Abstract: According to an embodiment, an optical apparatus includes a lighting unit, an imaging unit, and a processor. The lighting unit emits illumination rays. The imaging unit includes: a wavelength selecting unit including first and second wavelength selection regions; and a sensor. The first wavelength selection region converts a first ray passing through the first wavelength selection region into a first selected ray. The second wavelength selection region converts a second ray passing through the second wavelength selection region into a second selected ray. The sensor can acquire color phase information indicating color phases of the first selected ray and the second selected ray. The processor estimates a ray direction of the first ray and a ray direction of the second ray based on the color phase information and a relative position of the wavelength selecting unit in the imaging unit.

Abstract: According to an embodiment, an optical device includes a light selection unit, an imaging element, and a deriving unit. The light selection unit splits an irradiated light beam into a plurality of spectral beams of different wavelength regions. The imaging element captures a subject irradiated with the spectral beams including beams of at least two different wavelengths to acquire a spectral image. The deriving unit derives a surface property or shape information of the subject from a specified result obtained by specifying, by the deriving unit, an irradiation region irradiated with each of the spectral beams on the subject based on a mixing ratio of the spectral beams and received light intensity of each of the spectral beams included in the spectral image.

Abstract: According to one embodiment, an optical inspection apparatus includes a first illuminator, an image-forming optical system, a scattering light selector, and an imaging element. The first illuminator is configured to emit a first light beam. The first light beam reflected by an object is incident on the image-forming optical system. The scattering light selector is configured to emit passing light beams of at least two mutually different wavelength regions, at the same time as the first light beam passes, a wavelength spectrum of at least one of the passing light beams being different from a wavelength spectrum of the reflected first light beam. The passing light beams simultaneously form an image on the imaging element.

Abstract: According to one embodiment, an optical imaging apparatus includes a polarizer assembly, a polarization image sensor, and a lens assembly. The polarizer assembly is configured to acquire a first light ray of a first polarization component and a second light ray of a second polarization component which is different from the first polarization component, by using a light flux from an identical direction. The polarization image sensor is located in a position facing the polarizer assembly. The polarization image sensor is configured to acquire an image of the first polarization component and an image of the second polarization component at once or at the same time. The lens assembly includes a first lens configured to form the images on the polarization image sensor.

Abstract: A multi-view optical system includes an optical element. The optical element is configured to direct, in a predetermined direction, a first polarization component of a light beam coming from a first visual field, and a second polarization component, which is different from the first polarization component, of a light beam coming from a second visual field different from the first visual field.

Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.

Abstract: According to one embodiment, an optical test apparatus includes a first optical system, a second optical system, and an image sensor. The first optical system is configured to pass a light ray of a first wavelength and having telecentricity on an object side for the light ray of the first wavelength. The second optical system is configured to pass a light ray of a second wavelength different from the first wavelength. The image sensor is configured to image an object based on the light ray of the first wavelength having passed through the first optical system and the light ray of the second wavelength having passed through the second optical system.

Abstract: According to one embodiment, an edge detection device includes a light source, an imaging part, and a detector. The light source includes at least three light-emitting parts for irradiating a plurality of objects adjacent with a light. The imaging part images a surface of the objects irradiated by each of the light-emitting parts, and generates a plurality of image data of the surface. The detector detects edges of the surface imaged, based on at least two different combinations of the plurality of image data.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to one embodiment, an optical test apparatus includes a first optical system, a second optical system, and an image sensor. The first optical system is configured to pass a light ray of a first wavelength and having telecentricity on an object side for the light ray of the first wavelength. The second optical system is configured to pass a light ray of a second wavelength different from the first wavelength. The image sensor is configured to image an object based on the light ray of the first wavelength having passed through the first optical system and the light ray of the second wavelength having passed through the second optical system.

Abstract: A multi-view optical system includes an optical element. The optical element is configured to direct, in a predetermined direction, a first polarization component of a light beam coming from a first visual field, and a second polarization component, which is different from the first polarization component, of a light beam coming from a second visual field different from the first visual field.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to one embodiment, an optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.

Abstract: According to one embodiment, an optical test apparatus includes a first optical system, a second optical system, and an image sensor. The first optical system is configured to pass a light ray of a first wavelength and having telecentricity on an object side for the light ray of the first wavelength. The second optical system is configured to pass a light ray of a second wavelength different from the first wavelength. The image sensor is configured to image an object based on the light ray of the first wavelength having passed through the first optical system and the light ray of the second wavelength having passed through the second optical system.

Abstract: According to one embodiment, an optical test apparatus includes a photodetector and a processing circuit. The photodetector outputs, as a light receiving signal, information concerning a light direction of received light. The processing circuit processes the light receiving signal to acquire information concerning a standard light direction as a standard and information concerning a passing light direction of passed light which has passed through an object; compares the information concerning the passing light direction with the information concerning the standard light direction, and on the basis of results of the comparison, acquires information concerning internal physical quantities of the object.

Abstract: An apparatus according to an embodiment comprises: a laser source that outputs a laser beam; an optical system that modifies the laser beam, and directs the modified laser beam onto a test object; a signal detector that detects a change of signal in the process of irradiating the test object with the modified laser beam; and a computer system that performs a failure analysis based on the change detected by the signal detector, wherein the optical system modifies the laser beam so that the modified laser beam generates an irradiation zone that includes a first intensity component of which peak intensity is near an irradiation axis and a second intensity component of which peak intensity is around the irradiation axis.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to one embodiment, an optical test apparatus includes a photodetector and a processing circuit. The photodetector outputs, as a light receiving signal, information concerning a light direction of received light. The processing circuit processes the light receiving signal to acquire information concerning a standard light direction as a standard and information concerning a passing light direction of passed light which has passed through an object; compares the information concerning the passing light direction with the information concerning the standard light direction, and on the basis of results of the comparison, acquires information concerning internal physical quantities of the object.

Abstract: According to one embodiment, as optical test apparatus includes a pump beam generating unit, a probe beam generating unit; and a photodetector. The pump beam generating unit generates a pump beam for exciting an elastic wave in a specimen. The probe beam generating unit generates a probe beam. The photodetector receives the probe beam. A first light penetration depth of the probe beam relative to the specimen is longer than a second light penetration depth of the pump beam relative to the specimen.