Abstract: The present invention relates to a novel compound and uses thereof, and more specifically, to a compound capable of labeling biomolecules (such as nucleic acids and proteins), a composition for labeling or detecting biomolecules containing the compound, a support for labeling or detecting biomolecules containing the compound, and a method of labeling or detecting biomolecules using the compound.

Abstract: Disclosed are a sulfide-based solid electrolyte including boron and having a face-centered cubic crystalline phase and a method of manufacturing the same.

Abstract: The present technology relates to an electronic device. According to the present technology, a memory controller may include a garbage collection controller and a sustain detector. The garbage collection controller may generate garbage collection information including valid page count values of victim memory blocks on which garbage collection is to be performed among a plurality of memory blocks included in a memory device. The sustain detector in communication with the garbage collection controller may generate sustain information indicating whether random write performance for the memory device is in a sustain state in which a random write performance value related to a capability of the random write performance is greater than or equal to a threshold value based on the garbage collection information.

Abstract: Disclosed are a Mach-Zehnder interferometric optical modulator and a method for manufacturing the same. The modulator includes first and second lower clad layers, a core layer, an upper clad layer, a waveguide, and electrodes. The waveguide may include an input waveguide, a waveguide divider, branch waveguides, and a waveguide combiner. Each of the branch waveguides includes first and second connection regions connected to the waveguide combiner and the waveguide divider, respectively, and a phase shift region having a cross-section of a reverse mesa structure that has an upper width that is the same as widths of the first and second connection regions and a lower width that is smaller than the widths of the first and second connection regions.

Abstract: Disclosed is a water electrolysis system that improves durability by preventing performance degradation inside a water electrolysis stack. According to the present invention, in order to reduce electrode degradation in a water electrolysis unit cell, which can frequently occur in the starting and stopping stages of a process for producing hydrogen from the water electrolysis system, power of a constant current is supplied to the water electrolysis stack and electrolyte circulating water is heated while being circulated in the water electrolysis stack in the starting stage of the water electrolysis system. Also, when performing a stopping process, power of a constant current is supplied to the water electrolysis stack and electrolyte circulating water is cooled while being circulated in the water electrolysis stack. Accordingly, it is possible to improve durability by preventing performance degradation inside the water electrolysis stack.

Abstract: The present invention relates to a cell culture vessel. Specifically, the present invention relates to a cell culture vessel capable of obtaining a clean image by preventing occurrence of distortion and dew condensation when performing an imaging acquisition operation on cells cultured in the cell culture vessel.

Abstract: A nonvolatile memory device includes a memory cell array including a plurality of memory cells that are programmed based on a high voltage, a high voltage generator to generate the high voltage by boosting an input voltage based on a pumping clock, a pumping clock generator to generate the pumping clock, a high voltage detector to generate a detection signal by comparing an adjustment voltage with a reference voltage, a programming current controller to adjust a programming current flowing through each of selected memory cells of the plurality of memory cells; and a control logic to adjust a frequency of the pumping clock and a current driving capability of the programming current based on the detection signal during a programming period with respect to the selected memory cells. The detection signal includes information indicating whether the high voltage reaches to a target voltage.

Abstract: A nonvolatile memory device includes a memory cell array including a plurality of memory cells that are programmed based on a high voltage, a high voltage generator to generate the high voltage by boosting an input voltage based on a pumping clock, a pumping clock generator to generate the pumping clock, a high voltage detector to generate a detection signal by comparing an adjustment voltage with a reference voltage, a programming current controller to adjust a programming current flowing through each of selected memory cells of the plurality of memory cells; and a control logic to adjust a frequency of the pumping clock and a current driving capability of the programming current based on the detection signal during a programming period with respect to the selected memory cells. The detection signal includes information indicating whether the high voltage reaches to a target voltage.

Abstract: A latch circuit including: a first inverter having a first pull-up transistor connected between a first power supply node and a first output node, and a first pull-down transistor connected between a second power supply node and the first output node; a second inverter having a second pull-up transistor connected between the first power supply node and a second output node, and a second pull-down transistor connected between the second power supply node and the second output node; a first current control transistor connected between the first pull-up transistor and the first output node; a second current control transistor connected between the second pull-up transistor and the second output node; a third current control transistor connected between the first pull-down transistor and the first output node; and a fourth current control transistor connected between the second pull-down transistor and the second output node.

Abstract: A charge pump includes a first pumping capacitor configured to pump a first voltage of a first node, in response to a first clock signal, a gate pumping capacitor configured to pump a second voltage of a second node, in response to a second clock signal, a charge transfer transistor including a first source connected to a first one of a third node and the first node, a first gate connected to the second node, and a first drain connected to a remaining one of the first node and the third node, a gate control transistor including a second source connected to the first one of the third node and the first node, a second gate connected to the remaining one of the first node and the third node, and a second drain connected to the second node, and a gate discharge or charge unit.

Abstract: A latch circuit including: a first inverter having a first pull-up transistor connected between a first power supply node and a first output node, and a first pull-down transistor connected between a second power supply node and the first output node; a second inverter having a second pull-up transistor connected between the first power supply node and a second output node, and a second pull-down transistor connected between the second power supply node and the second output node; a first current control transistor connected between the first pull-up transistor and the first output node; a second current control transistor connected between the second pull-up transistor and the second output node; a third current control transistor connected between the first pull-down transistor and the first output node; and a fourth current control transistor connected between the second pull-down transistor and the second output node.

Abstract: A charge pump includes a first pumping capacitor configured to pump a first voltage of a first node, in response to a first clock signal, a gate pumping capacitor configured to pump a second voltage of a second node, in response to a second clock signal, a charge transfer transistor including a first source connected to a first one of a third node and the first node, a first gate connected to the second node, and a first drain connected to a remaining one of the first node and the third node, a gate control transistor including a second source connected to the first one of the third node and the first node, a second gate connected to the remaining one of the first node and the third node, and a second drain connected to the second node, and a gate discharge or charge unit.

Abstract: A level shifter includes a driving circuit, which receives an input signal and outputs a driving signal in response to a first voltage level of the input signal; a level shifting circuit, which outputs an output signal of a second voltage level in response to the driving signal; and a leakage prevention circuit, which prevents a leakage current of the driving circuit, wherein the driving circuit may include at least one native transistor.

Abstract: A current reference circuit and a semiconductor IC including the current reference circuit, the current reference circuit including a proportional to absolute temperature (PTAT) current generator configured to generate, in an output branch, a first current proportional to a temperature; and a current subtractor configured to generate a reference current by subtracting a second current generated based on a current flowing in an internal branch of the PTAT current generator, from the first current flowing in the output branch. The second current is set to have a same temperature-based change characteristic as the first current and a level different from a level of the first current.

Abstract: A non-volatile memory device includes a memory cell array including a plurality of memory cells, wherein at least one selected memory cell that is selected from among the plurality of memory cells is programmed based on a high voltage, a high voltage generator configured to generate the high voltage by boosting an input voltage based on a pumping clock, a pumping clock generator configured to generate the pumping clock, a program current controller configured to adjust a program current flowing in the at least one selected memory cells, and a control logic configured to control a frequency of the pumping clock and an amount of the program current based on a time in a program section in which the at least one selected memory cell is programmed.

Abstract: A current reference circuit and a semiconductor IC including the current reference circuit, the current reference circuit including a proportional to absolute temperature (PTAT) current generator configured to generate, in an output branch, a first current proportional to a temperature; and a current subtractor configured to generate a reference current by subtracting a second current generated based on a current flowing in an internal branch of the PTAT current generator, from the first current flowing in the output branch. The second current is set to have a same temperature-based change characteristic as the first current and a level different from a level of the first current.

Abstract: A voltage generation circuit and a semiconductor device including the same are provided. The voltage generation circuit includes charge pumps connected in series, each charge pump including a charge transfer transistor, a controller, and a bias circuit. The charge transfer transistor has a drain, a source that receives a first clock, and a gate that is connected to a first node and that receives a second clock opposite to the first clock. The controller includes a control transistor having a source connected to the first node, a gate coupled to the first clock, and a drain connected to the gate of the control transistor. The bias circuit biases the charge transfer transistor.

Abstract: A current reference circuit and a semiconductor IC including the current reference circuit, the current reference circuit including a proportional to absolute temperature (PTAT) current generator configured to generate, in an output branch, a first current proportional to a temperature; and a current subtractor configured to generate a reference current by subtracting a second current generated based on a current flowing in an internal branch of the PTAT current generator, from the first current flowing in the output branch. The second current is set to have a same temperature-based change characteristic as the first current and a level different from a level of the first current.

Abstract: A memory device includes a memory cell, a bit line connected to the memory cell, a control voltage generator configured to generate a proportional to absolute temperature (PTAT) current and generate an analog control voltage inversely proportional to the PTAT current, and a load current control circuit configured to control a first load current supplied to the bit line based on the analog control voltage.

Abstract: A level shifter includes a driving circuit, which receives an input signal and outputs a driving signal in response to a first voltage level of the input signal; a level shifting circuit, which outputs an output signal of a second voltage level in response to the driving signal; and a leakage prevention circuit, which prevents a leakage current of the driving circuit, wherein the driving circuit may include at least one native transistor.