Abstract: A device includes a semiconductor region of a first conductivity type, a trench extending into the semiconductor region, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer, wherein an edge portion of the main gate overlaps the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion at a same level as, and contacting, the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type.

Abstract: An LDMOS transistor with a dummy gate comprises an extended drift region formed over a substrate, a drain region formed in the extended drift region, a channel region formed in the extended drift region, a source region formed in the channel region and a dielectric layer formed over the extended drift region. The LDMOS transistor with a dummy gate further comprises an active gate formed over the channel region and a dummy gate formed over the extended drift region. The dummy gate helps to reduce the gate charge of the LDMOS transistor while maintaining the breakdown voltage of the LDMOS transistor.

Abstract: A device includes a semiconductor region of a first conductivity type, a trench extending into the semiconductor region, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer, wherein an edge portion of the main gate overlaps the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion at a same level as, and contacting, the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type.

Abstract: A method comprises providing a substrate with a second conductivity type, growing a first epitaxial layer having the second conductivity type, growing a second epitaxial layer having a first conductivity type, forming a trench in the first epitaxial layer and the second epitaxial layer, forming a gate electrode in the trench, applying an ion implantation process using first gate electrode as an ion implantation mask to form a drain-drift region, forming a field plate in the trench, forming a drain region in the second epitaxial layer, wherein the drain region has the first conductivity type and forming a source region in the first epitaxial layer, wherein the source region has the first conductivity type, and wherein the source region is electrically coupled to the field plate.

Abstract: The present disclosure relates to a high voltage transistor device having a field plate, and a method of formation. In some embodiments, the high voltage transistor device has a gate electrode disposed over a substrate between a source region and a drain region located within the substrate. A dielectric layer laterally extends from over the gate electrode to a drift region arranged between the gate electrode and the drain region. A field plate is located within a first inter-level dielectric layer overlying the substrate. The field plate laterally extends from over the gate electrode to over the drift region and vertically extends from the dielectric layer to a top surface of the first ILD layer. A plurality of metal contacts, having a same material as the field plate, vertically extend from a bottom surface of the first ILD layer to a top surface of the first ILD layer.

Abstract: A power MOS transistor comprises a drain contact plug formed over a first side of a substrate, a source contact plug formed over a second side of the substrate and a trench formed between the first drain/source region and the second drain/source region. The trench comprises a first gate electrode, a second gate electrode, wherein top surfaces of the first gate electrode and the second gate electrode are aligned with a bottom surface of drain region. The trench further comprises a field plate formed between the first gate electrode and the second gate electrode, wherein the field plate is electrically coupled to the source region.

Abstract: A device includes a semiconductor region of a first conductivity type, a trench extending into the semiconductor region, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer, wherein an edge portion of the main gate overlaps the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion at a same level as, and contacting, the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type.

Abstract: A method includes forming a buried layer in a substrate, growing an epitaxial layer over the substrate, etching the epitaxial layer and the buried layer to form a first trench and a second trench, wherein the first trench and the second trench are of a same depth and a width of the second trench is greater than a width of the first trench, forming a dielectric layer in a bottom portion of the first trench, forming a first gate electrode in an upper portion of the first trench and filling the second trench with a gate electrode material, forming gate electrodes for a plurality of lateral transistors formed in the substrate, forming a body region, forming a first drain/source region over the body region and forming a second drain/source region over the epitaxial layer.

Abstract: A device includes a semiconductor layer of a first conductivity type, and a first and a second body region over the semiconductor layer, wherein the first and the second body regions are of a second conductivity type opposite the first conductivity type. A doped semiconductor region of the first conductivity type is disposed between and contacting the first and the second body regions. A gate dielectric layer is disposed over the first and the second body regions and the doped semiconductor region. A first and a second gate electrode are disposed over the gate dielectric layer, and overlapping the first and the second body regions, respectively. The first and the second gate electrodes are physically separated from each other by a space, and are electrically interconnected. The space between the first and the second gate electrodes overlaps the doped semiconductor region. The device further includes a MOS containing device.

Abstract: A device includes a trench extending into a semiconductor region and having a first conductivity type, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer and having an edge portion overlapping the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion contacting the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type. A MOS-containing device is at a surface of the semiconductor region.

Abstract: A device includes a semiconductor region of a first conductivity type, a trench extending into the semiconductor region, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer, wherein an edge portion of the main gate overlaps the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion at a same level as, and contacting, the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type.

Abstract: An apparatus comprises a buried layer over a substrate, an epitaxial layer over the buried layer, a first trench extending through the epitaxial layer and partially through the buried layer, a second trench extending through the epitaxial layer and partially through the buried layer, a dielectric layer in a bottom portion of the first trench, a first gate region in an upper portion of the first trench, a second gate region in the second trench, wherein the second gate region is electrically coupled to the first gate region, a drain region in the epitaxial layer and a source region on an opposite side of the first trench from the drain region.

Abstract: An integrated circuit comprises a plurality of lateral devices and quasi vertical devices formed in a same semiconductor die. The quasi vertical devices include two trenches. A first trench is formed between a first drain/source region and a second drain/source region. The first trench comprises a dielectric layer formed in a bottom portion of the first trench and a gate region formed in an upper portion of the first trench. A second trench is formed on an opposite side of the second drain/source region from the first trench. The second trench is coupled between the second drain/source region and a buried layer, wherein the second trench is of a same depth as the first trench.

Abstract: A semiconductor structure includes a substrate, a first well region of a first conductivity type overlying the substrate, a second well region of a second conductivity type opposite the first conductivity type overlying the substrate, a cushion region between and adjoining the first and the second well regions, an insulation region in a portion of the first well region and extending from a top surface of the first well region into the first well region, a gate dielectric extending from over the first well region to over the second well region, wherein the gate dielectric has a portion over the insulation region, and a gate electrode on the gate dielectric.

Abstract: A device includes a semiconductor layer of a first conductivity type, and a first and a second body region over the semiconductor layer, wherein the first and the second body regions are of a second conductivity type opposite the first conductivity type. A doped semiconductor region of the first conductivity type is disposed between and contacting the first and the second body regions. A gate dielectric layer is disposed over the first and the second body regions and the doped semiconductor region. A first and a second gate electrode are disposed over the gate dielectric layer, and overlapping the first and the second body regions, respectively. The first and the second gate electrodes are physically separated from each other by a space, and are electrically interconnected. The space between the first and the second gate electrodes overlaps the doped semiconductor region. The device further includes a MOS containing device.

Abstract: A method comprises forming a first trench and a second trench, depositing a dielectric material in a lower portion of the first trench, depositing a gate electrode material in the second trench and an upper portion of the first trench, forming a first N+ region and a second N+ region through an ion implantation process, wherein the first N+ region and the second N+ region are on opposite sides of the first trench and forming an accumulation layer along a sidewall of the second trench.

Abstract: An integrated circuit device includes a pad layer having a body portion with a first doping type laterally adjacent to a drift region portion with a second doping type, a trench formed in the pad layer, the trench extending through an interface of the body portion and the drift region portion, a gate formed in the trench and over a top surface of the pad layer along the interface of the body portion and the drift region portion, an oxide formed in the trench on opposing sides of the gate, and a field plate embedded in the oxide on each of the opposing sides of the gate.

Abstract: A device includes a trench extending into a semiconductor region and having a first conductivity type, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer and having an edge portion overlapping the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion contacting the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type. A MOS-containing device is at a surface of the semiconductor region.

Abstract: A method comprises forming a first trench and a second trench, depositing a dielectric material in a lower portion of the first trench, depositing a gate electrode material in the second trench and an upper portion of the first trench, forming a first N+ region and a second N+ region through an ion implantation process, wherein the first N+ region and the second N+ region are on opposite sides of the first trench and forming an accumulation layer along a sidewall of the second trench.

Abstract: A device includes a trench extending into a semiconductor region and having a first conductivity type, and a conductive field plate in the trench. A first dielectric layer separates a bottom and sidewalls of the field plate from the semiconductor region. A main gate is disposed in the trench and overlapping the field plate. A second dielectric layer is disposed between and separating the main gate and the field plate from each other. A Doped Drain (DD) region of the first conductivity type is under the second dielectric layer and having an edge portion overlapping the DD region. A body region includes a first portion at a same level as a portion of the main gate, and a second portion contacting the DD region, wherein the body region is of a second conductivity type opposite the first conductivity type. A MOS-containing device is at a surface of the semiconductor region.