Patents by Inventor Hilmar Gugel
Hilmar Gugel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20070025662Abstract: The invention relates to a light source comprising a microstructured optical element (11) that receives and spectrally spreads the light from a primary light source (3). The inventive light source is characterised in that the spectrally spread light penetrates at least one other microstructured optical element (15, 19, 21). Said light source can be efficiently used in scanning microscopy and especially in STED microscopy.Type: ApplicationFiled: September 6, 2004Publication date: February 1, 2007Inventor: Hilmar Gugel
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Publication number: 20060291043Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4? microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.Type: ApplicationFiled: July 20, 2006Publication date: December 28, 2006Applicant: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
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Patent number: 7054062Abstract: The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.Type: GrantFiled: April 5, 2001Date of Patent: May 30, 2006Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Jörg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
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Publication number: 20060007535Abstract: An optical device exhibits a focusing optic that focuses a light beam in a focal plane. A means is envisaged to form the focus of the light beam, whereby the means to form the focus brings about a phase shift between a first part of the light beam and a second part of the light beam. The optical device is characterized in that the means to form the focus exhibits a first interface and a second interface, wherein the first interface reflects the first part of the light beam, and the second interface reflects the second part of the light beam.Type: ApplicationFiled: July 7, 2005Publication date: January 12, 2006Applicant: Leica Microsystems CMS GmbHInventor: Hilmar Gugel
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Patent number: 6891670Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.Type: GrantFiled: February 6, 2002Date of Patent: May 10, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell
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Publication number: 20050078363Abstract: In a scanning microscope that impinges upon a sample with a first light pulse and a second light pulse, a dispersive medium that modifies the time offset between the first and the second light pulse is provided in the beam path of at least one of the light pulses.Type: ApplicationFiled: October 12, 2004Publication date: April 14, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Hilmar Gugel
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Publication number: 20050078361Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: ApplicationFiled: August 17, 2004Publication date: April 14, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
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Patent number: 6801359Abstract: The invention relates to an optical arrangement provided for a spectral fanning out of a light beam (1), preferably the detection beam path of a confocal microscope, especially for the subsequent splitting of the fanned out beam (2) out of the dispersion plane thereof. The optical arrangment is also provided for detecting the fanned out spectral regions (4), whereby the incoming light beam (1) is focused on a pinhole (7). The invention is characterized in that the pinhole (7) has a polygonal passageway (8) in order to realize a high dynamic response when the light beam is split into spectral regions (4) or into spectral colors.Type: GrantFiled: July 27, 2000Date of Patent: October 5, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Heinrich Ulrich, Hilmar Gugel
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Patent number: 6798569Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: GrantFiled: January 4, 2002Date of Patent: September 28, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
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Patent number: 6570705Abstract: The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).Type: GrantFiled: September 18, 2001Date of Patent: May 27, 2003Assignee: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
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Publication number: 20020109913Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.Type: ApplicationFiled: February 6, 2002Publication date: August 15, 2002Inventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell
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Publication number: 20020105723Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: ApplicationFiled: January 4, 2002Publication date: August 8, 2002Inventors: Joerg Bewersdorf, Hilmar Gugel
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Publication number: 20020105722Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4&pgr; microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.Type: ApplicationFiled: January 4, 2002Publication date: August 8, 2002Inventors: Joerg Bewersdorf, Hilmar Gugel
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Publication number: 20020034002Abstract: The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).Type: ApplicationFiled: September 18, 2001Publication date: March 21, 2002Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbHInventors: Joerg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
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Publication number: 20020030886Abstract: The present invention concerns a microscope having an illuminating beam path (1) of a light source (2), a detected beam path (3) of a detector (4), a component (5) combining the detected beam path (3), and at least two microscope objectives (7, 8) directed onto the specimen (6). In order to achieve enhanced detection efficiency, the present invention is characterized in that an optical component (14) arranged in the beam path (1, 3) has the property of acting on a portion of the illuminating and/or detected beam cross section in such a way that the combined detected light (15, 16) is guided in largely lossless fashion to the detector (4). Alternatively thereto, the microscope according to the present invention is characterized in that a polarizing beam splitter (19), arranged in the beam path (1, 3) and acting on the entirety of the illuminating and/or detected beam cross section, is provided.Type: ApplicationFiled: September 14, 2001Publication date: March 14, 2002Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbH.Inventors: Joerg Bewersdorf, Hilmar Gugel
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Publication number: 20010030803Abstract: The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.Type: ApplicationFiled: April 5, 2001Publication date: October 18, 2001Applicant: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Jorg Bewersdorf, Hilmar Gugel, Juergen Hoffmann