Abstract: A convex type guide plate waterwheel energy increasing device with gradually dense holes is provided. The convex type guide plate waterwheel energy increasing device comprises fixed devices, a main diversion plate and auxiliary diversion plates, wherein an upwards convex arc structure is arranged on the top surface of the main diversion plate, gradually dense first through holes are formed in the main diversion plate from the middle to the two ends, the diameters of the first through holes are gradually increased, the auxiliary diversion plates are connected to the two sides of the main diversion plate, second through holes are formed in the auxiliary diversion plates, fixed devices are fixed to the two sides of the auxiliary diversion plates, and the fixed devices are used for fixing the main diversion plate and the auxiliary diversion plates to the riverbed.

Abstract: Methods, electronic device, and non-transitory computer-readable storage mediums are provided for semantic parsing. The equipment may obtain a first recognition result of a target statement. The first recognition result may include a first intention recognition result and a first entity recognition result. The first entity recognition result may correspond to a plurality of vertical domains. The equipment may also determine one of the plurality of vertical domains corresponding to the first entity recognition result as a target vertical domain corresponding to the target statement according to the first intention recognition result. The equipment may further convert the first entity recognition result into a second entity recognition result in the target vertical domain. The equipment may also parse an intention of the target statement according to the second entity recognition result.

Abstract: Disclosed is a convex type guide plate waterwheel energy increasing device with gradually dense holes. The convex type guide plate waterwheel energy increasing device comprises fixed devices, a main diversion plate and auxiliary diversion plates, wherein an upwards convex arc structure is arranged on the top surface of the main diversion plate, gradually dense first through holes are formed in the main diversion plate from the middle to the two ends, the diameters of the first through holes are gradually increased, the auxiliary diversion plates are connected to the two sides of the main diversion plate, second through holes are formed in the auxiliary diversion plates, fixed devices are fixed to the two sides of the auxiliary diversion plates, and the fixed devices are used for fixing the main diversion plate and the auxiliary diversion plates to the riverbed.

Abstract: Apparatus and associated method that contemplates performing a first atomic force microscope (AFM) scan of a first region of a sample centered at a first position at a first angle to produce a first scan image, the first AFM scan including a first component scan at a first speed and a second component scan at a second speed; performing a second AFM scan of the first region of the sample at a second angle to produce a second scan image, the second AFM scan including performing a third component scan at the first speed and a fourth component scan at the second speed; and correcting a first error in the first scan image based on the second scan image to produce a corrected image output.

Abstract: The invention described herein is related to the preparation and usage of nanoemulsions and nanoparticles which containing biological active ingredients including cosmetic, medical and pharmaceutical active ingredients to pass skin barriers and promote cell growth with evident clinical effects. Also, the present invention contains a cosmetic formulation that can be used for skin rejuvenation, wrinkle removal, scar treatment and wounds healing.

Abstract: The invention generally relates to certain antimicrobial, antibacterial, antifungal or antiviral compounds. More particularly, the invention relates to certain antimicrobial antibacterial, antifungal and/or antiviral compounds, their syntheses and compositions, and methods of use thereof.

Abstract: The disclosure is related systems and method for improved accuracy and precision in Raman spectroscopy. In one embodiment, a device may comprise a Raman spectroscopic apparatus configured to determine a property of a sample by directing photons at the sample and measuring a resulting Raman scattering, a positioning apparatus capable of manipulating a position of the sample, and the device being configured to selectively adjust a focus of the Raman spectroscopic apparatus to adjust an intensity of the Raman scattering. Another embodiment may be a method comprising performing a depth focus Raman spectra screening on a sample to determine a depth focus with a maximum-intensity Raman spectra, wherein the depth focus spectra screening comprises performing Raman spectra scans on the sample at a plurality of depth foci, and modifying a process based on a result of the Raman spectra scan at the depth focus with the maximum-intensity Raman spectra.

Abstract: A semi-automated method for atomic force microscopy (“AFM”) scanning of a sample is disclosed. The method can include manually teaching a sample and AFM tip relative location on an AFM tool; then scanning, via a predefined program, on the same sample or other sample with same pattern to produce more images automatically.

Abstract: In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain embodiments, an AFM device engages a probe to a surface using a piezo voltage. The probe scans the surface to produce a first scan. The first scan is used to estimate a vertical offset such that the probe uses the piezo voltage to engage the surface for a second scan at a different vertical position.

Abstract: A method of forming a layer, the method including providing a substrate having at least one surface adapted for deposition thereon; and directing a particle beam towards the surface of the substrate, the particle beam including small molecule molecular species, wherein the small molecule molecular species break apart upon interaction with atoms at the substrate into atomic components, each of the atomic components having implant energies from about 20 eV to about 100 eV to form a layer.

Abstract: The invention described herein is related to the preparation and usage of nanoemulsions and nanoparticles which containing biological active ingredients including cosmetic, medical and pharmaceutical active ingredients to pass skin barriers and promote cell growth with evident clinical effects. Also, the present invention contains a cosmetic formulation that can be used for skin rejuvenation, wrinkle removal, scar treatment and wounds healing.

Abstract: The invention generally relates to certain antimicrobial, antibacterial, antifungal or antiviral compounds. More particularly, the invention relates to certain antimicrobial antibacterial, antifungal and/or antiviral compounds, their syntheses and compositions, and methods of use thereof.

Abstract: Apparatus and associated method that contemplates performing a first atomic force microscope (AFM) scan of a first region of a sample centered at a first position at a first angle to produce a first scan image, the first AFM scan including a first component scan at a first speed and a second component scan at a second speed; performing a second AFM scan of the first region of the sample at a second angle to produce a second scan image, the second AFM scan including performing a third component scan at the first speed and a fourth component scan at the second speed; and correcting a first error in the first scan image based on the second scan image to produce a corrected image output.

Abstract: A topographic profile of a structure is generated using atomic force microscopy. The structure is scanned such that an area of interest of the structure is scanned at a higher resolution than portions of the structure outside of the area of interest. An profile of the structure is then generated based on the scan. To correct skew and tilt of the profile, a first feature of the profile is aligned with a first axis of a coordinate system. The profile is then manipulated to align a second feature of the profile with a second axis of the coordinate system.

Abstract: A flexible member is coupled between an actuator arm and a slider. The flexible member facilitates relative motion in a tangential direction of a rotating medium. The relative motion is detected via a displacement sensor, and a friction between the slider and the rotating medium is determined based on the sensed relative motion.

Abstract: A flexible member is coupled between an actuator arm and a slider. The flexible member facilitates relative motion in a tangential direction of a rotating medium. The relative motion is detected via a displacement sensor, and a friction between the slider and the rotating medium is determined based on the sensed relative motion.

Abstract: The disclosure is related systems and method for improved accuracy and precision in Raman spectroscopy. In one embodiment, a device may comprise a Raman spectroscopic apparatus configured to determine a property of a sample by directing photons at the sample and measuring a resulting Raman scattering, a positioning apparatus capable of manipulating a position of the sample, and the device being configured to selectively adjust a focus of the Raman spectroscopic apparatus to adjust an intensity of the Raman scattering. Another embodiment may be a method comprising performing a depth focus Raman spectra screening on a sample to determine a depth focus with a maximum-intensity Raman spectra, wherein the depth focus spectra screening comprises performing Raman spectra scans on the sample at a plurality of depth foci, and modifying a process based on a result of the Raman spectra scan at the depth focus with the maximum-intensity Raman spectra.

Abstract: A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference surface and an area of interest subportion of the reference surface, at a variable pixel density including a first pixel density outside the area of interest and a second pixel density inside the area of interest to derive a first digital file characterizing topography of the workpiece. The workpiece is further scanned along the reference surface and the area of interest with the scanning probe along a second directional grid that is substantially orthogonal to the first directional grid and at a constant pixel density to derive a second digital file characterizing topography of the workpiece. A processor executes computer-readable instructions stored in memory that generate a topographical profile of the workpiece in relation to the first and second digital files.

Abstract: A method of forming a layer, the method including providing a substrate having at least one surface adapted for deposition thereon; and directing a particle beam towards the surface of the substrate, the particle beam including small molecule molecular species, wherein the small molecule molecular species break apart upon interaction with atoms at the substrate into atomic components, each of the atomic components having implant energies from about 20 eV to about 100 eV to form a layer.

Abstract: Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a system drift error in the first scan based on the second scan. Another embodiment may comprise performing a global scan of a first area, a local scan of a second area within the first area, correcting a leveling error in the local scan based on the global scan, and outputting a corrected sample image. Another embodiment may comprise performing a first scan at a first position at a first angle, a second scan at a flat region using the same scan angle and scan size to correct a scanner runout error in the first scan based on the second scan.