Patents by Inventor Hung-Chang Chang

Hung-Chang Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110063252
    Abstract: A photo element includes a capacitor, a switch thin film transistor (TFT), a charge thin film transistor, and a photo thin film transistor. A voltage is charged to the capacitor through the charge TFT, and the output voltage of the capacitor is read through the readout line. The photo-induced current will affect the output voltage of the capacitor; therefore it is employed to determine whether the photo element is touched. Later, a reverse-biased voltage is applied to the photo TFT, such that the threshold voltage and sensitivity of the photo TFT can be maintained.
    Type: Application
    Filed: April 30, 2010
    Publication date: March 17, 2011
    Applicant: HANNSTAR DISPLAY CORP.
    Inventors: Hung-Chang Chang, Yi-Chung Juan, Chao-Hui Wu
  • Publication number: 20100321364
    Abstract: A transflective liquid crystal display (TR LCD) including a display panel, a first reference voltage line and a second reference voltage line is disclosed. The display panel includes: a plurality of scan lines; a plurality of data lines, disposed substantially perpendicularly to the scan lines; a plurality of pixels arranged in an array, respectively coupled to a corresponding data line and a corresponding scan line. Each pixel has a transparent area and a reflection area, and each row of pixels is divided by definition into a first pixel-group and a second pixel-group. The above-mentioned first reference voltage line and second reference voltage line are respectively coupled to the reflection areas of the pixels of the first pixel-group and the second pixel-group of each row of pixels for respectively receiving a first reference voltage signal and a second reference voltage signal, wherein both the reference voltage signals are time-varying or periodic.
    Type: Application
    Filed: October 27, 2009
    Publication date: December 23, 2010
    Applicant: HANNSTAR DISPLAY CORPORATION
    Inventors: Hung-Chang Chang, Po-Sheng Shih, Sweehan J.H. Yang
  • Publication number: 20100171724
    Abstract: An embedded type inductive input display device capable of increasing aperture ratios, that is realized through parallel-connecting at least two sensing devices of adjacent pixels separated by a gate line, and said sensing devices are connected to a switch transistor, such that said switch transistor is under control of said gate line, and sensor signals output by said sensing devices are transmitted to a read line for detecting touch-control events and positions. As such, the size of said sensing device utilized can be reduced, hereby effectively increasing aperture ratio of a panel, while maintaining a same magnitude of said sensor signals.
    Type: Application
    Filed: July 21, 2009
    Publication date: July 8, 2010
    Inventors: Hung-Chang CHANG, Po-Yang Chen, Po-Sheng Shih
  • Publication number: 20090109127
    Abstract: A three-dimensional image display device and a displaying method thereof. The display device includes a pixel array, a sub-pixel rendering device and a mask. The sub-pixel rendering device provides data signals to the sub-pixels to form the first frames and the second frames. The first frame and the second frame include a plurality of first pixel regions and a plurality of second pixel regions. The second pixel region and the adjacent first pixel regions have some sub-pixels in common. The mask projects the first frames and the second frames as a first image and a second image.
    Type: Application
    Filed: March 25, 2008
    Publication date: April 30, 2009
    Applicant: HANNSTAR DISPLAY CORPORATION
    Inventors: Ching-Chao Chang, Hung-Chang Chang, Chien-Yung Cheng
  • Patent number: 7472042
    Abstract: A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interference diagram with a waveform composed of interference data points depicting a relationship of surface height versus illumination intensity is generated. In the beginning, a first data point with greatest illumination intensity is selected from the interference data points on the waveform. Then, a second data point is selected from the data points on the waveform within a predetermined range centered at the first data point to have the waveform showing best quality of symmetry. Then, a peak of a fringe defined by the second data point and its neighboring data points is estimated by using phase compensating approach.
    Type: Grant
    Filed: July 14, 2006
    Date of Patent: December 30, 2008
    Assignee: Chroma Ate Inc.
    Inventors: Hung-Chang Chang, Yaomin Lin
  • Publication number: 20080013101
    Abstract: A repairing method for a surface profile is provided. The intensity on the waveform of the interference diagrams or the existence of envelope on the waveform of the interference diagram are used to decide whether the respected pixel is located in a dark area on the surface profile or not. Then, mark the pixel located in the dark area. Afterward, repair the marked pixel by using the surrounding effective pixels on the surface profile.
    Type: Application
    Filed: July 14, 2006
    Publication date: January 17, 2008
    Inventors: Yaomin Lin, Hung-Chang Chang
  • Publication number: 20080013100
    Abstract: A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interference diagram with a waveform composed of interference data points depicting a relationship of surface height versus illumination intensity is generated. In the beginning, a first data point with greatest illumination intensity is selected from the interference data points on the waveform. Then, a second data point is selected from the data points on the waveform within a predetermined range centered at the first data point to have the waveform showing best quality of symmetry. Then, a peak of a fringe defined by the second data point and its neighboring data points is estimated by using phase compensating approach.
    Type: Application
    Filed: July 14, 2006
    Publication date: January 17, 2008
    Inventors: Hung-Chang Chang, Yaomin Lin