Abstract: An electrostatic protection circuit includes a first impurity region, a second impurity region, a first electrode, a third impurity region, a fourth impurity region, a second electrode, a fifth impurity region, a sixth impurity region, a third electrode, a gate insulating film, and a fourth electrode.

Abstract: A swing-open type package has a box body (10), a lid (12) to be put onto the box body (10) from above, and a swing device connecting the lid (12) and the box body (10), the swing device including a movable rear wall portion (36) formed by a part of a rear wall of the box body (10), and a support flap (44) connecting the lid (12) and a transverse wall (21) of the box body (10), and enables a swing motion of the lid (12) when a front wall of the lid (12) is raised from the boxy body (10) so that the swing motion causes the lid (12) to tilt and open wide.

Abstract: A feature analysis apparatus which enables visual confirmation of features of an inspected object and which enables limitations on the degree of freedom of classification based on the features to made relatively smaller is provided. It acquires inspected object information of an inspected object (S1), analyzes the inspection information to determine values of feature parameters of each of the plurality of layers (S2 to S5), uses values of the plurality of feature parameters and their corresponding directions for each of the plurality of layers to generate a single parameter vector (S2 to S5), converts the parameter vector to a layer vector which is a 3D vector in a predetermined (S2 to S5), and couples the plurality of layer vectors obtained for the plurality of layers in the order of the layers and generates a set of coordinate values of the plurality of nodes obtained in the 3D space as feature information of the inspected object (S6).

Abstract: A substrate surface inspection apparatus and method enabling judgment and analysis of the state of even portions of a substrate supported by supports using a captured image are provided. A support mechanism 20 is used where positions of arrangement of substrate support positions along the direction perpendicular to a scan direction by a plurality of first supports 23a to 23d are set outside the image capturing ranges of the substrate 10 by the imaging units 30a, 30b at the first relative position and inside the common image capturing range and where positions of arrangement of substrate support positions along the direction perpendicular to the scan direction by the plurality of second supports 24a to 24d are set outside the image capturing ranges of the substrate by the imaging units at the second relative position and inside the common image capturing range.

Abstract: A method of inspection and inspection apparatus able to use a captured image to more precisely inspect the state of film, defect parts, etc. at a surface of an object under inspection are provided. A method of inspection and inspection apparatus illuminating a surface of an object under inspection 10 by white light from an illumination unit LO while scanning the surface of the object under inspection 10 by an image capturing unit 100 to acquire a captured image and using the captured image to inspect a state of the surface of the object under inspection 10, which changes a state of polarization of light LR striking the image capturing unit 100 from an illuminated location of the object under inspection 10 and obtains a plurality of captured images based on light of different polarization states LR striking the image capturing unit 100.

Abstract: An inspection apparatus of a disk-shaped substrate able to precisely quantitatively inspect positions of formation of film layers formed on the surface of a disk-shaped substrate is provided, that is, an inspection apparatus of a disk-shaped substrate on which film layers are formed designed to generate captured image data expressing a captured image corresponding to a field of view based on image signals successively output from an image capturing unit capturing an image of a predetermined surface at an outer circumference part of the disk-shaped substrate and to generate film layer edge position information Y4E24 (?) expressing longitudinal direction positions at corresponding positions (?) along the circumferential direction of an edge line E24 of a film layer image part ISa (24) corresponding to the film layer 24 on the surface image ISa with reference to, from the captured image data, longitudinal direction positions YE15aL (?) at the different positions (?) along the circumferential direction of a bound

Abstract: By stably separating a melting location of a fuse (3) from conductive layers (5A, 5B), reliable melting of the fuse (3) is enabled. A fuse (3) including a fuse body (3A) and two pads (3Ba, 3Bb) connected by this and two conductive layers (5A, 5B) individually connected to the two pads (3Ba, 3Bb) are formed in a multilayer structure on a semiconductor substrate (1). A length of the fuse body (3A) is defined so that the melting location of the fuse (3) becomes positioned in the fuse body (3A) away from the region overlapped on the conductive layer (5A or 5B) when an electrical stress is applied between two conductive layers (5A, 5B) and the fuse (3) is melted.

Abstract: [Problem] An inspecting device and an inspecting method enabling better precision inspection for a processing region formed on a surface of a semiconductor wafer or other disc wafer are provided.

Abstract: [Problems] To provide a semiconductor wafer processing apparatus and reference angular position detection method able to suitably detect a reference angular position for a semiconductor wafer for which a reference angular position is set and a semiconductor wafer for which a reference angular position is suitably set. [Means for Solving Problems] A semiconductor wafer (100) is formed at part of an outer circumference edge part (101) with a crystal orientation detection flat surface (102) vertical to the diametrical direction at a position forming a predetermined angle with the crystal orientation.

Abstract: To provide a wafer containing cassette inspection device capable of expressing external view attributes such as shapes of respective inspection object portions of water containing cassettes of different types under the same condition without changing imaging conditions for each of the types. A wafer containing cassette inspection device includes an imaging device (61) and a processing unit (50) which processes an image signal from the imaging device (61).

Abstract: [Problem] To provide a surface inspection apparatus able to suitably inspect the outer circumference edge part of a semiconductor wafer or other plate-shaped member.

Abstract: The present invention provides a manufacturing method and manufacturing equipment which makes it possible to manufacture a fuel cell MEA (membrane electrode assembly) continuously and stably with a high level of precision.

Abstract: Disclosed herein is a semiconductor device including: a main body transistor region; and an electrostatic discharge protection element region, wherein the main body transistor region includes, a drain region; a drift region; body regions; a gate insulating film; gate electrodes; source regions; channel regions; and potential extraction regions, and the electrostatic discharge protection element region includes, the body regions; the gate insulating film; the gate electrodes; source regions and drain regions; and potential extraction regions, and a gate length in the electrostatic discharge protection element region is equal to or less than twice a channel length in the main body transistor region.

Abstract: A linear actuator which can make a bed flat in emergency. A linear actuator (10) comprising a shaft (16) having an externally threaded portion (17), a worm reduction gear for transmitting rotation of a motor (40) to the shaft (16), a nut (19) screwing on the externally threaded portion (17) and advancing or retreating as the shaft (16) rotates forward or reversely, and a moving tube (12) secured to the nut (19) and advancing or retreating for the housing (11) is further provided with a sub-shaft (52) interlocked with the worm reduction gear, an inner race (59) spline coupled with the sub-shaft (52), an engaging male portion (82) and an engaging female portion (83) interposed between the inner race (59) and the collar (55) of the shaft (16) to engage freely with each other, an operating ring (66) fitted rotatably to the outer circumference of the housing (11), and a working ring (72) for transmitting the rotation of the operating ring (66) to the inner race (59) while converting into axial movement.

Abstract: [Problems] To provide a visual inspection system able to greatly suppress the increase of the amount of processing and detect scratches or other defects of the surface of an object being inspected by a suitable resolution and able to judge the state of formation of films on that object surface. [Means for Solution] A system having an imaging unit 20 provided with a plurality of line sensors 22R, 22G, and 22B differing in color sensitivity characteristics and a processing unit 50, the processing unit 50 having a pixel data acquiring means (S14) acquiring pixel density data from a density signal from a reference line sensor by a first pixel density and pixel density data from density signals from the line sensors other than the reference line sensor by a second pixel density lower than the first pixel density and generating information showing the state of the object surface based on the pixel density data acquired by the first pixel density and the pixel density data acquired by the second pixel density.

Abstract: A discharge port of a compression element is positioned inside an outer circumferential surface of a stator, as seen looking in a direction of a rotation axis of a shaft, and overlaps the stator, as seen looking in a direction orthogonal to the rotation axis of the shaft. Accordingly, refrigerant gas discharged from the compression element can be made to flow mainly into spaces inside the outer circumferential surface of the stator.

Abstract: An information processing apparatus includes a first classification unit configured to set each of pixels forming a first image as a pixel of interest and classify the pixels of interest into one of a plurality of provided classes of a first type in accordance with a predetermined rule; a feature amount generation unit configured to generate a shifted waveform whose phase is shifted with respect to a waveform of the first image containing the pixels of interest and configured to generate a feature amount; a second classification unit configured to be provided with a plurality of classes of a second type in accordance with the feature amount for each of the plurality of classes of the first type and configured to classify the pixels of interest; and a prediction calculation unit configured to predictively calculate pixels forming a second image.

Abstract: An image processing device, to convert a first image data into a second image data having a higher image quality, includes: a predicted tap extracting unit to extract multiple pixels as a predicted tap for prediction computing; a level limit class tap extracting unit to extract multiple pixels as a level limit class tap for level limit classifying processing; a waveform class tap extracting unit to extract multiple pixels as a waveform class tap; a level limit classifying unit to classify the pixel of interest, based on a ratio between a level width and a dynamic range of the pixels making up the level limit class tap; a waveform pattern classifying unit to classify the pixel of interest; a prediction coefficient output unit to output a prediction coefficient corresponding to a combination of a level limit class and a waveform pattern class; and a prediction computing unit.

Abstract: [Problem] To provide a surface roughness inspection system enabling suitable inspection even when the surface of the object being inspected is curved. [Means for Solution] A system having an imaging unit 20 having a line sensor 22 and scanning the surface of an object being inspected 101 in a direction perpendicular to the direction of extension of the line sensor 22 and outputting a density signal for each pixel from the line sensor 22 and a processing unit 50 processing the density signal from the line sensor 22 of the imaging unit 20, the processing unit 50 having a means for acquiring a pixel density value based on a density signal from the line sensor 22 (S2) and a density state generating means for generating a density state information Pf showing the density state in the scan direction of the object surface based on all of the pixel density values acquired for the object surface 101 being inspected (S7).

Abstract: A compressor has stator of a motor is installed in a closed container, on two planes normal to the center axis 1a of the container. On each of the planes, the stator is welded to the container at three welding points. This mounting arrangement on two planes with three welding points on each plane minimizes the amount of movement of the stator in the direction of the center axis.