Abstract: An electronic module includes a semiconductor package, and a clip connected to the semiconductor package. The clip is connected to or includes at least one fastening element which is configured to make a connection to an external heat sink.

Abstract: A semiconductor device is aligned by placing the semiconductor device in a nest between first and second sections of the nest when the nest is in a receiving position in which the first and second sections are spaced further apart from one another than when the nest is in an aligning position. The nest is moved from the receiving position to the aligning position with the semiconductor device in the nest so that the first and second sections are spaced closer to one another and align the semiconductor device in the nest. The semiconductor device is removed from the nest after the semiconductor device is aligned.

Abstract: A semiconductor assembly is described. In accordance with one example of the invention, the semiconductor assembly comprises a semiconductor body, a top main electrode arranged on a top side, a bottom main electrode arranged on an underside, and a control electrode arranged on the top side. The semiconductor assembly further includes a spring element for the pressure contacting of the control electrode with a pressure force generated by the spring element.

Abstract: A semiconductor chip panel includes a plurality of semiconductor chips embedded in an encapsulation material. At least part of the semiconductor chips comprise a first electrical contact element on a first main face and a second electrical contact element on a second main opposite to the first main face, respectively. One of the plurality of semiconductor chips is tested by establishing an electrical contact between a test contact device and the first electrical contact element and between an electrically conductive holder and the second contact element.

Abstract: A semiconductor assembly is described. In accordance with one example of the invention, the semiconductor assembly comprises a semiconductor body, a top main electrode arranged on a top side, a bottom main electrode arranged on an underside, and a control electrode arranged on the top side. The semiconductor assembly further includes a spring element for the pressure contacting of the control electrode with a pressure force generated by the spring element.

Abstract: A self-aligning pick-up head, a method to manufacture a pick-up head and a method of manufacturing a device are disclosed. In one embodiment a pick-up head includes a nozzle having a first end portion and a second end portion and a base tool comprising a collet head, wherein the first end portion of the nozzle is gimbaled to the base tool.

Abstract: A semiconductor device is aligned by placing the semiconductor device in a nest between first and second sections of the nest when the nest is in a receiving position in which the first and second sections are spaced further apart from one another than when the nest is in an aligning position. The nest is moved from the receiving position to the aligning position with the semiconductor device in the nest so that the first and second sections are spaced closer to one another and align the semiconductor device in the nest. The semiconductor device is removed from the nest after the semiconductor device is aligned.

Abstract: A self-aligning pick-up head, a method to manufacture a pick-up head and a method of manufacturing a device are disclosed. In one embodiment a pick-up head includes a nozzle having a first end portion and a second end portion and a base tool comprising a collet head, wherein the first end portion of the nozzle is gimbaled to the base tool.

Abstract: A semiconductor chip panel includes a plurality of semiconductor chips embedded in an encapsulation material. At least part of the semiconductor chips comprise a first electrical contact element on a first main face and a second electrical contact element on a second main opposite to the first main face, respectively. One of the plurality of semiconductor chips is tested by establishing an electrical contact between a test contact device and the first electrical contact element and between an electrically conductive holder and the second contact element.

Abstract: A method for manufacturing a semiconductor device including covering a portion of at least one semiconductor device with a foil, including covering at least one target region of the semiconductor device, and illuminating the foil with a laser to singulate from the foil a portion covering the at least one target region of the at least one semiconductor device.

Abstract: A test apparatus for testing a semiconductor device having contact pads on its top and its back, and to a method for testing the semiconductor device is disclosed. In one embodiment, the test apparatus has a test socket which is mounted on a test printed circuit board. Internal through-contact elements of the test socket can be used to test contact pads on the top of the semiconductor device. The contact pads on the back of the semiconductor device can be connected for the purpose of testing the semiconductor device using external through-contact elements which are arranged outside of the locating seat.

Abstract: An electrical device having carbonized conductors and a method and a device for the production thereof is disclosed. The electrical device has electrical components having connections. Furthermore, there are situated between the electrical components regions made of plastic with conductors having carbonized plastic and/or agglomerated nanoparticles. The conductors are connected to the connections of the components and/or to external connections of the electronic device.

Abstract: An electronic component includes a semiconductor chip and a leadframe. The leadframe includes a metal coating pattern on its underside to facilitate the application of solder to the electronic component. The metal coating pattern includes wetting regions that are wettable with solder material and anti-wetting regions that are unwettable with solder material, and the electronic component includes solder deposits formed on the wetting regions on the underside of the component.

Abstract: A method for contacting an external contact area with a test contact is provided. The external contact area has a galvanically applied coating of a metal or a metal alloy. Before the contact is established between the external contact area and the test contact, the external contact area is wetted with a fluid including an inhibitor which contains an aliphatic hydrocarbon, a binder such as a white mineral oil and/or ethyl acetate, and a lubricant. The fluid lowers the contact resistance between the external contact area and the test contact.

Abstract: A contact element for producing an electric contact has a laser cut conducting plate, with the contour of the laser cut conducting plate including at least two tips, which are embodied as contact tips for a contact pad of a part, connected to each other by a separating area, such that a one-piece semi-finished part is embodied.

Abstract: A contact unit is provided. The contact unit is adjusted in order to create an electric contact in a test device and comprises an arrangement for contact guides (140; 340?; 440?), and a connection unit (142; 442) with the contact unit having a predetermined breaking point (444), which is arranged in order to separate an electric contact between the contact guides of the arrangement of contact guides.

Abstract: Methods for singulating surface-mountable semiconductor devices and for fitting external contact areas to the devices are described herein. Semiconductor device components are applied to a metallic carrier in rows and columns in corresponding semiconductor device positions of the metallic carrier. Thereafter, a plurality of components, situated in the device positions, is embedded into a plastic housing composition, thereby producing a composite board. The composite board is subsequently separated into individual semiconductor devices by laser ablation, the semiconductor devices being inscribed on their top sides via the laser technique. The top sides with the inscription can then be adhesively bonded to an adhesive film, so that the undersides of the devices can be uncovered while maintaining the semiconductor device positions.

Abstract: A test apparatus for testing a semiconductor device having contact pads on its top and its back, and to a method for testing the semiconductor device is disclosed. In one embodiment, the test apparatus has a test socket which is mounted on a test printed circuit board. Internal through-contact elements of the test socket can be used to test contact pads on the top of the semiconductor device. The contact pads on the back of the semiconductor device can be connected for the purpose of testing the semiconductor device using external through-contact elements which are arranged outside of the locating seat.

Abstract: A contact unit is provided. The contact unit is adjusted in order to create an electric contact in a test device and comprises an arrangement for contact guides (140; 340?; 440?), and a connection unit (142; 442) with the contact unit having a predetermined breaking point (444), which is arranged in order to separate an electric contact between the contact guides of the arrangement of contact guides.

Abstract: Methods for singulating surface-mountable semiconductor devices and for fitting external contact areas to the devices are described herein. Semiconductor device components are applied to a metallic carrier in rows and columns in corresponding semiconductor device positions of the metallic carrier. Thereafter, a plurality of components, situated in the device positions, is embedded into a plastic housing composition, thereby producing a composite board. The composite board is subsequently separated into individual semiconductor devices by laser ablation, the semiconductor devices being inscribed on their top sides via the laser technique. The top sides with the inscription can then be adhesively bonded to an adhesive film, so that the undersides of the devices can be uncovered while maintaining the semiconductor device positions.