Abstract: A semiconductor integrated circuit device with a “PAD on I/O cell” structure in which a pad lead part is disposed almost in the center of an I/O part so as to reduce the chip layout area. In the I/O part, a transistor lies nearest to the periphery of the semiconductor chip. When seen in a plan view of the I/O part, a resistance lies above the transistor and a first and a second diode lie above the resistance; a second transistor lies above the diodes; and a logic block lies above the second transistor with a pad lead part, for example, formed in a metal wiring layer, therebetween. This permits the pad through the second transistor to be on the same node and therefore the pad lead part can be disposed almost in the center of the I/O part.

Abstract: A semiconductor integrated circuit device with a “PAD on I/O cell” structure in which a pad lead part is disposed almost in the center of an I/O part so as to reduce the chip layout area. In the I/O part, a transistor lies nearest to the periphery of the semiconductor chip. When seen in a plan view of the I/O part, a resistance lies above the transistor and a first and a second diode lie above the resistance; a second transistor lies above the diodes; and a logic block lies above the second transistor with a pad lead part, for example, formed in a metal wiring layer, therebetween. This permits the pad through the second transistor to be on the same node and therefore the pad lead part can be disposed almost in the center of the I/O part.

Abstract: A semiconductor integrated circuit device comprises I/O cells arranged around a core region. Each of the I/O cells comprises a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit. An I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlap with a region in which a pad for the I/O cell is arranged. The I/O logic region and the I/O buffer region are arranged side by side in a direction parallel to a side of the core region.

Abstract: A semiconductor integrated circuit device comprises I/O cells arranged around a core region. Each of the I/O cells comprises a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit. An I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlap with a region in which a pad for the I/O cell is arranged. The I/O logic region and the I/O buffer region are arranged side by side in a direction parallel to a side of the core region.

Abstract: A semiconductor integrated circuit device comprises I/O cells arranged around a core region. Each of the I/O cells comprises a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit. An I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlap with a region in which a pad for the I/O cell is arranged. The I/O logic region and the I/O buffer region are arranged side by side in a direction parallel to a side of the core region.

Abstract: A semiconductor integrated circuit device comprises I/O cells arranged around a core region. Each of the I/O cells comprises a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit. An I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlap with a region in which a pad for the I/O cell is arranged. The I/O logic region and the I/O buffer region are arranged side by side in a direction parallel to a side of the core region.

Abstract: A semiconductor integrated circuit device comprises I/O cells arranged around a core region. Each of the I/O cells comprises a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit. An I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlap with a region in which a pad for the I/O cell is arranged. The I/O logic region and the I/O buffer region are arranged side by side in a direction parallel to a side of the core region.

Abstract: A semiconductor integrated circuit device with a “PAD on I/O cell” structure in which a pad lead part is disposed almost in the center of an I/O part so as to reduce the chip layout area. In the I/O part, a transistor lies nearest to the periphery of the semiconductor chip. When seen in a plan view of the I/O part, a resistance lies above the transistor and a first and a second diode lie above the resistance; a second transistor lies above the diodes; and a logic block lies above the second transistor with a pad lead part, for example, formed in a metal wiring layer, therebetween. This permits the pad through the second transistor to be on the same node and therefore the pad lead part can be disposed almost in the center of the I/O part.

Abstract: A protection circuit with suppressed erroneous operation due to power source fluctuation has a first resistor and a capacitor connected in series between a power source line and a ground line, an inverter with an input connected between the first resistor and the capacitor, and a MOS transistor with a gate electrode that receives an output of the inverter and with a drain electrode and source electrode connected to the power source line and the ground line. When high voltage fluctuation occurs in the power source line, a level change at a connection point between the first resistor and the capacitor is delayed according to a time constant. By the delay, the MOS transistor that receives an output of the inverter is temporarily turned on and discharges a high voltage to the ground line.

Abstract: A semiconductor integrated circuit device with a “PAD on I/O cell” structure in which a pad lead part is disposed almost in the center of an I/O part so as to reduce the chip layout area. In the I/O part, a transistor lies nearest to the periphery of the semiconductor chip. When seen in a plan view of the I/O part, a resistance lies above the transistor and a first and a second diode lie above the resistance; a second transistor lies above the diodes; and a logic block lies above the second transistor with a pad lead part, for example, formed in a metal wiring layer, therebetween. This permits the pad through the second transistor to be on the same node and therefore the pad lead part can be disposed almost in the center of the I/O part.

Abstract: The present invention is provided to suppress occurrence of an erroneous operation in a protection circuit due to a relatively small power source fluctuation such as a power source noise. The protection circuit has a first resistor and a capacitor connected in series between a power source line and a ground line, an inverter whose input is connected between the first resistor and the capacitor, and a MOS transistor whose gate electrode receives an output of the inverter and whose drain electrode and source electrode are connected to the power source line and the ground line. When a high voltage fluctuation occurs in the power source line, a level change at a connection point between the first resistor and the capacitor is delayed according to a time constant. By the delay, the MOS transistor that receives an output of the inverter is temporarily turned on and discharges a high voltage to the ground line.

Abstract: A protection circuit with suppressed erroneous operation due to power source fluctuation has a first resistor and a capacitor connected in series between a power source line and a ground line, an inverter with an input connected between the first resistor and the capacitor, and a MOS transistor with a gate electrode that receives an output of the inverter and with a drain electrode and source electrode connected to the power source line and the ground line. When a high voltage fluctuation occurs in the power source line, a level change at a connection point between the first resistor and the capacitor is delayed according to a time constant. By the delay, the MOS transistor that receives an output of the inverter is temporarily turned on and discharges a high voltage to the ground line.

Abstract: A vehicle control apparatus for controlling a prime mover and wheel brakes which are equipped in a vehicle with an automatic transmission. The vehicle control apparatus includes a prime mover stopping unit which stops and restarts the prime mover under predetermined conditions, and a braking force retaining unit which retains braking force of each of the wheel brakes. Even if the automatic transmission is set in a neutral range, the braking force retaining unit is controlled to retain the braking force of the wheel brakes for a first predetermined time after the operation of a brake operation member is disengaged.

Abstract: A vehicle control apparatus for controlling a prime mover and wheel brakes which are equipped in a vehicle with an automatic transmission. The vehicle control apparatus includes a prime mover stopping unit which stops and restarts the prime mover under predetermined conditions, and a braking force retaining unit which retains braking force of each of the wheel brakes. Even if the automatic transmission is set in a neutral range, the braking force retaining unit is controlled to retain the braking force of the wheel brakes for a first predetermined time after the operation of a brake operation member is disengaged.

Abstract: A braking force retaining unit has a cut-off valve and a control unit. The cut-off valve retains predetermined brake hydraulic pressure at the wheel cylinders until a predetermined releasing condition is established, even after the depression of a brake pedal is released when a vehicle is stopped. When the predetermined releasing condition is established, the retained brake hydraulic pressure is released, when the depression of the brake pedal is released, the control unit controls the cut-off valve so as to retain the brake hydraulic pressure while reducing the retained brake hydraulic pressure at a first reduction rate. When the predetermined releasing condition is established, the control unit controls the cut-off valve so as to allow the retained brake hydraulic pressure to be reduced at a second reduction rate which is faster than the first reduction rate.

Abstract: A braking force retaining unit has a cut-off valve and a control unit. The cut-off valve retains predetermined brake hydraulic pressure at the wheel cylinders until a predetermined releasing condition is established even after the depression of a brake pedal is released when a vehicle is stopped, whereas when the predetermined releasing condition is established, the brake hydraulic pressure so retained is released, when the depression of the brake pedal is released, the control unit controls the cut-off valve so as to retain the brake hydraulic pressure while reducing the retained brake hydraulic pressure at a first reduction speed. When the predetermined releasing condition is established, the control unit controls the cut-off valve so as to allow the brake hydraulic pressure retained at the wheel cylinders to be reduced at a second reduction speed which is faster than the first reduction speed.

Abstract: The present invention is provided to suppress occurrence of an erroneous operation in a protection circuit due to a relatively small power source fluctuation such as a power source noise. The protection circuit has a first resistor and a capacitor connected in series between a power source line and a ground line, an inverter whose input is connected between the first resistor and the capacitor, and a MOS transistor whose gate electrode receives an output of the inverter and whose drain electrode and source electrode are connected to the power source line and the ground line. When a high voltage fluctuation occurs in the power source line, a level change at a connection point between the first resistor and the capacitor is delayed according to a time constant. By the delay, the MOS transistor that receives an output of the inverter is temporarily turned on and discharges a high voltage to the ground line.

Abstract: The invention intends to provide a semiconductor device capable of preventing an electrostatic breakdown especially by the CDM, of the electrostatic breakdowns generated between plural power supply systems, with a few number of protection circuits. The semiconductor device includes a first circuit block that operates with a first power supply voltage and a first reference voltage, and a second circuit block that operates with a second power supply voltage and a second reference voltage. Further, the semiconductor device includes a first clamp circuit that clamps a potential between the first power supply voltage and the second reference voltage, a second clamp circuit that clamps a potential between the second power supply voltage and the first reference voltage, and a third clamp circuit that clamps a potential between the first reference voltage and the second reference voltage.

Abstract: A braking force retaining unit includes a cut-off valve disposed between a master cylinder and wheel cylinders in a brake hydraulic circuit. The cut-off valve being adopted to retain predetermined brake hydraulic pressure until a predetermined releasing condition is established even after the depression of a brake pedal is released when a vehicle is stopped, a one-way valve provided in parallel with the cut-off valve and adapted to permit a one-way passage of a brake fluid from a master cylinder side to a wheel cylinder side, a further application detecting sensor for detecting a further application of brakes, a further application determination unit for determining on an existence of the further application of brakes based an input from the further application detecting sensor and a valve control unit for opening the cut-off valve when the further application determination unit determines that the further application of brakes is occurred.

Abstract: A first clamp circuit and a second clamp circuit stacked thereon in vertical respectively for clamping unwanted level voltages are provided between the high potential side power source and low potential side power source and an intermediate node formed by vertical stacking of the first clamp circuit and second clamp circuit is coupled with the power source for internal circuit. Since a capacitor originally provided in the internal circuit is allocated in parallel to the first clamp circuit, impedance is reduced due to existence of the capacitor and potential difference due to over-current flowing in the chip is reduced. Accordingly, potential difference due to over-current flowing into the chip may be reduced and static electricity dielectric strength can be improved by allowing higher over-current. Thereby, impedance when the clamp circuits are stacked in two stages.