Abstract: According to one embodiment, an optical imaging apparatus includes a polarizer assembly, a polarization image sensor, and a lens assembly. The polarizer assembly is configured to acquire a first light ray of a first polarization component and a second light ray of a second polarization component which is different from the first polarization component, by using a light flux from an identical direction. The polarization image sensor is located in a position facing the polarizer assembly. The polarization image sensor is configured to acquire an image of the first polarization component and an image of the second polarization component at once or at the same time. The lens assembly includes a first lens configured to form the images on the polarization image sensor.

Abstract: According to an embodiment, a non-transitory storage medium stores an optical inspection program. The optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.

Abstract: According to an embodiment, an optical inspection apparatus includes: an illumination portion, a wavelength selection portion and an imaging portion. The illumination portion irradiates a first object point of a surface of an object with first illumination light, and a second object point of the surface of the object with second illumination light. The imaging portion images light from the first object point through the wavelength selection portion when a normal direction at the first object point and a direction of the first illumination light have an opposing relationship, and images light from the second object point through the wavelength selection portion when a normal direction at the second object point and a direction of the second illumination light have an opposing relationship.

Abstract: According to the embodiment, an optical imaging apparatus includes: an illuminator, a lens, an aperture, and an imaging element. Light is incident into the lens through an inspection object provided where the parallel light from the illuminator reaches. The light has passed through the solvent and the target, and/or through the solvent. The aperture is disposed on a focal plane of the lens. The aperture includes a passage region and a light-blocking region. The passage region allows passage of diffracted light in a direction different from a direction of the parallel light due to the target from the parallel light from the illuminator. The light-blocking region blocks the parallel light having passed through the solvent.

Abstract: According to the embodiment, an optical inspection method includes: emitting, acquiring, and comparing. The emitting includes emitting light beams having a first wavelength and a second wavelength toward an imaging unit in accordance with light beam directions from a subject, with light beam intensities of the first wavelength and the second wavelength being in a complementary relationship. The acquiring includes acquiring each of information of a first image related to the first wavelength and information of a second image related to the second wavelength with the imaging unit. The comparing includes comparing the information of the first image and the information of the second image to extract unevenness information of the subject.

Abstract: According to an embodiment, an optical apparatus includes an illumination unit, a light-receiving unit and a processing unit. The illumination unit can illuminate an object with a plurality of pattern rays including rays with different wavelengths simultaneously. The light-receiving unit includes a pixel that can receive the rays from the object to disperse at least two of the different wavelengths included in the pattern rays. The processing unit acquires information on the object based on a result of the pixel of the light-receiving unit receiving the pattern rays with which the illumination unit illuminates the object simultaneously.

Abstract: According to an embodiment, an optical inspection method includes calculating irradiation field information concerning an irradiation field on a surface of a subject when irradiating the surface of the subject with a light beam from an illumination device that is supported by a movable body and moved; and performing path calculation processing of calculating, based on the irradiation field information, a path for the illumination device to move.

Abstract: According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.

Abstract: According to one embodiment, an optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: According to an embodiment, an optical apparatus includes a lighting unit, an imaging unit, and a processor. The lighting unit emits illumination rays. The imaging unit includes: a wavelength selecting unit including first and second wavelength selection regions; and a sensor. The first wavelength selection region converts a first ray passing through the first wavelength selection region into a first selected ray. The second wavelength selection region converts a second ray passing through the second wavelength selection region into a second selected ray. The sensor can acquire color phase information indicating color phases of the first selected ray and the second selected ray. The processor estimates a ray direction of the first ray and a ray direction of the second ray based on the color phase information and a relative position of the wavelength selecting unit in the imaging unit.

Abstract: An optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.

Abstract: In an embodiment, a processing device relating to an inspection of an inspection object by a photography unit is provided. A processor of the processing device calculates a plurality of photography points as positions photographing the inspection object based on shape data in which a shape of a surface of the inspection object is indicated by a point group, and information relating to a position and a normal vector on the surface of the inspection object is defined by the point group. The processor executes analysis regarding a path that passes through all of the calculated photography points and minimizes a sum of a movement cost from each of the photography points to a photography point of a next movement destination, and calculates a path corresponding to an analysis result as a path for moving the photography unit.

Abstract: According to an embodiment, an optical apparatus includes an illumination unit, a light-receiving unit and a processing unit. The illumination unit can illuminate an object with a plurality of pattern rays including rays with different wavelengths simultaneously. The light-receiving unit includes a pixel that can receive the rays from the object to disperse at least two of the different wavelengths included in the pattern rays. The processing unit acquires information on the object based on a result of the pixel of the light-receiving unit receiving the pattern rays with which the illumination unit illuminates the object simultaneously.

Abstract: According to the embodiment, an optical inspection method includes: emitting, acquiring, and comparing. The emitting includes emitting light beams having a first wavelength and a second wavelength toward an imaging unit in accordance with light beam directions from a subject, with light beam intensities of the first wavelength and the second wavelength being in a complementary relationship. The acquiring includes acquiring each of information of a first image related to the first wavelength and information of a second image related to the second wavelength with the imaging unit. The comparing includes comparing the information of the first image and the information of the second image to extract unevenness information of the subject.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to one embodiment, an optical inspection apparatus includes a first illuminator, an image-forming optical system, a scattering light selector, and an imaging element. The first illuminator is configured to emit a first light beam. The first light beam reflected by an object is incident on the image-forming optical system. The scattering light selector is configured to emit passing light beams of at least two mutually different wavelength regions, at the same time as the first light beam passes, a wavelength spectrum of at least one of the passing light beams being different from a wavelength spectrum of the reflected first light beam. The passing light beams simultaneously form an image on the imaging element.

Abstract: According to an embodiment, an optical device includes a light selection unit, an imaging element, and a deriving unit. The light selection unit splits an irradiated light beam into a plurality of spectral beams of different wavelength regions. The imaging element captures a subject irradiated with the spectral beams including beams of at least two different wavelengths to acquire a spectral image. The deriving unit derives a surface property or shape information of the subject from a specified result obtained by specifying, by the deriving unit, an irradiation region irradiated with each of the spectral beams on the subject based on a mixing ratio of the spectral beams and received light intensity of each of the spectral beams included in the spectral image.

Abstract: According to one embodiment, an optical test apparatus includes a first optical system, a second optical system, and an image sensor. The first optical system is configured to pass a light ray of a first wavelength and having telecentricity on an object side for the light ray of the first wavelength. The second optical system is configured to pass a light ray of a second wavelength different from the first wavelength. The image sensor is configured to image an object based on the light ray of the first wavelength having passed through the first optical system and the light ray of the second wavelength having passed through the second optical system.