Abstract: A power supply method and a power supply apparatus including a power conversion circuit, a first and a second switching circuit, and a control circuit are provided. The power conversion circuit is coupled between a DC power source and a power supply terminal and performs a boosting operation according to a DC voltage of the DC power source to generate a boost voltage. The first switching circuit is coupled between an AC power source and the power supply terminal. The second switching circuit is coupled between the power conversion circuit and the power supply terminal. The control circuit enters a first mode after turning on the first and the second switching circuit, so the first switching circuit transmits a main AC voltage of the AC power source to the power supply terminal in the first mode. The boost voltage is greater than a peak value of the main AC voltage.

Abstract: An inspection apparatus for inspecting a light-emitting diode wafer is provided. The inspection apparatus includes a Z-axis translation stage, a sensing probe, a height measurement module, a carrier, an illumination light source, and a processing device. The sensing probe is integrated with the Z-axis translation stage. The Z-axis translation stage is adapted to drive the sensing probe to move in a Z axis. The sensing probe includes a photoelectric sensor, a beam splitter, and a photoelectric sensing structure. One of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam penetrating the beam splitter, and the other one of the photoelectric sensor of the sensing probe and the height measurement module is adapted to receive a light beam reflected by the beam splitter. The carrier is configured to carry the light-emitting diode wafer. The illumination light source is configured to emit an illumination beam to irradiate the light-emitting diode wafer.

Abstract: A method includes providing a semiconductor structure having an active region and an isolation structure adjacent to the active region, the active region having source and drain regions sandwiching a channel region for a transistor, the semiconductor structure further having a gate structure over the channel region. The method further includes etching a trench in one of the source and drain regions, wherein the trench exposes a portion of a sidewall of the isolation structure, epitaxially growing a first semiconductor layer in the trench, epitaxially growing a second semiconductor layer over the first semiconductor layer, changing a crystalline facet orientation of a portion of a top surface of the second semiconductor layer by an etching process, and epitaxially growing a third semiconductor layer over the second semiconductor layer after the changing of the crystalline facet orientation.

Abstract: A medicine management method includes acquiring user information of medicine usage corresponding to at least one assigned medicine; acquiring user information of medicine using reactions; and displaying the user information of medicine usage with first time information corresponding to different time points of using the at least one assigned medicine and the user information of medicine using reactions with second time information corresponding to different time points of occurring medicine using reactions concurrently.

Abstract: A monitoring structure for a critical dimension of a lithography process including a dummy pattern layer and a patterned photoresist layer is provided. The dummy pattern layer includes a dummy pattern. The patterned photoresist layer includes at least one monitoring mark located above the dummy pattern. The monitoring mark includes a first portion and a second portion that intersect each other. The first portion extends in a first direction, the second portion extends in a second direction, and the first direction intersects the second direction.

Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.

Abstract: The present disclosure provides a method for refreshing a memory array. The method includes the following steps: generating a plurality of target row records respectively for a plurality of banks; generating a plurality of row address records based on the plurality of target row records; and performing a row-hammer-refreshing process based on the plurality of row address records.

Abstract: A repeater includes an up-link circuit and a down-link circuit. The down-link circuit includes a receiver, a radio frequency circuit and a transmitter. The transmitter transmits the repeated second signals to the user equipment and includes an antenna array, a plurality of power amplifiers, a plurality of first phase shifters, a first memory unit, and a first control logic circuit. The antenna array includes a plurality of antenna elements arranged along a first direction, and the number of the plurality of antenna elements is at least four. The first memory unit is configured to store predetermined parameters associated with a predetermined radiation pattern. The first control logic circuit selects a first number of the power amplifiers and the first number of the first phase shifters, and sets normalized gains for the selected plurality of power amplifiers range from 0.7 to 1 unit.

Abstract: A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.

Abstract: An electronic device includes an active area and multiple shift registers. The active area comprises multiple pixel circuits. Each of the multiple shift registers is configured to output a first control signal, a second control signal, and a third control signal to a part of pixel circuits of the multiple pixel circuits. A duty ratio of the third control signal is greater than a duty ratio of the second control signal, and the duty ratio of the second control signal is greater than a duty ratio of the first control signal. A part of the multiple shift registers and other part of the multiple shift registers are substantially symmetrically disposed at two sides of the active area, respectively.

Abstract: An electronic device includes a case body, a wireless transmission circuit, a voice processing circuit, a control circuit, and a wireless charging circuit. The case body is configured to hold an external electronic device. The wireless transmission circuit is configured to wirelessly connect the external electronic devices. The voice processing circuit is configured to generate a voice command according to a voice signal, and transmit the voice command to the external electronic devices. The wireless charging circuit is configured to couple the external electronic device to receive a first voltage, and convert the first voltage to a storage voltage to supply power to the control circuit, the wireless transmission circuit, and the voice processing circuit.

Abstract: A method includes providing a semiconductor structure having an active region and an isolation structure adjacent to the active region, the active region having source and drain regions sandwiching a channel region for a transistor, the semiconductor structure further having a gate structure over the channel region. The method further includes etching a trench in one of the source and drain regions, wherein the trench exposes a portion of a sidewall of the isolation structure, epitaxially growing a first semiconductor layer in the trench, epitaxially growing a second semiconductor layer over the first semiconductor layer, changing a crystalline facet orientation of a portion of a top surface of the second semiconductor layer by an etching process, and epitaxially growing a third semiconductor layer over the second semiconductor layer after the changing of the crystalline facet orientation.

Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.

Abstract: An information display method and an information display system are provided. The information display method includes: capturing a background image of an information display area of the transparent display; using critical contrast values and color levels of the background image to calculate a display threshold; using the color levels of the background image and color levels of display information to calculate a recognition evaluation score; and determining whether the recognition evaluation score is greater than or equal to the display threshold. If the recognition evaluation score is greater than or equal to the display threshold, the display information is displayed in the information display area. If the recognition evaluation score is less than the display threshold, an optimized display parameter is calculated by using the display threshold, and optimized display information is displayed in the information display area of the transparent display.

Abstract: An information display method and an information display system are provided. The information display method includes: capturing a background image of an information display area of the transparent display; using critical contrast values and color levels of the background image to calculate a display threshold; using the color levels of the background image and color levels of display information to calculate a recognition evaluation score; and determining whether the recognition evaluation score is greater than or equal to the display threshold. If the recognition evaluation score is greater than or equal to the display threshold, the display information is displayed in the information display area. If the recognition evaluation score is less than the display threshold, an optimized display parameter is calculated by using the display threshold, and optimized display information is displayed in the information display area of the transparent display.

Abstract: A charging apparatus is provided. A detection circuit includes a voltage dividing path between an output terminal of a charging circuit and an output terminal of a reference voltage generating circuit. The detection circuit provides a detection signal according to a divided voltage on the voltage dividing path. A control circuit determines whether a load is connected to the charging apparatus according to the detection signal.

Abstract: Apparatus and methods are provided for handover robustness. In novel aspect, the UE receives a conditional handover (CHO) command from a source gNB containing a set of candidate cells with corresponding triggering conditions; detects a handover conditions for a target gNB belonging to the set of candidate cells; and performs HO procedure towards the target gNB. In one embodiment, the conditional HO command further configures a validity timer that controls a validity of handover conditions for the set of candidate cells. The validity timer is started upon receiving the conditional HO command, the validity timer is stopped upon detecting at least one events comprising a handover condition is met and a normal handover command is received, and the conditional HO command is set to be invalid upon the expiration of the validity timer.

Abstract: A three-dimensional imaging system and method are provided. The three-dimensional imaging system includes a suspension force field generator, a projection module, and a controller. The suspension force field generator generates a suspension force field to suspend a plurality of scattering particles used for scattering incident light and distribute the scattering particles on a projection plane. The projection module projects an image on the projection plane. The controller is coupled to the suspension force field generator and the projection module, controls the suspension force field generator to change the suspension force field so that the projection plane where the scattering particles are distributed moves in a display space, extracts a slice plane image that matches a position of the projection plane from multiple slice plane images sliced from a three-dimensional stereoscopic image, and controls the projection module to project the extracted slice plane image to the projection plane.

Abstract: An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.

Abstract: In an embodiment, a wafer pod includes: a cavity configured to receive and store a wafer; an alignment fiducial within the cavity, wherein: the alignment fiducial comprises two lines orthogonal to each other, and the alignment fiducial is configured to be detected by a robotic arm alignment sensor disposed on a robotic arm, wherein the alignment fiducial defines an alignment orientation for a robotic arm gripper hand to enter into the cavity.