Abstract: An image forming method using an image forming apparatus including: a latent image carrier whose surface is driven in a sub scanning direction; a deflector which scans a beam spot reciprocally in a main scanning direction substantially perpendicular to the sub scanning direction on the surface of the latent image carrier in the use of an oscillating deflect mirror so as to form spot latent images each of which formed on a pixel; developer which develops each of the spot latent images as a pixel-dot, the method includes of: halftoning for a tone reproduction in which a halftone-dot constituted by the pixel-dot(s) is formed on a cell consisting plural pixels according to a fattening type threshold matrix, wherein a plurality of cells are contiguously arranged in the main scanning direction so as to form a plurality of contiguous locations at each of which the cells adjoin mutually in the main scanning direction, each cell includes a larger-than-four even number of pixels in the sub scanning direction, and the c

Abstract: The present invention provides a developing process including the steps of charging toner particles supported on a developer carrier; and providing the charged toner particles to an electrostatic latent image formed on an image carrier, wherein, the charged toner particles satisfy formulas (1) and (2) shown below, when being measured by the laser doppler method in an oscillation field in an acoustic alleviation cell to determine individual particle size and charged amount thereof: k1=(B2?B1)/(A1?A2)<???(1) B2<0??(2) wherein A1 [?m] and B1 [fC] represent the particle size and the charged amount of the charged toner particle in the division that has the largest number proportion in the distribution divided by the measured particle size and the measured charged amount, respectively; A2 [?m] represents the particle size in the division that has the smallest particle size in the particle size distribution, provided that the number proportion of the division is 1% or more; and B2 [fC] represents the charge

Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.

Abstract: A method for controlling an optical scanning apparatus, includes generating an exposing signal from a pattern data for an optical scanning apparatus, which includes a light source that emits a light beam, a deflector that deflects the light beam emitted from the light source by means of a deflection mirror surface oscillating sinusoidally, and a scanning optical system that has an arcsine characteristics and that images the light beam deflected by the deflector on a surface-to-be-scanned in a spot, and which makes the imaged spot scan the surface-to-be-scanned in the main scanning direction while modulating the light beam emitted from the light source based upon the pattern data indicating a position on the surface-to-be-scanned the light beam exposes so that the light beam exposes a predetermined position on the surface-to-be-scanned, the exposing signal being a train of pulses arranged on a time axis in accordance with an arrangement in the main scanning direction of values, which the pattern data have, ind

Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.

Abstract: An image forming method using an image forming apparatus including: a latent image carrier whose surface is driven in a sub scanning direction; a deflector which scans a beam spot reciprocally in a main scanning direction substantially perpendicular to the sub scanning direction on the surface of the latent image carrier in the use of an oscillating deflect mirror so as to form spot latent images each of which formed on a pixel; developer which develops each of the spot latent images as a pixel-dot, the method includes of: halftoning for a tone reproduction in which a halftone-dot constituted by the pixel-dot(s) is formed on a cell consisting plural pixels according to a fattening type threshold matrix, wherein a plurality of cells are contiguously arranged in the main scanning direction so as to form a plurality of contiguous locations at each of which the cells adjoin mutually in the main scanning direction, each cell includes a larger-than-four even number of pixels in the sub scanning direction, and the c

Abstract: An image forming apparatus, includes: a latent image carrier whose surface includes an effective image region spanning across a predetermined width in a main scanning direction and is driven in a sub scanning direction approximately orthogonal to the main scanning direction; a latent image former which has a light source and a deflection mirror oscillating, and deflects a light beam from the light source using the deflection mirror so as to scan the effective image region with the deflected light beam; and a scanning mode controller which switches selectively between a single-side scanning mode and a double-side scanning mode, the single-side scanning mode being a mode in which the light beam is scanned only in a first direction included in the main scanning direction, the double-side scanning mode being a mode in which the light beam is scanned in both the first direction and a second direction opposite to the first direction, wherein a condition to form latent images on the latent image carrier in the singl

Abstract: The present invention provides an optical information reading apparatus capable of producing uniform and bright illumination light and of projecting the illumination light onto an appropriate position on an object of reading at all times. In the apparatus, a light-receiving optical system including a light-receiving sensor and an image formation lens is provided and illumination optical systems each including an LED and an illumination lens device are placed on both sides of the image formation lens. The illumination optical systems are integrally connected to each other through a connecting portion to form a lens-connected assembly. In an incident surface of the illumination lens device, a plurality of convex lens tiers and a plurality of concave lens tiers are alternately made smoothly to form a multi-tiered lens surface, and an output surface thereof is made into a gentle cylindrical configuration to form a rod-like lens surface.

Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.

Abstract: A color image forming apparatus includes a plurality of image carriers for at least one color, a plurality of developing devices, each developing a toner image onto each image carrier, a plurality of charging devices, each charging the each image carrier, a first power source, connected to the developing devices in common, a second power source, connected to the charging devices in common, and a controller, changing a process control of at least one of the charging devices and the developing devices in accordance with a color image forming operation and a monochrome image forming operation.

Abstract: A developing method, including the steps of: carrying one-component non-magnetic toner on a developer carrier; pressing the one-component non-magnetic toner by a regulating member so as to regulate a transporting quantity of the one-component non-magnetic toner so that the one-component non-magnetic toner is charged; forming an electrostatic latent image on an image carrier; providing the one-component non-magnetic toner to the electrostatic latent image so as to convert the electrostatic latent image into a visible toner image; and controlling the one-component non-magnetic toner so that the one-component non-magnetic toner pressed by the regulating member satisfies the following relationship: B/A?1, where A represents a width [?m] of a particle size distribution of the one-component non-magnetic toner; and B represents a width [fC] of a charge quantity distribution of the one-component non-magnetic toner.

Abstract: An electrostatic latent image is formed on an image carrier. A first roller is opposed to the image carrier with a gap in between. A second roller is in contact with the first roller such that toner of a one-component type is supplied onto the image carrier by way of the first roller to develop the electrostatic latent image as a visible toner image. A single power source supplies a bias voltage in which an AC voltage is superposed on a DC bias voltage. The bias voltage is supplied to the first roller through a first path and to the second roller through a second path. A resistor is provided on the first path between the first roller and a branching point of the first path and the second path.

Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.

Abstract: The apparatus is adapted to deflect a light beam from a laser light source for each of the color components by means of a deflection mirror surface which oscillates, thereby making the light beam reciprocally scan in a main scanning direction. In this apparatus, however, only a light beam SL which scans in a first direction (+X) of the main scanning direction is irradiated in an effective image region on a photosensitive member, so as to form a latent image thereon. The resultant latent image is developed to form a toner image. Since image formation is performed using only the light beam SL which scans in the first direction (+X), the images may be formed at the consistent density irrespective of the image types. Furthermore, the scanning directions of the light beams SL for all the color components are uniformly defined to be the first direction (+X), so that the toner images of the respective colors may maintain the consistent density.

Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.

Abstract: Problems encountered in the conventional inspection method and the conventional apparatus adopting the method are solved by the present invention using an electron beam by providing a novel inspection method and an inspection apparatus adopting the novel method which are capable of increasing the speed to scan a specimen such as a semiconductor wafer. The inspection novel method provided by the present invention comprises the steps of: generating an electron beam; converging the generated electron beam on a specimen by using an objective lens; scanning the specimen by using the converged electron beam; continuously moving the specimen during scanning; detecting charged particles emanating from the specimen at a location between the specimen and the objective lens and converting the detected charged particles into an electrical signal; storing picture information conveyed by the electrical signal; comparing a picture with another by using the stored picture information; and detecting a defect of the specimen.

Abstract: A vibration-to-electric energy generator using a resonant variable capacitor (RVC) which converts vibration energy to electric energy in an environment where any kind of vibration may occur, the generator can generate electricity optimally and adaptive to change in frequency, amplitude, and phase of vibration energy. The generator includes RVC, initial charge assurance circuit, start and halt circuit, reference clock generator, pulse generation circuit, charge transportation circuit, and output control circuit. The initial charge assurance circuit and start and halt circuit control and save the conditions of electricity generating operation. The reference clock generator and pulse generation circuit generate reference signal and timing control signals in sync with vibration energy applied to the generator. By timing control signals, the charge transportation circuit charges and discharges the RVC, thus generating electric energy. The output control circuit stabilizes generated electric power.

Abstract: A developing method, including the steps of: carrying one-component non-magnetic toner on a developer carrier; pressing the one-component non-magnetic toner by a regulating member so as to regulate a transporting quantity of the one-component non-magnetic toner so that the one-component non-magnetic toner is charged; forming an electrostatic latent image on an image carrier; providing the one-component non-magnetic toner to the electrostatic latent image so as to convert the electrostatic latent image into a visible toner image; and controlling the one-component non-magnetic toner so that the one-component non-magnetic toner pressed by the regulating member satisfies the following relationship: B/A?1, where A represents a width [?m] of a particle size distribution of the one-component non-magnetic toner; and B represents a width [fC] of a charge quantity distribution of the one-component non-magnetic toner.

Abstract: An electrostatic latent image is formed on an image carrier. A first roller is opposed to the image carrier with a gap in between. A second roller is in contact with the first roller such that toner of a one-component type is supplied onto the image carrier by way of the first roller to develop the electrostatic latent image as a visible toner image. A single power source supplies a bias voltage in which an AC voltage is superposed on a DC bias voltage. The bias voltage is supplied to the first roller through a first path and to the second roller through a second path. A resistor is provided on the first path between the first roller and a branching point of the first path and the second path.

Abstract: It was hard for conventional SEMs to take measurements at a high speed and take accurate measurements when an insulator exists between an object to probe and the detector, because the conventional SEMs used a continuous electron beam. Also, it was impossible to apply voltage to the sample during the measurement of current. By pulse-modulating the electron beam and extracting a high-frequency signal component from the sample, new SEM equipment disclosed herein detects electrons absorbed in the sample at a high speed and with precision. Precise and high-speed absorption current measurements can be achieved. High-functionality inspection apparatus can be provided.