Abstract: An apparatus for damping sound in the optical beam path of a microscope, having an acoustic insulation housing for encapsulating a sound-emitting component, preferably a rapidly moving or oscillating beam deflection means, in particular a resonantly oscillating mirror, the housing comprising at least one optical entrance/exit opening, is characterized in that the housing, preferably the opening of the housing, is embodied and/or configured in such a way that the sound otherwise emerging from the housing is largely extinguished by destructive interference without thereby influencing the optical beam. A microscope having a corresponding apparatus is furthermore claimed.

Abstract: A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Abstract: A method and a device for scanning-microscopy imaging of a specimen (28) are described. Provision is made that a plurality of specimen points are scanned by means of a scanning beam (14) in successive scanning time intervals, the intensity of the radiation emitted from the respectively scanned specimen point is repeatedly sensed within the associated scanning time interval, an intensity mean value is determined, as a mean value image point signal, from the intensities sensed in the respectively scanned specimen point, and the mean value image point signals are assembled into a mean value raster image. Provision is further made for additionally determining an intensity variance value, as a variance image point signal, from the intensities sensed in the respectively scanning specimen points, and for assembling the variance image point signals into a variance raster image signal.

Abstract: An optical arrangement and a related method for operating this optical arrangement are suggested, particularly in microscopes, for use as at least one of a main beam splitter and a beam combiner. One or more light beams can be coupled into the arrangement and at least one of the light beams that were coupled in can be coupled out again after having passed through the optical arrangement. In the path of the coupled in light beams at least one controllable microstructured element is provided, allowing to switch beam paths within the optical arrangement. This allows controlling or influencing the one or more light beams that are coupled out.

Abstract: A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time.

Abstract: A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component electrically insulates the detector with respect to the housing or is part of an insulator electrically that insulates the detector with respect to the housing.

Abstract: The invention relates to a device for scanning an object comprising a focusing lens system (30) which focuses an illuminating light beam (24) onto a region of the object to be analyzed. An actuator assembly is coupled to the focusing lens system (30) and moves the focusing lens system (30) in accordance with a predefined scanning pattern transversely to the cecenternter axis of the illumination light beam (24) in a reference position of the illumination light beam (24). A front glass (38) is disposed downstream of the focusing lens system (30) viewed in the direction of the illuminating light beam (24). An internal immersion medium (40) is disposed between the focusing lens system (30) and the front glass (38). An external immersion medium (48) can be introduced between the front glass (38) and the object.

Abstract: A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a light sensor having a light incidence side and a cooling component. The cooling component is in direct contact with at least one of the light sensor, on the light incidence side, or a substrate carrying the light sensor.

Abstract: A device for detecting light includes at least one silicon photomultiplier (SiPM) having an array of a plurality of single-photon avalanche diodes (SPADs), the array being larger in area than an incident light. The device is configured so as to at least one of activate and analyze only the SPADs upon which a specific minimum intensity of light impinges.

Abstract: The invention relates to a device for scanning an object comprising a carrier body (10) and a first electromagnetic drive (2). The carrier body (10) is movably mounted in a plane and holds an optical element (12) that focuses an illuminating light beam (19) on a first object plane of the object that is parallel to the plane. The first electromagnetic drive (2) moves the carrier body (10) with the optical element (12) and a focus region (23) of the illuminating light beam (19) within the first object plane.

Abstract: A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source (42), which emits an illuminating light beam (32). A focusing lens system (34) focuses the illuminating light beam (32) on a region to be examined of a sample (36). An actuator arrangement moves the focusing lens system (34) according to a prescribed scanning pattern transversely in relation to a center axis of the illuminating light beam (32) and/or in relation to a housing of a structural unit (20) that encloses the focusing lens system (34).

Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.

Abstract: The invention relates to a laser system (20) for a microscope, comprising a laser module (22), a beam correction device (26), an optical fiber (31), a measuring element (34), and an external controller (37). The laser module (22) generates a light beam (24). The light beam (24) penetrates the beam correction device (26), which corrects a deviation of an actual value of at least one parameter of the light beam (24) from a target value of the parameter. The corrected light beam (24) is coupled into the optical fiber (31). The measuring element (34) is connected downstream of the optical fiber (31) and captures an actual value (36) of the intensity of at least one partial beam (32) of the corrected light beam (24). The external controller (37), regulates the actual value (36) of the intensity to a prescribed target value for the intensity.

Abstract: A method and a device for scanning-microscopy imaging of a specimen (28) are described. Provision is made that a plurality of specimen points are scanned by means of a scanning beam (14) in successive scanning time intervals, the intensity of the radiation emitted from the respectively scanned specimen point is repeatedly sensed within the associated scanning time interval, an intensity mean value is determined, as a mean value image point signal, from the intensities sensed in the respectively scanned specimen point, and the mean value image point signals are assembled into a mean value raster image. Provision is further made for additionally determining an intensity variance value, as a variance image point signal, from the intensities sensed in the respectively scanning specimen points, and for assembling the variance image point signals into a variance raster image signal.

Abstract: In order to identify scan coordinate values (?n, ?n) for operating a scanning unit (28) of a confocal scanning microscope (20), spherical scan coordinate values (?n, ?n) are identified, as a function of Cartesian image coordinates (Xn, Yn) of image points of an image (60) to be created of a sample (32), with the aid of a coordinate transformation of the Cartesian image coordinate values (Xn, Yn) into a spherical coordinate system. The scanning unit (28) is operated as a function of the spherical scan coordinate values (?n, ?n).

Abstract: The invention relates to a method and a system for central computer controlled execution of at least one test run in a scanning microscope, particularly a confocal microscope, wherein at least one first software module of an application software is tested. The invention achieves the aim by a network made of individual scanning microscope clients and a central server. The clients can be contacted via a network interface and are administered in a central directory in the server. The application software for the individual components of a scanning microscope is made of individual software modules, each associated with a potential test. In order to be able to perform the various tests, the scanning microscope clients have been equipped on the hardware side with additional sensors and components that allow various operating parameters to be determined.

Abstract: An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components.

Abstract: A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises—a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time.

Abstract: An optical arrangement and a related method for operating this optical arrangement are suggested, particularly in microscopes, for use as at least one of a main beam splitter and a beam combiner. One or more light beams can be coupled into the arrangement and at least one of the light beams that were coupled in can be coupled out again after having passed through the optical arrangement. In the path of the coupled in light beams at least one controllable microstructured element is provided, allowing to switch beam paths within the optical arrangement. This allows controlling or influencing the one or more light beams that are coupled out.

Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).