Patents by Inventor Hilmar Gugel
Hilmar Gugel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7903247Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: GrantFiled: August 19, 2009Date of Patent: March 8, 2011Assignee: Leica Microsystems CMS GmbHInventors: Marcus Dyba, Hilmar Gugel
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Patent number: 7830506Abstract: A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.Type: GrantFiled: January 16, 2007Date of Patent: November 9, 2010Assignee: Leica Microsystems CMS GmbHInventors: Hilmar Gugel, Marcus Dyba, Volker Seyfried
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Patent number: 7742226Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4? microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.Type: GrantFiled: July 20, 2006Date of Patent: June 22, 2010Assignee: Leica Microsystems CMS GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
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Publication number: 20100134867Abstract: An acousto-optical filter element (114) is provided which has an acousto-optical crystal (118) having an acoustic signal transmitter (120) for generating acoustic signals in the acousto-optical crystal (118). The acousto-optical crystal (118) is designed to selectively spatially deflect light of a target wavelength from an input light beam (116) entering into the acousto-optical crystal (118), as a function of a high frequency applied to the acoustic signal transmitter (120), and to thereby produce a target light beam (126) having the target wavelength. In addition, the acousto-optical filter element (114) includes a spatial filter element (132) which is located in the target light beam (126) and is designed to selectively suppress the intensity of the target light beam (126) in a plane perpendicular to the propagation direction of the target light beam (126).Type: ApplicationFiled: November 20, 2009Publication date: June 3, 2010Inventors: Hilmar GUGEL, Volker Seyfried
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Patent number: 7679741Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).Type: GrantFiled: January 16, 2007Date of Patent: March 16, 2010Assignee: Leica Microsystems CMS GmbHInventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20100006772Abstract: A method and an apparatus are suggested for high-resolution optical scanning, particularly in a laser scanning fluorescence microscope. A sample to be scanned comprises a first and a second substance that are switchable into a first and second energy state. In the scanning process, excitation, de-excitation and detection for the first substance is carried out at a different point in time than for the second substance. This achieves a high spatial resolution beyond the diffraction limit while at the same time a high level of information is provided with physically simple and economical means.Type: ApplicationFiled: August 9, 2007Publication date: January 14, 2010Applicant: LEICA MICROSYSTEMS CMS GMBHInventor: Hilmar GUGEL
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Patent number: 7646481Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: GrantFiled: January 16, 2007Date of Patent: January 12, 2010Assignee: Leica Microsystems CMS GmbHInventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20090303474Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: ApplicationFiled: August 19, 2009Publication date: December 10, 2009Inventors: Marcus Dyba, Hilmar Gugel
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Patent number: 7619732Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).Type: GrantFiled: January 16, 2007Date of Patent: November 17, 2009Assignee: Leica Microsystems CMS GmbHInventors: Hilmar Gugel, Marcus Dyba
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Patent number: 7599115Abstract: A scanning microscope includes an excitation light beam, a stimulation light beam, an objective, an optical component and an optical system, The excitation light beam optically excites a first area of a specimen. The stimulation light beam triggers a stimulated emission or an additional excitation in a second area of the specimen, the second area at least partially overlapping with the first area of the specimen. The objective focuses the excitation light beam and the stimulation light beam. The optical component influences a shape of the focus of the excitation light beam and/or of the stimulation light beam. The optical system images the optical component into the pupil of the objective and adjusts a size of an image of the optical component.Type: GrantFiled: August 23, 2004Date of Patent: October 6, 2009Assignee: Leica Microsystems CMS GmbHInventor: Hilmar Gugel
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Publication number: 20080316469Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources (1, 2), in particular in a beam path (8, 9) of a preferably high or extremely high resolution microscope, the beams of the light sources (1, 2) requiring to be superposed in a common illumination beam path (10), is characterized in that a calibration sample (22) with the aid of which the pupil position and/or focal position of the beams can be checked can be brought into and taken out of the illumination beam path (10).Type: ApplicationFiled: March 4, 2008Publication date: December 25, 2008Inventors: Holger Birk, Marcus Dyba, Hilmar Gugel, Volker Seyfried
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Patent number: 7466885Abstract: The invention relates to a light source comprising a microstructured optical element (11) that receives and spectrally spreads the light from a primary light source (3). The inventive light source is characterized in that the spectrally spread light penetrates at least one other microstructured optical element (15, 19, 21). Said light source can be efficiently used in scanning microscopy and especially in STED microscopy.Type: GrantFiled: September 6, 2004Date of Patent: December 16, 2008Assignee: Leica Microsystems CMS GmbHInventor: Hilmar Gugel
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Patent number: 7433119Abstract: In a scanning microscope that impinges upon a sample with a first light pulse and a second light pulse, a dispersive medium that modifies the time offset between the first and the second light pulse is provided in the beam path of at least one of the light pulses.Type: GrantFiled: October 12, 2004Date of Patent: October 7, 2008Assignee: Leica Microsystems CMS GmbHInventor: Hilmar Gugel
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Patent number: 7355789Abstract: An optical device with a focusing optic that focuses a light beam in a focal plane and brings about a phase shift between a first part of the light beam and a second part of the light beam. The optical device has a first interface and a second interface, the first interface retlects the first part of the light beam, and the second interface reflects the second part of the light beam.Type: GrantFiled: July 7, 2005Date of Patent: April 8, 2008Assignee: Leica Microsystems CMS GmbHInventor: Hilmar Gugel
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Patent number: 7333207Abstract: The invention relates to a confocal 4? microscopy method which is characterized by coherently illuminating a sample from two sides by one objective each with illumination light which has at least one illumination wavelength whereby a stationary illumination wave having a main illumination maximum and secondary illumination maxima is produced by interference of the illumination light in the sample. The detection light emitted by the sample has at least one detection wavelength and is detected through the two objectives. The detection light is made to interfere, thereby producing in the sample a detection pattern having a main detection maximum, secondary detection maxima and detection minima in such a manner that the secondary illumination maxima and the detection minima overlap at least partially.Type: GrantFiled: January 6, 2004Date of Patent: February 19, 2008Assignee: Leica Microsystems CMS GmbHInventors: Jörg Bewersdorf, Hilmar Gugel
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Publication number: 20070268583Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in such a way that a standing wave with defined intensity zero points (5) is formed in the sample region (P) to be recorded.Type: ApplicationFiled: January 16, 2007Publication date: November 22, 2007Inventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20070206278Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).Type: ApplicationFiled: January 16, 2007Publication date: September 6, 2007Inventors: Marcus Dyba, Hilmar Gugel
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Publication number: 20070206277Abstract: A method for high spatial resolution examination of samples, preferably by using a laser scanning fluorescence microscope, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the following steps: a) the substance is brought into the first state (Z1, A) by means of a switching signal (2) in a sample region (P) to be recorded, b) the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, c) the remaining first states (Z1, A1, A2, A3) are read out by means of a test signal (7), and d) steps a) to c) are repeated, the optical signal (4) being displaced upon each repetition in order to scan the sample (1), is defined in that the individual steps a) to d) are carried out in a sequence adaptedType: ApplicationFiled: January 16, 2007Publication date: September 6, 2007Inventors: Hilmar Gugel, Marcus Dyba, Volker Seyfried
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Publication number: 20070206276Abstract: A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).Type: ApplicationFiled: January 16, 2007Publication date: September 6, 2007Inventors: Hilmar GUGEL, Marcus DYBA
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Publication number: 20070053059Abstract: A scanning microscope includes an excitation light beam, a stimulation light beam, an objective, an optical component and an optical system. The excitation light beam optically excites a first area of a specimen. The stimulation light beam triggers a stimulated emission or an additional excitation in a second area of the specimen, the second area at least partially overlapping with the first area of the specimen. The objective focuses the excitation light beam and the stimulation light beam. The optical component influences a shape of the focus of the excitation light beam and/or of the stimulation light beam. The optical system images the optical component into the pupil of the objective and adjusts a size of an image of the optical component.Type: ApplicationFiled: August 23, 2004Publication date: March 8, 2007Applicant: Leica Microsystems CMS-GmbHInventor: Hilmar Gugel