Abstract: A memory device includes a memory cell, a bit line connected to the memory cell, a control voltage generator configured to generate a proportional to absolute temperature (PTAT) current and generate an analog control voltage inversely proportional to the PTAT current, and a load current control circuit configured to control a first load current supplied to the bit line based on the analog control voltage.

Abstract: A non-volatile memory device includes a memory cell array including a plurality of memory cells, wherein at least one selected memory cell that is selected from among the plurality of memory cells is programmed based on a high voltage, a high voltage generator configured to generate the high voltage by boosting an input voltage based on a pumping clock, a pumping clock generator configured to generate the pumping clock, a program current controller configured to adjust a program current flowing in the at least one selected memory cells, and a control logic configured to control a frequency of the pumping clock and an amount of the program current based on a time in a program section in which the at least one selected memory cell is programmed.

Abstract: A current reference circuit and a semiconductor IC including the current reference circuit, the current reference circuit including a proportional to absolute temperature (PTAT) current generator configured to generate, in an output branch, a first current proportional to a temperature; and a current subtractor configured to generate a reference current by subtracting a second current generated based on a current flowing in an internal branch of the PTAT current generator, from the first current flowing in the output branch. The second current is set to have a same temperature-based change characteristic as the first current and a level different from a level of the first current.