Patents by Inventor Holger Birk

Holger Birk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7045772
    Abstract: An apparatus for controlling optical power in a microscope includes a measuring device for measuring the optical power, and a control unit for controlling a high-frequency source as a function of the measured optical power so as to achieve a selectable level of the optical power. The microscope includes a source providing light along an illumination beam path to a sample, a detector receiving detection light lead along a detection beam path from the sample, and an acousto-optical or electro-optical element located in the illumination beam path and driven by the high-frequency source.
    Type: Grant
    Filed: May 26, 2004
    Date of Patent: May 16, 2006
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Kyra Moellmann, Holger Birk
  • Publication number: 20060098275
    Abstract: The invention relates to a device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.
    Type: Application
    Filed: November 3, 2005
    Publication date: May 11, 2006
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Juergen Riedmann, Ingo Boehm, Volker Leimbach, Heinrich Ulrich, Holger Birk
  • Patent number: 7016101
    Abstract: A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a [sic] detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.
    Type: Grant
    Filed: December 15, 2004
    Date of Patent: March 21, 2006
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Johann Engelhardt
  • Patent number: 7002717
    Abstract: The invention concerns an apparatus for beam deflection, in particular for scanning microscopy, a light beam being deflectable by a mirror arrangement that is alternatingly rotatable by a rotary drive. The apparatus for beam deflection makes possible maximum variability in terms of frequency range and maximally achievable oscillation frequency, and is thus usable in flexible and versatile fashion. It moreover allows almost any desired angular offset from the zero point position to be established, and is characterized in that the rotary drive comprises two mutually independent drive units which rotate the mirror arrangement, together or mutually independently, about a rotation axis.
    Type: Grant
    Filed: November 20, 2000
    Date of Patent: February 21, 2006
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Rafael Storz, Johann Engelhardt, Holger Birk, Joachim Bradl
  • Patent number: 6967764
    Abstract: An optical arrangement for spatially separating an illumination light beam and a detection light beam includes an acousto-optical component that splits the detection light beam by birefringence. A compensation element is provided that compensates, in a single passage of the detection light beam, for the splitting of the detection light beam.
    Type: Grant
    Filed: July 26, 2002
    Date of Patent: November 22, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventor: Holger Birk
  • Publication number: 20050122580
    Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).
    Type: Application
    Filed: January 14, 2005
    Publication date: June 9, 2005
    Inventors: Holger Birk, Rafael Storz
  • Publication number: 20050111816
    Abstract: A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light beam. The apparatus for determining the light power level of the illuminating light beam receives the measuring light and includes an apparatus for simultaneous color-selective detection of the measuring light.
    Type: Application
    Filed: October 13, 2004
    Publication date: May 26, 2005
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
  • Patent number: 6898367
    Abstract: A method for illuminating is disclosed, which is characterized by the steps of injecting (1) the light beam (13) from a laser (9) into a optical element (19), which spectrally broadens the light of the light beam (13) and shaping (3) the spectrally broadened light (31) to form an illumination light beam (29). An instrument (7) for illuminating is furthermore disclosed, which comprises a laser (9) that emits a light beam (13), which is directed onto a optical element (19) that spectrally broadens the light from the laser. A optical means (33) which shapes the spectrally broadened light (31) to form an illumination light beam (29) is arranged downstream of the microstructured optical element (19).
    Type: Grant
    Filed: June 15, 2001
    Date of Patent: May 24, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
  • Publication number: 20050099673
    Abstract: A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a [sic] detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.
    Type: Application
    Filed: December 15, 2004
    Publication date: May 12, 2005
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Johann Engelhardt
  • Patent number: 6888674
    Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).
    Type: Grant
    Filed: June 15, 2001
    Date of Patent: May 3, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Rafael Storz
  • Patent number: 6864989
    Abstract: A method for illuminating an object with light (2) from a laser light source (3), preferably in a confocal scanning microscope (1). With the method according to the invention, it is possible to reduce the coherence length of the laser light, so that disruptive interference phenomena can be substantially eliminated. Should interference phenomena nevertheless be formed, these are to be influenced in such a way that they have no effect on the detection. The method according to the invention is characterized in that the phase angle of the light field is varied by a modulator in such a way that interference phenomena do not occur in the optical beam path, or occur only to an undetectable extent, within a predeterminable time interval.
    Type: Grant
    Filed: August 28, 2001
    Date of Patent: March 8, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Rafael Storz, Johann Engelhardt, Holger Birk
  • Publication number: 20050045812
    Abstract: A device for selectively detecting specific wavelength components of a light beam includes a spectral spreading element for spectrally spreading the light beam, and a detector array arranged downstream of the element. The detector array includes light-insensitive regions and light-sensitive regions. The element and the detector array are matched to each other so that selectable wavelength components of the light beam hit the light-insensitive regions and remaining wavelength components of the light beam hit the light-sensitive regions.
    Type: Application
    Filed: August 20, 2004
    Publication date: March 3, 2005
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Volker Seyfried, Rafael Storz
  • Patent number: 6850358
    Abstract: A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.
    Type: Grant
    Filed: July 29, 2002
    Date of Patent: February 1, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Johann Engelhardt
  • Publication number: 20040251426
    Abstract: A method for classifying a plurality of object image regions of an object to be detected using a scanning microscope includes labeling each of the image areas of the object with a different marker so that light of a respective characteristic emanates from each marker. The intensity of the light from each marker is detected using at least two channels so as to generate detection signals, each detection signal being a function of the intensity of the detected light. The object regions are classified using ratios of the detection signals.
    Type: Application
    Filed: April 28, 2004
    Publication date: December 16, 2004
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Rafael Storz
  • Publication number: 20040238719
    Abstract: An apparatus for controlling optical power in a microscope includes a measuring device for measuring the optical power, and a control unit for controlling a high-frequency source as a function of the measured optical power so as to achieve a selectable level of the optical power. The microscope includes a source providing light along an illumination beam path to a sample, a detector receiving detection light lead along a detection beam path from the sample, and an acousto-optical or electro-optical element located in the illumination beam path and driven by the high-frequency source.
    Type: Application
    Filed: May 26, 2004
    Publication date: December 2, 2004
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Kyra Moellmann, Holger Birk
  • Patent number: 6813072
    Abstract: A device for adjusting the light beam in a microscope. The device couples the light beam into a housing of the device. A first and a second detectors are positioned at different distances to the coupling point. In the line of coupled in light beam at least one beam splitter is provided, which directs the coupled-in light beam onto at least one of the photo detectors.
    Type: Grant
    Filed: February 20, 2002
    Date of Patent: November 2, 2004
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Johan Engelhardt
  • Publication number: 20040209300
    Abstract: A method for separating detection channels is disclosed, a sample (15) being equipped with at least two different fluorescent dyes. Firstly the emission spectrum of at least two fluorescent dyes is ascertained. From the emission spectra, the separation points of the wavelength and of the individual detection channels are determined. Lastly, adjustment of the separation of the at least two channels is accomplished on that basis.
    Type: Application
    Filed: April 12, 2004
    Publication date: October 21, 2004
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Rafael Storz, Holger Birk
  • Patent number: 6806950
    Abstract: An apparatus for determining the light power level of a light beam (7), having a beam splitter (1) and a detector (11) associated with the beam splitter (1), is disclosed. The apparatus is characterized in that the beam splitter (1) splits measuring light (23) out of the light beam and conveys it to the detector (11), and that the ratio between the light power level of the light beam (7) and the light power level of the measuring light (23) measured at the detector (11) is constant over time.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: October 19, 2004
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Heinrich Ulrich, Holger Birk, William C. Hay, Holger Nissle
  • Patent number: 6796699
    Abstract: A method for illuminating an object (79). The method is characterized by the steps of injecting (1) the light beam (13) from a laser (9) into a microstructured optical element (19), which spectrally broadens the light of the light beam (13), shaping (3) the spectrally broadened light (31) to form an illumination light beam (29), and directing (5) the illumination light beam (29) onto the object (79). An instrument (7) for illuminating an object (79). The instrument comprises a laser (9) that emits a light beam (13), which is directed onto a microstructured optical element (19) that spectrally broadens the light from the laser. A optical means (33) which shapes the spectrally broadened light (31) to form an illumination light beam (29) is arranged downstream of the microstructured optical element (19).
    Type: Grant
    Filed: June 15, 2001
    Date of Patent: September 28, 2004
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
  • Publication number: 20040174585
    Abstract: The invention relates to an optical arrangement for spatially separating an illumination light beam (11) and a detection light beam (29) with an acousto-optical component (13). The arrangement is characterized in that a compensation element (31) is provided that, in a single passage, compensates for a splitting of the detection light beam (29) caused by the acousto-optical component (13) due to double refraction. The invention also relates to a scan microscope comprising an acousto-optical component (13) and a compensation element (31).
    Type: Application
    Filed: January 30, 2004
    Publication date: September 9, 2004
    Inventor: Holger Birk