Patents by Inventor Hitoshi Kasai
Hitoshi Kasai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240300979Abstract: The problem to be solved by the present invention is to provide novel organic nanoparticles and a novel compound for constituting the organic nanoparticles. The present invention provides a compound represented by the following formula (1) or a salt thereof: wherein R1s are the same or different and each represent hydrogen, a hydroxy group, or a carbon-containing organic group; and R2s are the same or different and each represent an optionally substituted ethylene group or trimethylene group.Type: ApplicationFiled: January 14, 2022Publication date: September 12, 2024Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCYInventors: Hitoshi KASAI, Keita TANITA, Yoshitaka KOSEKI
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Publication number: 20240241334Abstract: A slot type optical fiber cable includes a slot rod including a plurality of ribs for forming a plurality of slot grooves, and a plurality of optical fibers accommodated in the slot grooves. The number of the slot grooves is three or four.Type: ApplicationFiled: July 6, 2022Publication date: July 18, 2024Inventors: Fumiaki SATO, Eimi KASAI, Kenta TSUCHIYA, Yuuki SHIMODA, Takao HIRAMA, Satomi IDO, Kentaro TAKEDA, Hitoshi TSUBAKIYAMA, Ken TAKAHASHI
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Patent number: 11407772Abstract: The present invention provides: industrially desirable and novel optically-active cyclopentenone derivatives; and a novel industrial manufacturing method. The novel optically-active cyclopentenone derivatives and method for manufacturing the same are, respectively: an intermediate for industrially desirable and novel prostaglandin derivatives and the like; and a method for manufacturing the same. It is expected that the present invention will be commercialized and industrialized.Type: GrantFiled: September 13, 2019Date of Patent: August 9, 2022Assignees: Tohoku University, Genesis Research Institute, Inc., Ouchi Shinko Chemical Industrial Co., Ltd.Inventors: Hitoshi Kasai, Yoshitaka Koseki, Takaaki Kamishima, Shigenobu Aoyagi
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Publication number: 20210300953Abstract: The present invention provides: industrially desirable and novel optically-active cyclopentenone derivatives; and a novel industrial manufacturing method. The novel optically-active cyclopentenone derivatives and method for manufacturing the same are, respectively: an intermediate for industrially desirable and novel prostaglandin derivatives and the like; and a method for manufacturing the same. It is expected that the present invention will be commercialized and industrialized.Type: ApplicationFiled: September 13, 2019Publication date: September 30, 2021Inventors: Hitoshi Kasai, Yoshitaka Koseki, Takaaki Kamishima, Shigenobu Aoyagi
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Patent number: 11014865Abstract: [Problem] The present invention provides an industrially-preferable, cost-efficient, low-cost production method for 4-hydroxy-2-hydroxymethyl-2-cyclopenten-1-one (a compound represented by formula (I)) useful as a medicine, an agricultural chemical, or a raw material or intermediate of a medicine, an agricultural chemical, or the like. [Solution] According to the present invention, this compound represented by formula (I) is produced by subjecting an easily available compound represented by formula (II) (tri-O-acetyl-D-glucal) to a heating reaction in pressurized water.Type: GrantFiled: February 12, 2019Date of Patent: May 25, 2021Assignees: Tohoku University, Genesis Research Institute, Inc.Inventors: Yoshitaka Koseki, Hitoshi Kasai, Takaaki Kamishima
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Publication number: 20210024444Abstract: [Problem] The present invention provides an industrially-preferable, cost-efficient, low-cost production method for 4-hydroxy-2-hydroxymethyl-2-cyclopenten-1-one (a compound represented by formula (I)) useful as a medicine, an agricultural chemical, or a raw material or intermediate of a medicine, an agricultural chemical, or the like. [Solution] According to the present invention, this compound represented by formula (I) is produced by subjecting an easily available compound represented by formula (II) (tri-O-acetyl-D-glucal) to a heating reaction in pressurized water.Type: ApplicationFiled: February 12, 2019Publication date: January 28, 2021Inventors: Yoshitaka Koseki, Hitoshi Kasai, Takaaki Kamishima
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Publication number: 20160071850Abstract: A capacitive element has improved electrical properties. The capacitive element is configured in a DRAM cell and has a lower electrode, a capacitive insulator film formed over the lower electrode, and an upper electrode formed over the capacitive insulator film. The upper electrode has a structure in which from the capacitive insulator film side of this electrode, a first upper electrode, a second upper electrode and a third upper electrode are stacked in turn. The third upper electrode is a tungsten film that may contain an impurity. Between the first and third upper electrodes, the second upper electrode is interposed which is a barrier film for preventing the possible impurity in the third upper electrode from diffusing into the capacitive insulator film.Type: ApplicationFiled: November 3, 2015Publication date: March 10, 2016Inventors: Misato SAKAMOTO, Yoshitake KATO, Youichi YAMAMOTO, Hitoshi KASAI, Satoshi ITOU
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Patent number: 9209189Abstract: A capacitive element has improved electrical properties. The capacitive element is configured in a DRAM cell and has a lower electrode, a capacitive insulator film formed over the lower electrode, and an upper electrode formed over the capacitive insulator film. The upper electrode has a structure in which from the capacitive insulator film side of this electrode, a first upper electrode, a second upper electrode and a third upper electrode are stacked in turn. The third upper electrode is a tungsten film that may contain an impurity. Between the first and third upper electrodes, the second upper electrode is interposed which is a barrier film for preventing the possible impurity in the third upper electrode from diffusing into the capacitive insulator film.Type: GrantFiled: March 18, 2015Date of Patent: December 8, 2015Assignee: Renesas Electronics CorporationInventors: Misato Sakamoto, Yoshitake Kato, Youichi Yamamoto, Hitoshi Kasai, Satoshi Itou
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Patent number: 9153742Abstract: A GaN-crystal free-standing substrate obtained from a GaN crystal grown by HVPE with a (0001) plane serving as a crystal growth plane and at least one plane of a {10-11} plane and a {11-22} plane serving as a crystal growth plane that constitutes a facet crystal region, except for the side surface of the crystal, wherein the (0001)-plane-growth crystal region has a carbon concentration of 5×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or more and 2×1018 atoms/cm3 or less, and an oxygen concentration of 1×1017 atoms/cm3 or less; and the facet crystal region has a carbon concentration of 3×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or less, and an oxygen concentration of 5×1017 atoms/cm3 or more and 5×1018 atoms/cm3 or less.Type: GrantFiled: July 2, 2013Date of Patent: October 6, 2015Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.Inventors: Shinsuke Fujiwara, Koji Uematsu, Hitoshi Kasai, Takuji Okahisa
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Publication number: 20150270271Abstract: A capacitive element has improved electrical properties. The capacitive element is configured in a DRAM cell and has a lower electrode, a capacitive insulator film formed over the lower electrode, and an upper electrode formed over the capacitive insulator film. The upper electrode has a structure in which from the capacitive insulator film side of this electrode, a first upper electrode, a second upper electrode and a third upper electrode are stacked in turn. The third upper electrode is a tungsten film that may contain an impurity. Between the first and third upper electrodes, the second upper electrode is interposed which is a barrier film for preventing the possible impurity in the third upper electrode from diffusing into the capacitive insulator film.Type: ApplicationFiled: March 18, 2015Publication date: September 24, 2015Inventors: Misato SAKAMOTO, Yoshitake KATO, Youichi YAMAMOTO, Hitoshi KASAI, Satoshi ITOU
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Patent number: 8679341Abstract: A method of concentrating nanoparticles, having the steps of: adding and mixing an extraction solvent with a nanoparticles-dispersion liquid that nanoparticles are dispersed in a dispersion solvent, thereby concentrating and extracting the nanoparticles into a phase of the extraction solvent, and removing the dispersion solvent by filter-filtrating a liquid of concentrated extract, in which the extraction solvent is substantially incompatible with the dispersion solvent, and the extract solvent can form an interface after the extraction solvent is mixed with the dispersion solvent and left the mixture still; further a method of deaggregating aggregated nanoparticles, having the steps of: applying two or more ultrasonic waves different in frequency to a liquid containing aggregated nanoparticles, and thereby fining and dispersing the aggregated nanoparticles.Type: GrantFiled: May 8, 2006Date of Patent: March 25, 2014Assignees: FUJIFILM Corporation, Tohoku UniversityInventors: Yousuke Miyashita, Hachiro Nakanishi, Hitoshi Kasai, Akito Masuhara
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Publication number: 20130292737Abstract: A GaN-crystal free-standing substrate obtained from a GaN crystal grown by HVPE with a (0001) plane serving as a crystal growth plane and at least one plane of a {10-11} plane and a {11-22} plane serving as a crystal growth plane that constitutes a facet crystal region, except for the side surface of the crystal, wherein the (0001)-plane-growth crystal region has a carbon concentration of 5×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or more and 2×1018 atoms/cm3 or less, and an oxygen concentration of 1×1017 atoms/cm3 or less; and the facet crystal region has a carbon concentration of 3×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or less, and an oxygen concentration of 5×1017 atoms/cm3 or more and 5×1018 atoms/cm3 or less.Type: ApplicationFiled: July 2, 2013Publication date: November 7, 2013Inventors: Shinsuke FUJIWARA, Koji UEMATSU, Hitoshi KASAI, Takuji OKAHISA
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Patent number: 8574364Abstract: The invention relates to a GaN-crystal free-standing substrate obtained from a GaN crystal grown by HVPE with a (0001) plane serving as a crystal growth plane and at least one plane of a {10-11} plane and a {11-22} plane serving as a crystal growth plane that constitutes a facet crystal region, except for the side surface of the crystal, wherein the (0001)-plane-growth crystal region has a carbon concentration of 5×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or more and 2×1018 atoms/cm3 or less, and an oxygen concentration of 1×1017 atoms/cm3 or less; and the facet crystal region has a carbon concentration of 3×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or less, and an oxygen concentration of 5×1017 atoms/cm3 or more and 5×1018 atoms/cm3 or less.Type: GrantFiled: September 19, 2011Date of Patent: November 5, 2013Assignee: Sumitomo Electric Industries, Ltd.Inventors: Shinsuke Fujiwara, Koji Uematsu, Hitoshi Kasai, Takuji Okahisa
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Publication number: 20130244406Abstract: A fabrication method of a group III nitride crystal substance includes the steps of cleaning the interior of a reaction chamber by introducing HCl gas into the reaction chamber, and vapor deposition of a group III nitride crystal substance in the cleaned reaction chamber. A fabrication apparatus of a group III nitride crystal substance includes a configuration to introduce HCl gas into the reaction chamber, and a configuration to grow a group III nitride crystal substance by HVPE. Thus, a fabrication method of a group III nitride crystal substance including the method of effectively cleaning deposits adhering inside the reaction chamber during crystal growth, and a fabrication apparatus employed in the fabrication method are provided.Type: ApplicationFiled: February 26, 2013Publication date: September 19, 2013Applicant: Sumitomo Electric Industries, Ltd.Inventors: Hitoshi KASAI, Takuji Okahisa, Shunsuke Fujita, Naoki Matsumoto, Hideyuki Ijiri, Fumitaka Sato, Kensaku Motoki, Seiji Nakahata, Koji Uematsu, Ryu Hirota
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Publication number: 20130096097Abstract: [Problem] The purpose of the present invention is to provide organic particles containing pharmaceutical particles of which the particles are small and the particle size distribution is narrow, and a manufacturing method for the same. [Solution] Provided are pharmaceutical multimeric particles of which the particles are small and the particle size distribution is narrow and which are characterized in being obtained by pouring into water a solution of a pharmaceutical multimer dissolved in a water-miscible organic solvent, and a manufacturing method for the pharmaceutical multimeric particles. Pharmaceutical dimeric particles thereof are characterized in being obtained by pouring into water a solution of a compound represented by general formula (I) dissolved in a water-miscible organic solvent.Type: ApplicationFiled: June 7, 2011Publication date: April 18, 2013Applicant: JAPAN SCIENCE AND TECHNOLOGY AGENCYInventors: Hitoshi Kasai, Hachiro Nakanishi, Koichi Baba, Hidetoshi Oikawa, Tastuya Murakami, Hiroshi Imahori, Misturu Hashida, Isamu Oh
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Patent number: 8404569Abstract: A fabrication method of a group III nitride crystal substance includes the steps of cleaning the interior of a reaction chamber by introducing HCl gas into the reaction chamber, and vapor deposition of a group III nitride crystal substance in the cleaned reaction chamber. A fabrication apparatus of a group III nitride crystal substance includes a configuration to introduce HCl gas into the reaction chamber, and a configuration to grow a group III nitride crystal substance by HVPE. Thus, a fabrication method of a group III nitride crystal substance including the method of effectively cleaning deposits adhering inside the reaction chamber during crystal growth, and a fabrication apparatus employed in the fabrication method are provided.Type: GrantFiled: November 18, 2010Date of Patent: March 26, 2013Assignee: Sumitomo Electric Industries, Ltd.Inventors: Hitoshi Kasai, Takuji Okahisa, Shunsuke Fujita, Naoki Matsumoto, Hideyuki Ijiri, Fumitaka Sato, Kensaku Motoki, Seiji Nakahata, Koji Uematsu, Ryu Hirota
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Patent number: 8143140Abstract: There is provided a method of producing a thin GaN film-joined substrate, including the steps of: joining on a GaN bulk crystalline body a substrate different in type or chemical composition from GaN; and dividing the GaN bulk crystalline body at a plane having a distance of at least 0.1 ?m and at most 100 ?m from an interface thereof with the substrate different in type, to provide a thin film of GaN on the substrate different in type, wherein the GaN bulk crystalline body had a surface joined to the substrate different in type, that has a maximum surface roughness Rmax of at most 20 ?m. Thus a GaN-based semiconductor device including a thin GaN film-joined substrate including a substrate different in type and a thin film of GaN joined firmly on the substrate different in type, and at least one GaN-based semiconductor layer deposited on the thin film of GaN, can be fabricated at low cost.Type: GrantFiled: April 22, 2010Date of Patent: March 27, 2012Assignee: Sumitomo Electric Industries, Ltd.Inventors: Hitoshi Kasai, Akihiro Hachigo, Yoshiki Miura, Katsushi Akita
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Publication number: 20120034149Abstract: The invention relates to a GaN-crystal free-standing substrate obtained from a GaN crystal grown by HVPE with a (0001) plane serving as a crystal growth plane and at least one plane of a {10-11} plane and a {11-22} plane serving as a crystal growth plane that constitutes a facet crystal region, except for the side surface of the crystal, wherein the (0001)-plane-growth crystal region has a carbon concentration of 5×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or more and 2×1018 atoms/cm3 or less, and an oxygen concentration of 1×1017 atoms/cm3 or less; and the facet crystal region has a carbon concentration of 3×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or less, and an oxygen concentration of 5×1017 atoms/cm3 or more and 5×1018 atoms/cm3 or less.Type: ApplicationFiled: September 19, 2011Publication date: February 9, 2012Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.Inventors: Shinsuke Fujiwara, Koji Uematsu, Hitoshi Kasai, Takuji Okahisa
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Patent number: 8025930Abstract: A method for fabricating metal-coated organic crystal wherein a reaction of an organic crystal with transition metal salt in alkaline aqueous solution under visible light irradiation, wherein, when energy at the top of valence band of the organic crystal is defined as A (eV) and energy at the bottom of conduction band of the organic crystal is defined as B (eV), redox potential C (V) of transition metal ion or transition metal complex ion, when said transition metal salt is dissolved in the alkaline aqueous solution, these three parameters should satisfy the following relation (1): ?A?4.5?C??B?4.5.Type: GrantFiled: March 10, 2006Date of Patent: September 27, 2011Assignee: Japan Science and Technology AgencyInventors: Tsunenobu Onodera, Hidetoshi Oikawa, Hitoshi Kasai, Hachiro Nakanishi, Takashi Sekiguchi
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Patent number: 7973322Abstract: An active layer 17 is provided so as to emit light having a light emission wavelength in the range of 440 to 550 nm. A first conduction type gallium nitride-based semiconductor region 13, the active layer 17, and a second conduction type gallium nitride-based semiconductor region 15 are disposed in a predetermined axis Ax direction. The active layer 17 includes a well layer composed of hexagonal InXGa1-XN (0.16?X?0.35, X: strained composition), and the indium composition X is represented by a strained composition. The a-plane of the hexagonal InXGa1-XN is aligned in the predetermined axis Ax direction. The thickness of the well layer is in the range of more than 2.5 nm to 10 nm. When the thickness of the well layer is set to 2.5 nm or more, a light emitting device having a light emission wavelength of 440 nm or more can be formed.Type: GrantFiled: April 17, 2008Date of Patent: July 5, 2011Assignee: Sumitomo Electric Industries, Ltd.Inventors: Katsushi Akita, Takashi Kyono, Keiji Ishibashi, Hitoshi Kasai