ernst Wössner, Heinz Matt
  • Publication number: 20080040638
    Abstract: An evaluation circuit and method for detecting faulty data words in a data stream is disclosed. In one embodiment the evaluation circuit according to the invention includes a first linear automaton circuit and also a second linear automaton circuit connected in parallel, each having a set of states z, which have a common input line for receiving a data stream Tn. The first linear automaton circuit and the second linear automaton circuit are designed such that a first signature and a second signature, respectively, can be calculated. Situated downstream of the two linear automaton circuits are respectively a first logic combination gate and a second logic combination gate, which compare the signature respectively calculated by the linear automaton circuit with a predeterminable good signature and output a comparison value.
    Type: Application
    Filed: October 22, 2004
    Publication date: February 14, 2008
    Inventors: Michael Goessel, Andreas Leininger, Heinz Mattes, Sebastian Sattler
  • Patent number: 7290022
    Abstract: A method and apparatus for fast digital filtering that requires only filter stages of first and second order. A desired rational filter transfer function is represented as a sum of first and second order intermediate transfer functions. A time dependent input signal is first fed in parallel into a plurality of first and second order intermediate recursive filter stages. Then, the outputs of the intermediate filter stages are summed up to an output filter signal that corresponds to the desired rational filter transfer function. The method and apparatus reduces the amount of calculational effort to the order of O(N), where N denotes the number of sampling points in the time domain, because the digital filtering is based on a discrete recursive convolution in the time domain.
    Type: Grant
    Filed: November 17, 2003
    Date of Patent: October 30, 2007
    Assignee: Infineon Technologies AG
    Inventors: Heinz Mattes, Peter Gregorius, Paul Georg Lindt
  • Publication number: 20070226602
    Abstract: M periods of the test signal and of the reference signal are received. The periods of the test signal and of the reference signal are in each case Tsig long. The test signal is sampled with N sampled values at a sampling frequency fs=1/Ts. Also, N*Ts=M*Tsig, where N>M. The sampled values are numbered progressively by n, for which 0?n ?N?1. The sampled values have a defined relative phase shift with respect to the reference signal. The phase shift T? is calculated by ? i = 0 M - 1 ? ? ? Idx ? ( i ) + K , K being a constant and Idx(i) corresponding to the number n which is either the first sampled value after a test signal zero crossing during the reference signal's ith period or the last sampled value before a test signal zero crossing during the reference signal's ith period. Either only rising or only falling zero crossings are taken into account.
    Type: Application
    Filed: September 8, 2006
    Publication date: September 27, 2007
    Inventors: Stephane Kirmser, Heinz Mattes, Sebastian Sattler
  • Patent number: RE47805
    Abstract: A method and apparatus for characterizing an A/D converter are provided. The A/D converter is configured to convert an input signal into a digital output signal. The method and apparatus may provide: applying an input signal to the A/D converter that in a first phase at least includes a gradient of a rising exponential function with Euler's number as the base, and in a further phase has a profile of a falling exponential function with Euler's number as the base, integrating a digital output signal associated with the A/D converter during the first phase to provide a first sum, integrating the digital output signal associated with the A/D converter during the further phase to provide a second sum, and calculating from the first sum and the second sum at least a gain error of the A/D converter and/or a zero point error of the A/D converter.
    Type: Grant
    Filed: December 1, 2016
    Date of Patent: January 7, 2020
    Assignee: Infineon Technologies AG
    Inventor: Heinz Mattes