Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism. In one embodiment, the apparatus includes a ground fault simulation circuit for generating a simulated ground fault during every negative half-wave of an AC power, a signature signal generating circuit for generating a signature signal reflecting the characteristic of the leakage current detection circuit and the trip mechanism, when the simulated ground fault is generated, and a life testing detection control circuit having a microcontroller and an alarm circuit. In operation, the life testing detection control circuit receives the signature signal from the signature signal generating circuit, analyzes the received signature signal to determine whether at least one fault exists in the leakage current detection circuit and the trip mechanism, and activates the alarm circuit if the at least one fault exists.

Abstract: An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

Abstract: An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism. In one embodiment, the apparatus includes a ground fault simulation circuit for generating a simulated ground fault during every negative half-wave of an AC power, a signature signal generating circuit for generating a signature signal reflecting the characteristic of the leakage current detection circuit and the trip mechanism, when the simulated ground fault is generated, and a life testing detection control circuit having a microcontroller and an alarm circuit. In operation, the life testing detection control circuit receives the signature signal from the signature signal generating circuit, analyzes the received signature signal to determine whether at least one fault exists in the leakage current detection circuit and the trip mechanism, and activates the alarm circuit if the at least one fault exists.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

Abstract: A tubular bushing (26) assembly made of plastic material and disposed in an opening (24) defined by a pair of spaced sheets in a seat back (14) of an automotive vehicle to adjustably support each of the posts (22) of a headrest (20). The bushing (26) comprises an outer sleeve (28) presenting ribs (32, 34) for engaging the edges of the opening (24) in each of the sheets of the bracket of the seat back frame (18) and an inner sleeve (30) for insertion within said outer sleeve (28) for slidably supporting the post (22) and having hoop rings (46, 48) for forcing the outer sleeve (28) radially outwardly to deform the ribs (32, 34) about and into gripping engagement with the edges of the openings (24).