Abstract: A sheet feeding device for manually feeding a sheet to a specified apparatus such as an image forming apparatus is provided with a manual feed tray for guiding a sheet being manually fed, and a pair of cursors provided on the manual feed tray and movable in opposite directions along a sheet width direction normal to a sheet conveyance direction in accordance with the width of the sheet. The pair of cursors are operable such that the front end positions and/or the rear end positions thereof with respect to the sheet conveyance direction are shifted along the sheet conveyance direction.

Abstract: An image forming apparatus includes a fixing section and a guiding section. The guiding section includes first and second guiding members. The first guiding member is in a first conveyance path for a first recording sheet having a first width and contacts the first recording sheet to guide the first recording sheet to a discharging portion. The second guiding member is in an area of a second conveyance path a the second recording sheet having a second width larger than the first width and guides the second recording sheet to the discharge portion at an angle so that a contact length of the second recording sheet with the heating member along a conveyance direction of the second recording sheet is shorter than a contact length of the first recording sheet with the heating member along a conveyance direction of the first recording sheet.

Abstract: The present invention relates to a deuteron generating target having a construction for generating deuteron efficiently, and a deuteron generating target apparatus including the same. The deuteron generating target is constructed by providing an upper film mainly composed of a deuterated organic compound onto a base film mainly composed of a halogen-containing organic compound.

Abstract: There is disclosed a die for forming a honeycomb structure, which realizes a sophisticated formability and which is superior in resistance to wear. A die for forming the honeycomb structure is provided with a die base having two surfaces, one surface is provided with slits of a honeycomb shape, and the other surface is provided with back holes which introduce a forming material therethrough. This die base includes: a die precursor which is obtained by stacking and bonding a first member which is one surface of the die base and is made of a tungsten carbide-based super hard alloy containing at least tungsten carbide, and a second member which is the other surface of the die base and is made of a metal material capable of causing at least one of three phase transformations of martensite transformation, bainite transformation, and pearlite transformation by cooling of an austenite phase together. Tensile and compressive stresses in a mutually bonded surface of the two plate-like members are 1000 MPa or less.

Abstract: The present invention relates to a high-speed particle generating method and so on for generating high-speed particles from a high-speed particle generating target by condensing a pulsed laser beam to a micro-spot on the surface of a high-speed particle generating target. The high-speed particle generating method is a method that generates high-speed particles by condensing a pulsed laser beam generated from a pulsed laser beam generator through an irradiation optical system at a predetermined condensing point, and irradiating the pulsed laser beam to the high-speed particle generating target that is set at the predetermined condensing point, the method including a first step of preparing a reference data, a second step of measuring the wave front of the pulsed laser beam, and a third step of compensating the wave front of the pulsed laser beam based on the reference data.

Abstract: A terahertz wave detector is for detecting a terahertz wave which is emitted from a terahertz wave generator and which is transmitted through a sample. The timing, at which a probe light is irradiated on an optical switching device in the terahertz wave detector, is vibratingly varied by driving a movable reflector in a variable optical delay device at a predetermined vibration frequency. The resultant detection signal generated thereby and changing periodically and vibratingly is subjected to frequency analysis by a spectrum analyzer in a spectroscopic processor. The detection signal has the same temporal waveform as that of the terahertz wave and subjected to scale conversion. Therefore, the frequency analysis of the detection signal enables frequency measurement of a terahertz wave in real time. As a result, real-time spectroscopy is possible, and the device configuration is simplified.

Abstract: A magnetic pick-up coil for measuring magnetic field with high specific sensitivity, optionally with an electrostatic shield (24), having coupling elements (22) with high winding packing ratio, oriented in multiple directions, and embedded in ceramic material for structural support and electrical insulation. Elements of the coil are constructed from green ceramic sheets (200) and metallic ink deposited on surfaces and in via holes of the ceramic sheets. The ceramic sheets and the metallic ink are co-fired to create a monolithic hard ceramic body (20) with metallized traces embedded in, and placed on exterior surfaces of, the hard ceramic body. The compact and rugged coil can be used in a variety of environments, including hostile conditions involving ultra-high vacuum, high temperatures, nuclear and optical radiation, chemical reactions, and physically demanding surroundings, occurring either individually or in combinations.

Abstract: A cleaning device according to the present invention has first seals and a second seal adhered so as to partly overlap each other for sealing a space between a housing of the cleaning device and the surface of a photoreceptive member. The first seals include seal bases and a flocked sheet layered on the seal bases. The portion of the seal base where the second seal overlaps is made smaller in thickness than the portion of the seal base where the second seal does not overlap. Therefore, no step is formed in the overlapped portion, thereby preventing toner leakage.

Abstract: A cleaning device according to the present invention has first seals 7 and a second seal 6 adhered so as to partly overlap each other for sealing a space between a housing 3 of the cleaning device and the surface of a photoreceptive member. The first seals 7 include seal bases 13, 14 and a flocked sheet 12 layered on the seal bases 13, 14. The portion of the seal base 14 where the second seal 6 overlaps is made smaller in thickness than the portion of the seal base 13 where the second seal 6 does not overlap. Therefore, no step is formed in the overlapped portion, thereby preventing toner leakage.

Abstract: A terahertz wave detector is for detecting a terahertz wave which is emitted from a terahertz wave generator and which is transmitted through a sample. The timing, at which a probe light is irradiated on an optical switching device in the terahertz wave detector, is vibratingly varied by driving a movable reflector in a variable optical delay device at a predetermined vibration frequency. The resultant detection signal generated thereby and changing periodically and vibratingly is subjected to frequency analysis by a spectrum analyzer in a spectroscopic processor. The detection signal has the same temporal waveform as that of the terahertz wave and subjected to scale conversion. Therefore, the frequency analysis of the detection signal enables frequency measurement of a terahertz wave in real time. As a result, real-time spectroscopy is possible, and the device configuration is simplified.

Abstract: An electric field measuring apparatus can guide, with a predetermined optical path length, pulse light with a short pulse width output from a laser light source to an object to be measured or an electric field sensor without expansion of the pulse width caused by wavelength dispersion, thereby enabling electric field measurement with a high time resolution. A laser luminous flux incident on an input end of an input optical system is divided by a light dividing section into probe light and pumping light.

Abstract: A trigger circuit is composed of a frequency multiplying portion which receives an electric signal to be measured and multiplies its repetitive frequency so as to output a multiple signal, a comparing portion which receives this multiple signal and outputs a square wave signal corresponding to its value, and a dividing portion which divides the square wave signal so as to output a trigger signal. Accordingly, even when a noise component is superposed on the electric signal to be measured, a trigger signal having little jitter and a repetitive frequency lower than that of the electric signal to be measured is output. Also, the electric field measuring apparatus in accordance with the present invention comprises this trigger circuit and measures, with a highly accurate timing, the electric field of the object to be measured.

Abstract: A processing unit notifies a drive unit of a designated number N (=1, 2, . . . ) The drive unit supplies a drive signal of a frequency f.sub.0 to a target measurement device, and supplies a modulation signal of a frequency N.multidot.f.sub.0 +.DELTA.f to a light source. In this state, an intensity-modulated light beam is emitted from a light source, incident on an E-O probe through an optical system including a PBS and a wave plate, influenced by a periodical voltage waveform generated at a target measurement portion at a fundamental period 1/f.sub.0 to modulate the polarized state, and output from the E-O probe. The optical signal whose polarized state is modulated is input to a photodetector after a polarization direction is selected by the PBS, and heterodyne-detected. The processing unit reproduces the waveform of the voltage signal generated at the target measurement portion by Fourier transform on the basis of the obtained calculation of photodetection signal and displays the waveform.

Abstract: An optical delay apparatus that regularly alternately outputs beams having mutually different delays on one optical axis and that can variably set a delay amount of at least one beam. A motor 112 rotation-drives a rotating plate 111 in which reflective portions and transmissive portions are formed regularly alternately in the circumferential direction. When an incident beam I0 is incident to a reflective portion of the rotating plate 111, it is reflected to generate a beam I1. When the incident beam I0 is incident to a transmissive portion of the rotating plate 111, a beam I2 transmitted is reflected by a reflector 120 to become a beam I3, and the beam I3 is again transmitted by the transmissive portion of the rotating plate 111. This beam I3 has a delay different from that of the beam I1, and the beam I3 and the beam I1 advance regularly alternately in the same direction and on the same optical axis.

Abstract: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

Abstract: In this system, reflected light from an electro-optic probe is detected by a photodetector, and only a voltage signal of a frequency which is an integral multiple of the fundamental frequency of the output voltage from the photodetector is detected. The frequency characteristics of the output voltage from the photodetector can be measured at a high speed and a high accuracy.

Abstract: An electrooptic probe for measuring voltage of an object without contact with the object. The electrooptic probe according to the present invention includes an electro-optic material having a refractive index to light that varies in accordance with an electric field, a conductive reflecting film for reflecting an incident beam transmitted through the electro-optic material, fixed to an end face of the electro-optic material facing the object to be measured, a transparent electrode fixed on the other end face of the electro-optic material, and a high permittivity film fixed on an end face of the reflecting film facing the object to be measured.

Abstract: An apparatus of this invention emits light onto an EO probe and detects the light reflected by the EO probe by using an MSM photodetector. The MSM photodetector is applied with a voltage of a frequency nf.sub.0 +.DELTA.f.

Abstract: A processing unit notifies a drive unit of a designated number N (=1, 2, . . . ). The drive unit supplies a drive signal of a frequency f.sub.0 to a target measurement device, and supplies a modulation signal of a frequency N.multidot.f.sub.0 +.DELTA.f to an optical modulator. In this state, a continuous emission light beam is emitted from a light source, incident on an E-O probe sequentially through a polarizer and a first optical system, influenced by a periodical voltage waveform generated at a target measurement portion at a fundamental period 1/f.sub.0 to modulate the polarized state, and output from the E-O probe. The optical signal whose polarized state is modulated is input to the optical modulator and modulated. Thereafter, a polarization direction is selected by an optical selection unit, and the optical signal is input to an photodetector 510 and heterodyne-detected.

Abstract: Provided is a checking apparatus for array electrode substrate, which can check an array electrode substrate in non-contact and at high speed. A probe assembly includes a plurality of electro-optic probes arranged in the staggered relation. Since this arrangement uses a plurality of (for example, eight, sixteen, twenty, forty, etc.) small electro-optic probes, it becomes equivalent to an arrangement of an elongate electro-optic probe, thereby enabling simultaneous measurement of potentials of numerous unit electrodes. Namely, because a measurement light beam is incident into each electro-optic probe and each reflection-return light is detected by a photodector, potentials of unit electrodes in a number corresponding to the number of electro-optic probes can be simultaneously measured.