Patents by Inventor Howland D. T. Jones

Howland D. T. Jones has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multivariate classification of infrared spectra of cell and tissue samples
    Patent number: 5596992
    Abstract: Multivariate classification techniques are applied to spectra from cell and tissue samples irradiated with infrared radiation to determine if the samples are normal or abnormal (cancerous). Mid and near infrared radiation can be used for in vivo and in vitro classifications using at least different wavelengths.
    Type: Grant
    Filed: June 30, 1993
    Date of Patent: January 28, 1997
    Assignee: Sandia Corporation
    Inventors: David M. Haaland, Howland D. T. Jones, Edward V. Thomas
  • Electrochemical method for defect delineation in silicon-on-insulator wafers
    Patent number: 5015346
    Abstract: An electrochemical method for defect delineation in thin-film SOI or SOS wafers in which a surface of a silicon wafer is electrically connected so as to control the voltage of the surface within a specified range, the silicon wafer is then contacted with an electrolyte, and, after removing the electrolyte, defects and metal contamination in the silicon wafer are identified.
    Type: Grant
    Filed: April 10, 1990
    Date of Patent: May 14, 1991
    Assignee: United States Department of Energy
    Inventors: Terry R. Guilinger, Howland D. T. Jones, Michael J. Kelly, John W. Medernach, Joel O. Stevenson, Sylvia S. Tsao