Patents by Inventor Hongwei Gao

Hongwei Gao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190236993
    Abstract: The present disclosure belongs to the field of display technology, and particularly relates to a test circuit, a display substrate, a test method of a display substrate and a display apparatus. The test circuit includes a signal generating device and a plurality of output channels that are mutually independent. Each output channel includes a signal line configured to transmit a test signal. The signal generating device is coupled to the plurality of output channels, and is configured to provide, to each of at least one of the plurality of output channels, the test signal corresponding to an impedance of the signal line in the output channel, and provide the test signal to the signal line in the output channel.
    Type: Application
    Filed: December 17, 2018
    Publication date: August 1, 2019
    Inventors: Xiaowei WANG, Guoqing ZHANG, Weifeng WANG, Hongwei GAO
  • Publication number: 20190237019
    Abstract: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.
    Type: Application
    Filed: September 21, 2018
    Publication date: August 1, 2019
    Applicants: BOE TECHNOLOGY GROUP CO., LTD., Ordos Yuansheng Optoelectronics Co., Ltd.
    Inventors: Hongwei Gao, Xiaowei Wang, Yaorong Liu, Zhihui Jia, Yan Zong, Ke Zhao, Hongxia Yang, Guoqing Zhang, Pucha Zhao, Xiaopeng Bai
  • Publication number: 20190189651
    Abstract: The present disclosure relates to a method and system for performing aging process on the transistor in the display panel. A method for performing aging process on a transistor in a display panel, comprising: obtaining an initial characteristic curve of the transistor; determining an initial cutoff voltage range of the transistor according to the obtained initial characteristic curve; determining a gate-source voltage and a drain-source voltage required by the transistor according to the initial cutoff voltage range, so as to increase an cutoff voltage range of the transistor; and performing aging process on the transistor according to the determined required gate-source voltage and drain-source voltage.
    Type: Application
    Filed: August 2, 2018
    Publication date: June 20, 2019
    Inventors: Ke ZHAO, Guoqing ZHANG, Hongwei GAO, Xiaowei WANG, Zhihui JIA, Yan ZONG, Longfei YANG, Hongxia YANG, Meili GUO, Weifeng WANG, Pucha ZHAO, Zhixin GUO
  • Patent number: 10229619
    Abstract: Embodiments of the present disclosure provide a test circuit, a test method, a display panel and a display apparatus. Each of the signal input terminals may input a plurality of signals in a time division multiplexed manner, and in turn may be controlled by the corresponding switches to form a plurality of signal lines, a signal flow of the plurality of signal lines are totally different from each other under control of the switches. For example, one of the signal lines may function as a signal input line, and the other one of the signal lines may function as a signal input line for other specific testing, such as aging process so as to input signals different from the normal turn-on state signals. Consequently, by controlling the corresponding switches through the control signal terminals so that different input signals pass through different signal lines into the display panel to meet testing requirements of normal turn-on state testing, aging process and so on for the display panel.
    Type: Grant
    Filed: August 5, 2016
    Date of Patent: March 12, 2019
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., ORDOS YUANSHENG OPTOELECTRONICS CO., LTD.
    Inventors: Yuebai Han, Xinxin Jin, Xiaopeng Bai, Shanshan Bao, Pucha Zhao, Jin Zhao, Hongwei Gao, Mingyang Zhang, Tao Yang
  • Publication number: 20190075650
    Abstract: The present application discloses a circuit board and a method for manufacturing the same, and a terminal test device. The circuit board includes a base substrate, and a plurality of conductive lines on the base substrate, each of the plurality of conductive lines having one end configured to be connected with a signal output bus of a signal generator and the other end configured to be connected with a terminal. A fuse is connected in series in each conductive line, and a breaking current IT of the fuse, a maximum operating current I of the conductive line and a fault current IF of the conductive line satisfy: I<IT?IF, where the breaking current IT of the fuse is a minimum current that causes the fuse to open.
    Type: Application
    Filed: April 3, 2018
    Publication date: March 7, 2019
    Inventors: Pucha ZHAO, Guoqing ZHANG, Xiaopeng BAI, Hongwei GAO, Weifeng WANG, Yanbin DANG, Haotian CHEN
  • Publication number: 20170200404
    Abstract: Embodiments of the present disclosure provide a test circuit, a test method, a display panel and a display apparatus. Each of the signal input terminals may input a plurality of signals in a time division multiplexed manner, and in turn may be controlled by the corresponding switches to form a plurality of signal lines, a signal flow of the plurality of signal lines are totally different from each other under control of the switches. For example, one of the signal lines may function as a signal input line, and the other one of the signal lines may function as a signal input line for other specific testing, such as aging process so as to input signals different from the normal turn-on state signals. Consequently, by controlling the corresponding switches through the control signal terminals so that different input signals pass through different signal lines into the display panel to meet testing requirements of normal turn-on state testing, aging process and so on for the display panel.
    Type: Application
    Filed: August 5, 2016
    Publication date: July 13, 2017
    Inventors: Yuebai Han, Xinxin Jin, Xiaopeng Bai, Shanshan Bao, Pucha Zhao, Jin Zhao, Hongwei Gao, Mingyang Zhang, Tao Yang