Patents by Inventor Hiroaki Wakabayashi

Hiroaki Wakabayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5256789
    Abstract: Compounds having the structure ##STR1## wherein X is nitrogen, oxygen, sulfur or a bond and Z is oxygen or sulfur have been synthesized. These compounds are lipoxygenase inhibitors and are useful as the active agent in pharmaceutical compositions for treating inflammatory conditions in humans and other mammals for which lipoxygenase activity has been implicated.
    Type: Grant
    Filed: February 18, 1992
    Date of Patent: October 26, 1993
    Assignee: Pfizer Inc.
    Inventors: Rodney W. Stevens, Takafumi Ikeda, Hiroaki Wakabayashi, Masami Nakane
  • Patent number: 5104874
    Abstract: A series of 2-amino-5,6-dimethyl-1,4-benzoquinone derivatives, inhibitors of cyclooxygenase and lipoxygenase and useful as antiallergic and antiinflammatory agents.
    Type: Grant
    Filed: December 13, 1990
    Date of Patent: April 14, 1992
    Assignee: Pfizer Inc.
    Inventors: Takafumi Ikeda, Hiroaki Wakabayashi, Masami Nakane
  • Patent number: 5097138
    Abstract: A system and method are provided for compensating for proximity effects between selected adjacent portions of pattern elements on an integrated circuit wafer where it is determined by simulation that undesirable resist patterns will result. The subject lithography system includes projecting an electron beam onto the wafer through an aperture plate of pattern elements to obtain the desired beam pattern. An aperture mask includes a plurality of first portions corresponding to first wafer circuit element portions spaced for avoiding proximity effects on the wafer and a plurality of second portions corresponding to second element portions spaced for obtaining proximity effects between elements on the wafer. The plurality of second portions are sized to have an increased adjacent spacing relative to a resultant adjacent spacing of the corresponding second element portions whereby the resultant adjacent spacing of the second element portions on the wafer is selectively reduced by the proximity effects.
    Type: Grant
    Filed: August 7, 1990
    Date of Patent: March 17, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Hiroaki Wakabayashi, Osamu Suga, Yoshinori Nakayama, Shinji Okazaki