Abstract: Provided in the present invention is a bonded tungsten carbide-based super hard alloy assembly equipped with a first metal member having a first bonding surface and comprised of a steel material containing a martensite structure and a second metal member having a second bonding surface directly bonded to the first bonding surface of the first metal member and comprised of a tungsten carbide-based super hard alloy. The martensite structure-containing steel material which constitutes the first metal member is a stainless steel having an average carbon concentration of from 0.10 to 0.40 mass %. The first metal member has a high carbon concentration region at a depth ranging from 0.70 to 3.00 mm from the first bonding surface. The high carbon concentration region has a maximum carbon concentration of from 0.3 to 1.2 mass %. The bonded tungsten carbide-based super hard alloy assembly has both high bonding strength and excellent mechanical strength.

Abstract: In a terahertz-wave spectrometer, a spectroscopic prism is provided with a prism part slidable with respect to a main part thereof. Along the sliding direction, an arrangement surface in an upper face of the prism part is provided with a plurality of arrangement regions K to be arranged with objects to be measured. Therefore, after completing the measurement of optical constants for one object, the prism part is slid, so as to shift the next object onto an optical path of a terahertz wave T, whereby a plurality of objects can be measured smoothly without cleaning the arrangement surface.

Abstract: A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.

Abstract: By mating a main part with a first prism part or second prism part, a terahertz-wave spectrometer can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism. When the main part mates with the first prism part, the terahertz wave T incident on an entrance surface passes through a depression, so as to be reflected by an arrangement part, whereby reflection spectrometry can be performed. When the main part mates with the second prism part, the terahertz wave T incident on the entrance surface is refracted by the depression, so as to pass through an object to be measured within a groove, whereby transmission spectrometry can be preformed.

Abstract: A fixing apparatus includes: a heating rotator, a pressurizing rotator and a fixing housing. The heating rotator is configured to be rotatable about a first rotational axis and has a peripheral surface heated by a heat source provided inside or outside of the heating rotator. The pressurizing rotator is configured to be rotatable about a second rotational axis parallel to the first rotational axis. The pressurizing rotator forms a fixing nip in conjunction with the heating rotator. The fixing housing is configured to accommodate the heating rotator and the pressurizing rotator. The heating rotator, the pressurizing rotator and the fixing housing form a fixing rotator unit. The fixing rotator unit is configured to be withdrawable from an apparatus main body of an image forming apparatus and such that the peripheral surface of the heating rotator is exposed when the fixing rotator unit is withdrawn from the apparatus main body.

Abstract: A terahertz wave generating apparatus 2 includes an excitation light source 10, a transmission-type diffraction grating 32, a variable imaging optical system 61, and a nonlinear optical crystal 70. The transmission-type diffraction grating 32 inputs pulsed excitation light output from the excitation light source 10, and diffracts and outputs the pulsed excitation light. In the transmission-type diffraction grating 32, its orientation is variable with a straight central axis, that is parallel to the grooves and passing through an incident position of a principal ray of the pulsed excitation light. The variable imaging optical system 61 is configured to input the pulsed excitation light diffracted to be output by the transmission-type diffraction grating 32, to form an image of the pulsed excitation light by the transmission-type diffraction grating 32, and its imaging magnification is variable.

Abstract: A heat conduction member includes: a cylindrical ceramic body, a metal pipe on the outer periphery side of the cylindrical ceramic body, and an intermediate member held between the cylindrical ceramic body and the metal pipe. The cylindrical ceramic body has passages passing through from one end face to the other end face and allowing the first fluid to flow therethrough. The intermediate member is made of material having at least a part having a Young's modulus of 150 Gpa or less. The first fluid is allowed to flow through the inside of the cylindrical ceramic body while the second fluid having lower temperature than that of the first fluid is allowed to flow on the outer peripheral face side of the metal pipe to perform heat exchange between the first fluid and the second fluid.

Abstract: A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31.

Abstract: A joined article in which a first metal member made of a tungsten carbide base cemented carbide and a second metal member made of a martensitic stainless steel having a carbon equivalent of 2.5 to 3.5 and containing 0.030 mass % or less of sulfur are joined. The martensitic stainless steel having the carbon equivalent of 2.5 to 3.5 is preferably at least one selected from the group consisting of SUS431, SUS420J1, SUS420J2, SUS410, SUS410J1, S-STAR, PROVA-400, HPM38, STAVAX ESR, and SUS403 in the joined article. There is disclosed a joined article in which the lowering of the strength of a second metal member around a joining interface thereof is prevented.

Abstract: A total reflection terahertz wave measuring apparatus 1 is configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a separator 17, a terahertz wave generating element 20, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53A, a photodetector 53B, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance plane 31a, an exit plane 31b, and a reflection plane 31c.

Abstract: Probe light pulses output from a light source are input to an optical effect unit after the beam diameter is changed by a beam diameter changing optical system, the pulse front is tilted by a pulse front tilting unit, and the beam diameter is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector.

Abstract: Disclosed is an optical element for use in an optical apparatus having a light source which emits a light flux with a wavelength ? (350 nm???450 nm), the optical element containing: a molded portion formed by molding a resin; and one or a plurality of anti-reflection layers formed on the molded portion, wherein at least one of the anti-reflection layers is made of SixOy; and an elemental ratio r (r=y/x) designating an ratio of O to Si in the molecule of SixOy satisfies a requirement represented by Formula (1): 1.40?r?1.80.

Abstract: An image forming apparatus includes a fixing device. The fixing device includes a heating member and a pressing member that form a fixing nip, an approach guide positioned an upstream in a recording-medium conveyance direction of a fixing nip, a fixing-pressure-changing mechanism designed to change the fixing device between a high-pressure mode and a low-pressure mode, and an approach-guide-changing mechanism designed to change an angle of the approach guide in conjunction with the changing by the fixing-pressure-changing mechanism.

Abstract: A honeycomb structure-forming die 1 has a die substrate 22 including a first plate-shaped member 23 having back holes 6 for introducing a raw forming material and a second plate-shaped member 24 having slits 5 for forming the material into a lattice shape. The first plate-shaped member 23 has columnar portions 8 where at least a part is zoned by a slit-shaped groove portion 7 corresponding with a shape of the slit 5 on a bonding face side 28 where the first plate-shaped member 23 is bonded with the second plate-shaped member 24. In the columnar portions 8, the ratio (L/T) of the height L of the columnar portions 8 to the minimum width T in an end face on the bonding face side 28 is within 1/3 to 3.5. Thus constituted die realizes high formability, and two plate-shaped members constituting the die substrate are hardly peeled from each other.

Abstract: A joining jig 5 is constituted of a pair of flat-plate sandwiching portions 17, 18 including sandwiching faces 15 which sandwich therebetween a plate member laminate 4 prepared by laminating two plate members 2, 3 with providing a solder on a joined face between the plate members. The joining jig has a plurality of vapor inflow ports provided in the sandwiching face 15 so that surplus solder vapor on the joined face flows into the vapor inflow ports in a case where the plate member laminate 4 is heated while sandwiching the plate member laminate between the pair; vapor flow paths provided so that the vapor flow paths communicate with the vapor inflow ports; and vapor discharge ports 42 provided in the side surface of the joining jig so that the vapor discharge ports communicate with the vapor flow paths to discharge the vapor of the solder to the outside.

Abstract: An image forming apparatus includes a fixing device that has: a fixing roller heated by induction and a pressing roller brought into press-contact with the fixing roller to fix a toner image borne on a paper sheet conveyed toward the fixing device by a conveyor unit. When a paper sheet having a width smaller than a width of a maximum-width recording medium that can be passed through the fixing device is passed through the fixing device, a non-paper passing region is formed at each end portion of each of the fixing and pressing rollers. Sirocco fans cool the non-paper passing region at a part of an outer peripheral surface of the pressing roller. The pressing roller is disposed opposed to the outer side of the main body of the image forming apparatus.

Abstract: A plate-like shape die 1 for forming a honeycomb structure provided with an introduction portion 3 having plural back holes on one side face (an introduction side) thereof and a formation portion provided with silts 6 communicating with plural back holes 7 on other side face thereof; using for forming a honeycomb shape with passing raw materials being introduced from back holes 7 of an introduction portion 3 through silts 6 being provided on the forming portion 2, wherein the introduction portion 3 is composed of two layers of a plate-like abrasion portion 5 constituting an introduction face 8, and an introduction portion main body 4 located between the abrasion portion 5 and the forming portion 2, and the abrasion portion 5 is detachably disposed on the introduction portion main body 4.

Abstract: A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31.

Abstract: A terahertz wave generating apparatus 2 includes an excitation light source 10, a transmission-type diffraction grating 32, a variable imaging optical system 61, and a nonlinear optical crystal 70. The transmission-type diffraction grating 32 inputs pulsed excitation light output from the excitation light source 10, and diffracts and outputs the pulsed excitation light. In the transmission-type diffraction grating 32, its orientation is variable with a straight central axis, that is parallel to the grooves and passing through an incident position of a principal ray of the pulsed excitation light. The variable imaging optical system 61 is configured to input the pulsed excitation light diffracted to be output by the transmission-type diffraction grating 32, to form an image of the pulsed excitation light by the transmission-type diffraction grating 32, and its imaging magnification is variable.

Abstract: A fixing apparatus includes: a heating rotator, a pressurizing rotator and a fixing housing. The heating rotator is configured to be rotatable about a first rotational axis and has a peripheral surface heated by a heat source provided inside or outside of the heating rotator. The pressurizing rotator is configured to be rotatable about a second rotational axis parallel to the first rotational axis. The pressurizing rotator forms a fixing nip in conjunction with the heating rotator. The fixing housing is configured to accommodate the heating rotator and the pressurizing rotator. The heating rotator, the pressurizing rotator and the fixing housing form a fixing rotator unit. The fixing rotator unit is configured to be withdrawable from an apparatus main body of an image forming apparatus and such that the peripheral surface of the heating rotator is exposed when the fixing rotator unit is withdrawn from the apparatus main body.