Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to one embodiment, an optical test apparatus includes a pump beam generating unit, a probe beam generating unit, and a photodetector. The pump beam generating unit is configured to irradiate a first surface region of a test object with a pump beam having a first wavelength which is transmitted through a first region including the first surface region and a first inner region adjacent to the first surface region and absorbed by an absorber arranged in the first inner region. The probe beam generating unit is configured to irradiate a second surface region outside the first surface region with a probe beam having a second wavelength which is reflected by the second surface region. The photodetector is configured to receive the probe beam reflected by the second surface region.

Abstract: According to one embodiment, a material feeder includes a feeding unit. The feeding unit includes a container that is containable of a powdery material and a first wall that is provided with a plurality of first openings communicated with the container and at least partially covers a region to which the material is fed, the feeding unit feeding the material in the container from the first openings to the region to form a layer of the material.

Abstract: According to one embodiment, an optics includes an incidence part, a first internal total reflection part, and an emission part. The incidence part is where a light beam enters. The first internal total reflection part internally totally reflects a light beam from the incidence part. The emission part emits light beam internally totally reflected by the first internal total reflection part. The first internal total reflection part includes a first ridge part. The first ridge part extends radially from a central axis of the optics. The cross-sectional shape of the first ridge part changes according to a distance from the central axis.

Abstract: According to one embodiment, an optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: The diatheses of animals vary depending on genetic backgrounds of the animals, and the microbial structure of an enterobacterial flora inherent in a host and the behavior of the concentration of a biological molecule sometimes vary depending on the diathesis of the host. In this case, it is needed to administer a proper probiotic. Provided is a microbial preparation for controlling the proportion of the population of bacteria belonging to the division Bacteroidetes, Firmicutes or Proteobacteria or the proportion of the population of bacteria belonging to the genus Clostridium, Lactobacillus, Bifidobacterium or Bacteroidetes in the enterobacterial florae in an animal body, and for controlling the concentration of a functional molecule contained in a living body, said microbial preparation containing a microorganism P01931 (International Accession No. BP-1931) MK-01A (International Accession No. BP-02066) or MK-03A (International Accession No. BP-02067) or a component of the microorganism.

Abstract: An additive manufacturing apparatus includes an operation unit, a first face, a mover, a supplier, and an irradiator. The operation unit includes a first part and a second part that cover a part of a supply region supplied with a powdery material and facing a first direction are aligned in a second direction, and includes a first opening extending between the first part and the second part in the first direction. The first face of the first part faces the second part, and is provided with a second opening. The mover moves the operation unit. The supply unit supplies an inert gas from the second opening to the first opening. The irradiator is spaced apart from the operation unit, and can emit an energy ray to the supply region through the first opening, and change a position with which the energy ray is irradiated.

Abstract: According to one embodiment, a material feeding device includes a feeding unit. The feeding unit includes an electrode unit electrically chargeable by application of voltage thereto and an insulating unit covering the electrode unit, the electrode unit being configured to attract and separate a material to and from a surface of the insulating unit by control of a charged state of the electrode unit.

Abstract: An optical inspection apparatus includes an imaging optical system facing an inspection target, a light guide, a plurality of light sources, and a plurality of mirror surfaces. The light guide has a plurality of corner portions and extending along an optical axis of the imaging optical system. The plurality of light sources face a first end face of the light guide at positions corresponding to the plurality of corner portions. The plurality of mirror surfaces are respectively provided on second end faces of the light guide. Each of the mirror surfaces is oblique relative to the optical axis. The mirror surfaces are configured to reflect light entered into the light guide from the light sources toward the inspection target.

Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.

Abstract: To provide a high-quality group III nitride semiconductor. A group III nitride semiconductor including an n-GaN layer composed of AlxGa1?xN(0?x<1), an InGaN layer disposed on the n-GaN layer and composed of InGaN, an n-AlGaN layer disposed on the InGaN layer and composed of n-type AlyGa1?yN (0?y<1), and a functional layer disposed on the n-AlGaN layer, wherein the concentration of Mg in the n-GaN layer is higher than the concentration of Mg in the n-AlGaN layer.

Abstract: A machining apparatus that need not exchange a processing nozzle when changing a shaping condition, and increases the use efficiency of a material. The processing nozzle that performs processing by ejecting a processing material towards a molten pool formed on a process surface by an energy line includes a cylindrical inner housing that incorporates a path through which the energy line passes, and ejects the energy line from one end. The processing nozzle also includes a cylindrical outer housing that incorporates the inner housing, and has an inner surface tapered in the ejection direction of the energy line ejected from the inner housing. The processing nozzle also includes a slide mechanism that changes, along the energy line, the relative position of the outer housing with respect to the inner housing.

Abstract: An optical processing head capable of reducing the energy loss at the time of optical processing is disclosed. The optical processing head includes a first optical element that converts light emitted by a light source into first parallel light, a second optical element that is arranged downstream of the first optical element and converts the first parallel light into first divergent light, a third optical element that is arranged downstream of the second optical element and converts the first divergent light into second parallel light, and a fourth optical element that is arranged downstream of the third optical element and converts the second parallel light into convergent light which is condensed on the processing surface side.

Abstract: A flow channel structure includes a member including a flow channel. The flow channel includes a first part, second parts, and connections. The first part extends in a first direction. The connections connect the first part and the second parts. The connections include a first bend and a second bend. The first bend arcuately extends with a first curvature and a central angle of greater than 90 degrees. The first bend has a first end connected to the second parts, and a second end. The second bend arcuately extends with a second curvature. The second bend has a third end connected to the second end. A tangent to the first end extends in a same direction as the second parts extend. A tangent to the second end is equal to a tangent to the third end.

Abstract: According to one embodiment, an optical test apparatus includes a first optical system, a second optical system, and an image sensor. The first optical system is configured to pass a light ray of a first wavelength and having telecentricity on an object side for the light ray of the first wavelength. The second optical system is configured to pass a light ray of a second wavelength different from the first wavelength. The image sensor is configured to image an object based on the light ray of the first wavelength having passed through the first optical system and the light ray of the second wavelength having passed through the second optical system.

Abstract: A flip-chip light emitting diode element capable of reducing lateral resistance. The flip-chip light emitting diode element includes a stacked body structure configured by sequentially stacking a first n-type group III nitride semiconductor layer having a carrier concentration that is at least 1×1019 cm?3 but less than 3×1020 cm?3, a second n-type group III nitride semiconductor layer having a carrier concentration that is at least 5×1017 cm?3 but less than 1×1019 cm?3, a light-emitting layer formed by a group III nitride semiconductor, and a p-type group III nitride semiconductor layer. A height of unevenness on an interface between the first n-type group III nitride semiconductor layer and the second n-type group III nitride semiconductor layer is greater than that of unevenness of an interface between the second n-type group III nitride semiconductor layer and the light emitting layer.

Abstract: According to one embodiment, an illumination device includes a plurality of light emitting elements and a plurality of reflectors. The plurality of reflectors include at least one first reflector and at least one second reflector. The first reflector is provided corresponding to the first region at the center and is provided so that the corresponding light emitting element is positioned within a focal region in the vicinity of a focal point. The second reflector is provided corresponding to the second region, has an angular eccentricity so as to collect light on one region on the optical axis, and is provided so as to be positioned within a margin region in which one of the corresponding light emitting elements is provided at a position farther away than a second focal region in the vicinity of the focal point.

Abstract: According to one embodiment, an optical test apparatus includes a photodetector and a processing circuit. The photodetector outputs, as a light receiving signal, information concerning a light direction of received light. The processing circuit processes the light receiving signal to acquire information concerning a standard light direction as a standard and information concerning a passing light direction of passed light which has passed through an object; compares the information concerning the passing light direction with the information concerning the standard light direction, and on the basis of results of the comparison, acquires information concerning internal physical quantities of the object.

Abstract: An optical processing nozzle that homogeneously supplies a fluid to a processing surface in optical processing. The optical processing nozzle includes a beam path that is arranged so that a beam can pass through the beam path towards a processing surface in order to perform processing using a beam guided from a light source, and a channel structure that is arranged around the beam path and is configured to eject a fluid towards the processing surface. The channel structure includes an inflow port through which the fluid flows, at least two passage holes through which the fluid flowing from the inflow port passes, a channel that guides the fluid from the inflow port to the passage holes, and an ejection port from which the fluid having passed through the at least two passage holes is ejected toward the processing surface.

Abstract: According to an embodiment, a nozzle of an additive manufacturing device includes a first inner surface that defines a first path through which an energy ray passes; and a second inner surface that defines a second path that extends along the first path and through which gas and a powder material pass. The first path opens to a leading end of the nozzle. The second path opens to near or around the first path. At least part of the second inner surface includes a first region having a larger friction coefficient for the powder material than the friction coefficient of at least one of the first inner surface and an outer peripheral surface of the leading end.