Abstract: A method for programming a memory. The method includes providing a memory structure with a floating gate, and grounding a source of the memory structure; applying voltages to a drain and a bulk, forming an electric field, generating electron-hole pairs, and generating primary electrons, wherein the voltage applied to the bulk is lower than the voltage applied to the drain; making holes accelerate downward under the action of the electric field and collide with the bulk in the memory structure within a predetermined time to generate secondary electrons; applying voltages to a gate and the bulk respectively, where the voltage applied to the bulk is lower than the voltage applied to the gate, to enable the secondary electrons to generate tertiary electrons under the action of an electric field in a vertical direction, and the tertiary electrons are injected into the floating gate to complete a programming operation.

Abstract: An electronic device, and an over-erase detection and elimination method for memory cells are provided; the method includes: performing an erase operation on a specified area; selecting all the memory cells in the selected area one by one; measuring a threshold voltage of a selected memory cell for over-erase detection to see if it is less than a normal erase threshold voltage; if not, selecting the next memory cell for over-erase detection, and if yes, then performing a soft-write operation on the selected memory cell; after the soft-write operation, performing over-erase detection again to see whether the threshold voltage of the selected memory cell is within a normal threshold range; and if not, performing a soft-write operation again, and if yes, the next memory cell is selected for over-erase detection, until the threshold voltages of all the memory cells selected for erasure are within the normal threshold range.

Abstract: A catalyst has a carrier and a hydrogenation active metal component supported on the carrier. The hydrogenation active metal component contains at least one Group VIB metal component and at least one Group VIII metal component, and the carrier is composed of phosphorus-containing alumina. When the hydrogenation catalyst is measured using a hydrogen temperature programmed reduction method (H2-TPR), the ratio of the peak height of the low-temperature reduction peak, Plow-temp peak, at a temperature of 300-500° C. to the peak height of the high-temperature reduction peak, Phi-temp peak, at a temperature of 650-850° C., i.e. S=Plow-temp peak/Phi-temp peak, is 0.5-2.0; preferably 0.7-1.9, and more preferably 0.8-1.8. The hydrogenation catalyst shows excellent heteroatom removal effect and excellent stability when used in hydrotreatment.

Abstract: An apparatus and method for continuous catapulting of unmanned aerial vehicles are disclosed, and relate to the technical field of aircraft catapulting and recovery. The apparatus consists of an unmanned aerial vehicle storage apparatus, an unmanned aerial vehicle conveying apparatus, an automatic unmanned aerial vehicle loading apparatus, tackles and a rotary tube-type multi-track unmanned aerial vehicle catapult. The present invention can increase catapulting efficiency of the unmanned aerial vehicles, and is suitable for rapidly forming a cluster of the unmanned aerial vehicles.

Abstract: An electronic device, and an over-erase detection and elimination method for memory cells are provided; the method includes: performing an erase operation on a specified area; selecting all the memory cells in the selected area one by one; measuring a threshold voltage of a selected memory cell for over-erase detection to see if it is less than a normal erase threshold voltage; if not, selecting the next memory cell for over-erase detection, and if yes, then performing a soft-write operation on the selected memory cell; after the soft-write operation, performing over-erase detection again to see whether the threshold voltage of the selected memory cell is within a normal threshold range; and if not, performing a soft-write operation again, and if yes, the next memory cell is selected for over-erase detection, until the threshold voltages of all the memory cells selected for erasure are within the normal threshold range.

Abstract: A sensitive amplifier and a storage device are provided, and the sensitive amplifier includes: a voltage clamp circuit which provides a stable reading voltage for the storage unit; a power switch circuit which cuts off power supply for the voltage clamp circuit when the voltage clamp circuit is not operating; a discharge circuit which discharges the voltage clamp circuit before the voltage clamp circuit operates; a pre-charge circuit which pre-charges the voltage clamp circuit when the voltage clamp circuit starts operating; and a current comparison circuit which is connected to an output of the voltage clamp circuit, compares the reading current with a reference current, and outputs a comparison result.

Abstract: A sensitive amplifier and a storage device are provided, and the sensitive amplifier includes: a voltage clamp circuit which provides a stable reading voltage for the storage unit; a power switch circuit which cuts off power supply for the voltage clamp circuit when the voltage clamp circuit is not operating; a discharge circuit which discharges the voltage clamp circuit before the voltage clamp circuit operates; a pre-charge circuit which pre-charges the voltage clamp circuit when the voltage clamp circuit starts operating; and a current comparison circuit which is connected to an output of the voltage clamp circuit, compares the reading current with a reference current, and outputs a comparison result.

Abstract: The present disclosure relates to a method for programming flash memory, which includes: providing a flash memory structure having a floating gate, and floating a source of the flash memory structure; separately applying voltages to a drain and a substrate, to form an electric field, and generating electron-hole pairs, to generate primary electrons, where the voltage applied to the substrate is less than the voltage applied to the drain; accelerating holes downward under the action of the electric field to collide with the substrate in the flash memory structure within a preset time, to generate secondary electrons; and separately applying voltages to a gate and the substrate, where the voltage applied to the substrate is less than the voltage applied to the gate, and enabling the secondary electrons to generate tertiary electrons to inject the tertiary electrons into the floating gate, to complete a programming operation.

Abstract: Disclosed is a hydrofining catalyst comprising: an inorganic refractory component comprising a first hydrodesulfurization catalytically active component in a mixture with at least one oxide selected from the group consisting of alumina, silica, magnesia, calcium oxide, zirconia and titania; a second hydrodesulfurization catalytically active component; and an organic component comprising a carboxylic acid and optionally an alcohol. The hydrofining catalyst of the present application shows improved performance in the hydrofining of distillate oils. Also disclosed are a hydrofining catalyst system comprising the hydrofining catalyst, a method for preparing the catalyst and catalyst system, and a process for the hydrofining of distillate oils using the catalyst or catalyst system.

Abstract: Disclosed is a sustained-release microgel ointment with high drug loading and a preparation method and use thereof. HTCC aqueous solution and HA aqueous solution are mixed uniformly to obtain the microgel aqueous solution. A drug is mixed with the microgel aqueous solution and concentrated, and a thickening agent is added and mixed evenly to obtain the sustained-release microgel ointment with high drug loading. The HA and HTCC form a microgel through electrostatic action, which is safe and convenient. The concentration step increases the concentration of the drug solution outside the microgel, which can increase the drug loading of the microgel. Drugs not loaded in the microgel inhibited the drug from being released from the microgel, prolonging the sustained release time of the microgel. The thickener transforms the drug-loaded microgel suspension into a paste, facilitating to applying the drug on the skin surface. Meanwhile, the drug added can be used at 100%, reducing the cost of microgel ointment.

Abstract: A word line decoding circuit and memory comprises a first address decoding module to obtain word line logic signals; a word line pre-coding module to obtain word line pre-coding signals and first switch signals; a second address decoding module to obtain first and second selection signals; a third address decoding module to obtain third selection signals; a first level conversion module which performs level conversion on the first selection signals to obtain first and second control signals; a second level conversion module which performs level conversion on the second selection signals to get third and fourth control signals; a third level conversion module which performs level conversion on the third selection signals to obtain fifth control signals; a word line toggle switch signal generation module which generates second switch signals based on each control signal; and a word line toggle module to generate word line signals.

Abstract: The present disclosure provides a method for programming charge trap flash memory, including: enabling a channel of a charge trap storage component, to form a transverse electric field between a source and a drain, to generate primary electrons flowing from the source to the drain; colliding, by the primary electrons after a preset time, with the drain to generate electron holes; applying voltages to the drain and a substrate, where the electron holes are accelerated downward by the action of the electric field to collide with the substrate, to generate secondary electrons; and applying voltages to a gate and the substrate, to form a vertical electric field, wherein the secondary electrons generate tertiary electrons under the action of the vertical electric field and the tertiary electrons are injected into an insulating storage medium layer of the charge trap storage component, to complete a programming operation.

Abstract: The present disclosure relates to a NOR flash memory circuit, a data writing method, a data reading method, and a data erasing method. The NOR flash memory circuit includes: a NOR memory array, a source voltage selection unit, a well voltage selection unit, a word line gating unit, a bit line gating unit, a data reading unit, and an analog voltage generating unit. During data writing, a source is floated, and a well electrode is connected to ground; and a first forward voltage is applied to a bit line where a memory cell to be written data into is located, and a second forward voltage is applied to a word line where the memory cell to be written data into is located. During data reading, a source is grounded, and well electrodes are grounded; and a third forward voltage is applied to a word line.

Abstract: The present disclosure relates to a method for programming a 3D NAND flash memory, which includes: S1) providing a 3D flash memory array, and eliminating residual charges; S2) strobing a bit line where an upper sub-storage module is located; S3) applying a drain voltage to the drain of a to-be-programmed memory cell, and floating a source thereof; S4) applying a programming voltage to the gate of the to-be-programmed memory cell, to complete programming; and S5) after completing the programming of the upper sub-storage module, and when the upper sub-storage module keeps a programmed state, strobing a bit line where a lower sub-storage module is located, and repeating operation S3) and operation S4) to achieve programming of the lower sub-storage module. In the method for programming a 3D NAND flash memory according to the present disclosure, programming is completed based on tertiary electron collision.

Abstract: A process for converting inferior feedstock oil includes several steps. In step a) the inferior feedstock oil is subjected to a low severity hydrogenation reaction. The reaction product is separated to produce a gas, a hydrogenated naphtha, a hydrogenated diesel and a hydrogenated residual oil. In step b) the hydrogenated residual oil obtained in step a) is subjected to a first catalytic cracking reaction, the reaction product is separated to produce a first dry gas, a first LPG, a first gasoline, a first diesel and a first FCC-gas oil. In step c) the first FCC-gas oil obtained in step b) is subjected to a hydrogenation reaction of gas oil, the reaction product is separated to produce a hydrogenated gas oil, and in step d) the hydrogenated gas oil obtained in step c) is subjected to the first catalytic cracking reaction of step b) or a second catalytic cracking reaction.

Abstract: The present disclosure relates to a method for programming a NAND flash memory, which includes: providing a NAND flash memory array, and initializing a to-be-programmed memory cell; applying a drain voltage to the drain of the to-be-programmed memory cell, and floating the source of the to-be-programmed memory cell; and applying a programming voltage to the gate of the to-be-programmed memory cell, and discharging the voltage at each end of the to-be-programmed memory cell after maintaining the voltage for a first time period, to complete programming; a difference between the voltage applied to the drain and the voltage applied to the substrate of the to-be-programmed memory cell being not less than 4 V, the first time period being not longer than 100 ?s, and the programming voltage being not higher than 10 V.

Abstract: A method for programming a B4 flash memory includes: floating a source of a P-channel flash memory device; separately applying voltages to a gate, a drain, and a bulk of the P-channel flash memory device, and injecting holes into the bulk, so that electrons are gathered in the drain to form primary electrons; separately applying voltages to the drain and the bulk, so that an electric field is formed between the drain and the bulk, where the holes accelerate downward under the action of the electric field and impact the bulk in the P-channel flash memory device to generate secondary electrons; and separately applying voltages to the gate and the bulk of the P-channel flash memory device, so that the secondary electrons form tertiary electrons under the action of the electric field in a vertical direction, where the tertiary electrons are superposed with the primary electrons to be injected into a floating gate.

Abstract: A method for programming a B4 flash memory includes: floating a source of a P-channel flash memory device; separately applying voltages to a gate, a drain, and a bulk of the P-channel flash memory device, and injecting holes into the bulk, so that electrons are gathered in the drain to form primary electrons; separately applying voltages to the drain and the bulk, so that an electric field is formed between the drain and the bulk, where the holes accelerate downward under the action of the electric field and impact the bulk in the P-channel flash memory device to generate secondary electrons; and separately applying voltages to the gate and the bulk of the P-channel flash memory device, so that the secondary electrons form tertiary electrons under the action of the electric field in a vertical direction, where the tertiary electrons are superposed with the primary electrons to be injected into a floating gate.

Abstract: A method for programming a memory. The method includes providing a memory structure with a floating gate, and grounding a source of the memory structure; applying voltages to a drain and a bulk, forming an electric field, generating electron-hole pairs, and generating primary electrons, wherein the voltage applied to the bulk is lower than the voltage applied to the drain; making holes accelerate downward under the action of the electric field and collide with the bulk in the memory structure within a predetermined time to generate secondary electrons; applying voltages to a gate and the bulk respectively, where the voltage applied to the bulk is lower than the voltage applied to the gate, to enable the secondary electrons to generate tertiary electrons under the action of an electric field in a vertical direction, and the tertiary electrons are injected into the floating gate to complete a programming operation.

Abstract: The present disclosure provides a method for programming charge trap flash memory, including: enabling a channel of a charge trap storage component, to form a transverse electric field between a source and a drain, to generate primary electrons flowing from the source to the drain; colliding, by the primary electrons after a preset time, with the drain to generate electron holes; applying voltages to the drain and a substrate, where the electron holes are accelerated downward by the action of the electric field to collide with the substrate, to generate secondary electrons; and applying voltages to a gate and the substrate, to form a vertical electric field, wherein the secondary electrons generate tertiary electrons under the action of the vertical electric field and the tertiary electrons are injected into an insulating storage medium layer of the charge trap storage component, to complete a programming operation.