Abstract: An automatic combination rifle with a large caliber automatic rifle system and a normal caliber automatic rifle system that include respective triggering arrangements which are connected with a single, movable trigger lever with the use of an activated change-over mechanism. Each triggering arrangement comprises a movable release mechanism to control the respective trigger function. The change-over mechanism establishes a selective connection with one of the release mechanisms for cooperative movement with the trigger lever.

Abstract: The integrated circuit with programmable pad driver involves an integrated circuit (IS1) with at least one pad driver that has a programming unit (PE) and a plurality of sub-drivers (T1 . . . Tm). A specific driver intensity and edge steepness of the pad driver can be set in that a corresponding plurality of sub-drivers connected to a common terminal contact (PAD) at their output side are activated/deactivated dependent on output signals (P1 . . . Pm) of the programming unit.

Abstract: An ammunition transport for use in a repeating weapon includes a transition component that presents a pair of converging sloped surfaces so that cartridges provided in a side-by-side fashion from a cartridge magazine may be transferred to a cartridge chamber of the weapon.

Abstract: A repeating shot gun, in particular a automatic shot gun, is provided with at least one barrel (29) which is rigidly attached to a plastic housing (1) when the gun is assembled, the shot gun having a coupling (3) formed either from a metal or from a material having properties similar to those of metals with respect to deformation and strength and having a barrel receiver (5) which is rigidly positioned in the housing (1), such that the barrel receiver (5) substantially coaxially surrounds the rear portion of the barrel (29) and the barrel (29) is in close-fitting engagement with the barrel receiver (5).

Abstract: A method in a parallel test apparatus provides for parallel testing a plurality of memory cells of a semiconductor module in parallel. The information read from the memory cells that are forwarded via the parallel test apparatus are tested to determine whether or not all cells are free of error. When exactly one error is present, the parallel test indicates the address of the faulty memory cell. Code words in the sense of the Hamming code are employed as test patterns. The length of the code words corresponds to the plurality of memory cells to be tested in parallel. The parallel test apparatus is constructed on the memory chip in the form of weighted parity check circuits.

Abstract: A magazine includes a load opening and a linkless feed system which includes the following devices for manual loading with cartridges through the load opening, as well as for their automatic and sequential transport to a gun barrel. These devices include a cartridge receiving device movable manually in the load direction and automatically in the opposite, feed direction, a tensioning device engaging into the cartridge receiving device, pretensionable in the feed direction, and a device for automatic but releasable blocking of the feed system during the loading phase in the feed direction when the tensioning device is released, and/or in the loading direction when a cartridge gap appears in a cartridge receiving device behind the load opening.

Abstract: A magazine for automatic weapons exhibits an endless chain for storing cartridges. Provided in the vicinity of a delivery opening of the magazine is an additional storage chamber from which further cartridges can be fed simply and quickly into the chain.